Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > T&M

EMC tester accommodates individual probes, IC pins

Posted: 30 Jan 2015 ?? ?Print Version ?Bookmark and Share

Keywords:Langer EMV-Technik? EMC tester? IC? emission test?

Langer EMV-Technik GmbH has announced the automated ICT1 IC tester, which is a positioning system for the evaluation, control and protocol of the measurement of different IC probes. The ICT1 can be used to perform automated immunity and emission tests on individual IC pins and complete ICs. Two of the special features of the ICT1 include automatic pin recognition and the highly-precise positioning (10um) of the measurement systems, according to the company.

The ICT1's design allows direct contact between the measuring tips of the individual probes and the IC pins. The probes are connected to the required measuring and control devices (spectrum analyser, oscilloscope, RF power amplifier, etc.). The devices are controlled via a PC interface. The test IC is tested in operation and located on a test board for this purpose.


This test board is, in turn, connected to the connection board that forms the interface between the test IC and PC. It provides all necessary supply signals for the test IC and forwards the signals to be monitored to the respective measuring devices. The connection board and test IC are located in the ground plane, thus ensuring an optimum measurement environment. The probe that is needed for the respective measurement objective is connected to the ICT1. Thanks to a dedicated holder, the probes can be changed quickly without any additional tools, noted the company.

The pins to be tested in conducted emission measurements such as the 1?/150? method (IEC EN 61967-4) can be chosen in the control software. The ICT1 measures the emissions from the specified pin automatically and creates a measurement log.

Near-field probes (e.g. ICR micro-probes) can be used to measure radiated emissions. Apart from measurements at individual IC pins, area or volume scans can be made over the entire test IC. The ICT1 is a desktop unit with a footprint of 40cm x 40cm.

- Julien Happich
??EE Times Europe

Article Comments - EMC tester accommodates individual p...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top