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2014-07-04 Test platform supports high voltage, high-current devices
Advantest released its PVI8 floating power source that extends the capabilities of its V93000 test platform for high-voltage and high-current testing of embedded power devices.
2007-03-15 Photomask CD measurement system suits 45nm node
Vistec's new SEM-based CD measurement system is designed for the 45nm technology node photomask production and the 32nm process development.
2003-07-30 Network analyzers offer 5?s per point speed
The R3770 and R3768 network analyzers from Advantest offer a two-fold improvement over previous company offerings.
2005-07-18 Heard on the Beat: Agilent's ATE biz for sale?
Who's up or down in ATE?
2005-07-28 Elpida leads wafer testing venture
Elpida Memory Inc. has linked with Advantest, Kingston Technology and Powertech Technology to form a start-up that the group says will become the world's largest wafer testing service.
2008-05-26 Tool cuts test time for automotive devices
Advantest has introduced the T7723 mixed-signal test system with high-throughput and highly parallel test capabilities for testing high-density automotive devices.
2007-11-12 Test system targets multiple memory MCP devices
A high-speed, high-throughput memory test system for MCPs has been introduced by Advantest Corp.
2007-12-11 Test system reduces cost of SoC testing
Advantest has introduced a compact test solution designed to lower the cost of testing SoC devices used in digital consumer products and automotive electronics.
2010-09-14 SoC test platform integrates customizable modular solutions
Advantest integrates OptimalTest's solutions in semiconductor test equipment
2007-10-23 RF module carries out testing of RF SoC devices
Advantest Corp. is set to roll out in November a RF test solution for low-cost testing of multiport RF SoC devices used in cellular phones and other wireless products and equipment.
2008-10-30 New IC test group consolidates ATE standards
Advantest, Amkor, Infineon, Intel, LTX-Credence, Qualcomm, Roos Instruments, Teradyne, and Verigy have collaborated under a new group to foster precompetitive partnership and standards in automatic test equipment.
2014-05-28 Measurement system features expandable architecture
Advantest's platform provides the flexibility to conduct a wide range of measurement functions including analogue and middle power IV sources, signal capture module, and synchronised sequence control.
2008-05-30 Dynamic test handler doubles throughput
Advantest Corp. has announced its M6242 dynamic test handler that provides throughput of 42,200 units per hour for high-volume production test of memory devices such as DRAM.
2009-07-07 Comment: Will LTX-Credence survive ATE arena?
Mark LaPedus opines on the LTX-Credence's chances of competing against ATE big shots such as Advantest, Verigy and Teradyne.
2005-08-29 Wall Street down on ATE industry
The automatic test equipment (ATE) industry is finally showing some signs of life after a major slump, but Wall Street remains disappointed with the loss-ridden sector.
2010-11-22 Verigy acquires LTX-Credence
Verigy Inc. is expanding into the logic, mixed-signal and analog ATE markets with the acquisition of LTX-Credence Corp.
2009-03-03 TSMC details litho roadmap, taps maskless
Taiwan Semiconductor Manufacturing Co. Ltd has detailed it lithography roadmap and said it is still backing maskless technology at the SPIE Advanced Lithography conference.
2008-10-14 Trio collaborates to develop maskless ICs
Fujitsu Microelectronics Ltd and e-Shuttle Inc. have agreed to adopt D2S' advanced design for e-beam (DFEB) technology, starting with a 65nm low power (LP) library.
2009-06-15 Top 10 electronics blunders
Every once in awhile, electronics firms or individuals who work for them do something that makes everyone else in the industry scratch their heads and, perhaps, wince. These are actions and decisions thatwhile they may seem perfectly logical to those making the decisionsdon't really add up in the minds of most people.
2004-04-21 Test consortium expands to China
The Semiconductor Test Consortium has signed an agreement with the China Beijing Semiconductor Industry Association (CBSIA) to collaborate on individual and joint activities aimed at promoting the consortium's charter and deployment of its Open Architecture test initiative in China.
2005-08-19 Soaring tool costs to delay 450mm fabs
Soaring IC-equipment development costs could push out the appearance of next-generation 450mm wafer fabs to between 2020 and 2025a delay of more than a decade from its current schedule, warned an analyst at VLSI Research Inc
2005-08-22 Soaring tool costs to delay 450mm fabs
Soaring IC-equipment development costs could push out the appearance of next-generation 450mm wafer fabs to between 2020 and 2025 ? a delay of more than a decade from its current schedule, warned an analyst at VLSI Research Inc
2008-11-24 Slowdown hits Japan fab-tool market, too
Japanese-based semiconductor equipment manufacturers posted a book-to-bill ratio of 0.81 in October, down from 0.95 in September, according to the Semiconductor Equipment Association of Japan.
2007-08-13 Slowdown hits ATE industry
A slowdown is evident in the ATE industry, opening the possibility of another downturn.
2008-04-09 Slight changes mark IC-equipment ranking
The fab-tool rankings experienced a minor change in 2007, reports Gartner Inc.
2007-04-12 Service kicks off at Fujitsu's new 300mm fab
Fujitsu Ltd. has begun operating its second 300mm wafer fab for 65nm chip fabrication. Volume shipments will begin in July.
2002-03-14 SEMI to present SEMICON China
Semiconductor Equipment and Materials Int. (SEMI) will present SEMICON China 2002 at the Shanghai INTEX on March 26 to 27, 2002, targeting the semiconductor manufacturing industry in China.
2003-08-13 Renesas taps ChipMOS for assembly, testing services
Renesas Technology Corp. has signed ChipMOS Technologies Inc. to provide wafer and IC test services.
2011-03-17 Quake unlinks fab tool supply chain
The March 11 earthquake in Japan has affected semiconductor equipment companies, prompting supply chain worries in the industry.
2008-11-13 Opinion: Are ATE standards destined for failure?
One of the by-products in low-cost IC test is standards. Suppliers of automatic test equipment (ATE) have made several strides to lower the cost of test by rolling out new testers, but they have fallen way short on the standardization front.
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