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Configurable test systems reduce testing cost

Posted: 27 Apr 2015 ?? ?Print Version ?Bookmark and Share

Keywords:National Instruments? test system? ATE?

National Instruments (NI) has developed a suite of software and hardware solutions including a first-hand preview of its Semiconductor Test System (STS) series. The STS series is a line of configurable test systems geared to lower the costs of semiconductor production test and lab characterisation.

Built on NI PXI modular capability with an added instrumentation and computing power, the STS series allows test engineers to evolve test capabilities and meet next-generation test requirements with lesser time and lower costs. Unlike traditional ATE systems, the STS combines modular instrumentation and graphical system design software that is particularly important for RF and mixed signal production test, indicated the company.

Chandran Nair, managing director of National Instruments ASEAN, said: "With rising costs of testing and increasing complexities in semiconductor technologies, traditional ATE systems are struggling to keep up with the market demands. With STS, our customers are now able to take advantage of the open, scalable platform-based approach that can be fully integrated into their existing production environment with minimal downtime, and this translates to huge costs saving and production gains."





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