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NI cuts cost of wireless production tests

Posted: 10 Aug 2015 ?? ?Print Version ?Bookmark and Share

Keywords:Wireless test system? wireless manufacturing test? speed and parallel test? RF test?

Platform-based systems provider National Instruments has announced the Wireless Test System (WTS), a solution that will lower the cost of high-volume wireless manufacturing test. With system designed for measurement speed and parallel test, companies can reduce test costs as well as multiply manufacturing throughput.

The WTS offers a single platform for multi-standard, multi-DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can improve instrument utilisation when testing multiple devices in parallel. The Wireless Test System integrates into a manufacturing line with ready-to-run test sequences for devices that use chipsets from suppliers like Qualcomm and Broadcom as well as integrated DUT and remote automation control. With these features, customers can see considerable efficiency gains from their RF test equipment and further reducing their cost of test.

The WTS is the latest system from NI built on PXI hardware and LabVIEW and TestStand software. With support for wireless standards from LTE Advanced to 802.11ac to Bluetooth Low Energy, the WTS is designed for manufacturing test of WLAN access points, cellular handsets, infotainment systems and other multi-standard devices that include cellular, wireless connectivity and navigation standards. The software-designed PXI vector signal transceiver technology delivers superior RF performance in the manufacturing test environment and a platform that can scale with the evolving requirements of RF test.

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