Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > T&M

Test adapter geared for SMARC computer-on-modules

Posted: 14 Apr 2015 ?? ?Print Version ?Bookmark and Share

Keywords:Yamaichi Electronics? test adapter? computer-on-module?

Yamaichi Electronics has announced a test adapter for the Smart Mobility ARChitecture (SMARC) computer-on-module standard. According to the company, the device ensures a perfect alignment of the contacts and allows for 100 per cent contacting reliability up to 50k mechanical cycles.

Using spring probe pins, the adapter supports very high contact cycles, stated Yamaichi. It is volume test ready and reduces the cost per tested module. Operation is easy and secure. This test adapter within the company's YED900 test adapter series can be used for the evaluation of bench tests and for reliability testing from -50C up to 150C.

Test adapter

The socket is designed with compression mount technology (CMT), requiring no soldering and making it 'plug and play.' For contacting the module pads, a conical type plunger tip is commonly used. By using such a tip it can be assured that only a very small witness mark is formed on the module contact pad. The fine-pitch pins are available for pitches starting from 0.3mm. Kelvin type pins are also available.

- Julien Happich
??EE Times Europe

Article Comments - Test adapter geared for SMARC comput...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top