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High-speed IC test handler offers flexible control

Posted: 19 Jan 2015 ?? ?Print Version ?Bookmark and Share

Keywords:Epson? IC test handler? smartphone? robot?

Seiko Epson Corp. has begun accepting orders for its IC test handler that can transport, test and sort chips. The NS8040SH features Epson's Smart Motion Control that the company describes as a unique robot control technology that enables small ICs to be handled reliably at high speeds.

Geared for smartphone manufacturers, the NS8040SH has kept the same basic features as its predecessor, the NS8040, but gives users even more flexibility when it comes to building a test environment. This additional flexibility comes, in part, by increasing the standard contact force exerted when plugging ICs into test sockets to 1,200N, which allows the handler to accommodate ICs with higher pin counts. Moreover, the handler can be configured to transport ICs in both inline 4-site test mode, a mode in which four ICs are simultaneously tested in parallel, and square 4-site test mode, a mode in which four ICs are arranged in a 2 x 2 configuration for simultaneous testing. It can also be upgraded to 8-site test mode, a mode in which eight ICs are simultaneously tested.


IC test handlers are used in combination with other test equipment in IC inspection processes. They transport ICs to the test equipment for final performance testing and then sort the tested chips into "passed," "failed" or other appropriate bins according to appearance, electrical characteristics, or other user-defined criteria. The NS8040SH can handle a variety of packages and pin counts. It is also capable of operating under different test conditions, such as under ambient temperature or high temperature. Inside the handlers are sophisticated robots that transport the devices under test. These robots require highly advanced control to precisely synchronise their movements, detailed the company.

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