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Fully-automated PHY test sol'n aimed at mobile storage apps

Posted: 27 Oct 2015 ?? ?Print Version ?Bookmark and Share

Keywords:Tektronix? mobile storage? test? oscilloscope? PHY?

Tektronix Inc. has rolled out what it flaunts as the industry's first fully automated physical layer transmitter test solution for the MIPI M-PHY 3.1 specification and Conformance Test Suite (CTS) 3.1. The solution supports M-PHY High Speed Gears 1, 2 and 3, PWM Mode (G0-G7), and SYS Mode and claims to offer the industry's lowest noise solution for M-PHY measurements when used with Tektronix DPO70000SX or MSO/DPO70000DX oscilloscopes and P7600 series probes.

The mobile industry is moving toward smaller and faster devices that require faster communication between chips over interfaces such as SSIC and need faster access to storage devices over interfaces such as UFS/MIPI UniProSM. This drives the need for higher data rates, higher throughput, modern design implementations and the need for sophisticated test and measurement tools. Automated serial test solutions such as what Tektronix is now offering for MIPI M-PHY 3.1 allow engineers to complete the full set of tests in significantly less time while improving consistency. The automated solution supports advanced analysis, debugging and characterization of devices while allowing designers to test in compliance mode as well as user-defined mode.

M-PHY TX automated solution

The M-PHY TX automated solutions provides support for 100 per cent of tests as per M-PHY 3.1 and CTS 3.1 using the TekExpress 4.0 framework. The backend engine of automation is based on Iron Python that uses socket based programming and .Net remoting. Socket-based scripting interface is a de-facto standard that allows engineers to integrate Tektronix automated solution into their automation environments.

Testing M-PHY transmitters running in high-speed mode requires a scope and probe system with rise time 3X faster than the signal rise time, sensitivity of 200mVFS, minimal added noise (

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