Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > T&M
?
?
T&M??

Test system aimed at next-gen display driver ICs

Posted: 29 Oct 2014 ?? ?Print Version ?Bookmark and Share

Keywords:Advantest? display driver? test system? mobile electronics? LCD?

Advantest Corp. has introduced a system for testing next-generation display driver ICs (DDIs) and their embedded functions that control high-resolution LCD panels. According to the company, the T6391 targets three key trends in the next-generation DDI market that contribute to higher resolution displays: the increasing number of pins on display driver devices, the rising speeds of interfaces and highly integrated multi-functions.

T6391

Advantest's T6391 claims to be the only test platform that can handle all of these current and projected test requirements. As a member of the established T6300 product family, the tester leverages the same engineering environment model as the existing base of more than 1,500 previously installed testers in the T6300 series. It uses the same TDL programming language while improving throughput by achieving faster data transfer and calculation.

The tester's high-speed bus enables high-throughput testing. With 512 I/O channels, the T6391 is capable of testing multiple chips simultaneously. It can accommodate high-resolution DDIs having as many as 3,584 LCD pins. This is enough to test today's highest pin count LCDs including full high-definition (HD), WXGA and HD720 displays, stated Advantest.

The T6391 can handle I/O pin frequencies up to 1.6Gb/s, allowing it to test DDIs that use mobile industry process interface (MIPI), the standard protocol for mobile electronics. An additional measurement module allows the system to test even faster interfaces up to 6.5Gb/s, which will be used in the LCD drivers for the next generation of ultra-HD TVs including the 4K (2160p) generation.

A 16-channel arbitrary waveform generator (AWG) and a digital capture feature provide the ability to test analogue ICs. Scan and memory tests of touch-sensor-enabled DDIs can be conducted using the system's scan pattern generator (SCPG), algorithmic pattern generator (ALPG) and address fail memory (AFM) module.

Production units of the T6391 tester are scheduled to begin shipping to customers by the end of this calendar year.





Article Comments - Test system aimed at next-gen displa...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top