ECT offers hard plating on long-travel probes

Everett Charles Technologies (ECT) has included lead-free long-travel (LFLT) probes into its LFRE portfolio. Designed for PCB in-circuit and functional test applications, the LFLT probes have almost twice the compliance as standard length probes.

Long-travel probes are coated with ECT's hard plating alloy called LFRE. LFRE plating has a hardness of about 600Knoop, which is approximately five times harder than gold plating. In addition to improved tip wear, LFRE-plated probes are less prone to solder transfer.

"Lead-free solder typically has a harder and stickier solder flux and oxide layer. This thicker layer of resin and oxide is more difficult to penetrate and increases wear on the pogo pin. Lead-free solder resin and oxides can also increase debris transfer to spring probes. ECT's LFRE-plated probes have demonstrated the ability to penetrate the hard resin and oxide layer without premature wear and solder accumulation," explains Tony DeRosa, ECT product manager.

Available in a variety of tip styles, the LFLT probes are offered in three pitches: 50mil, 75mil and 100mil (1.27mm, 1.91mm and 2.56mm).

LFLT probes feature advanced probe design capabilities such as ECT's PogoPlus bias-ball design and double roll-close process.