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2013-12-20 CyberOptics expands WaferSense line with 450nm devices
WaferSense products are wireless, wafer-shaped, real-time measurement devices that travel through fabrication tools similar to actual wafers.
2007-02-01 WaferSense ATS helps eliminate wafer scrap
CyberOptics claim its WaferSense ATS employs machine vision to see inside semiconductor equipment and to help avoid costly wafer mishandling, a significant cause of wafer scrap in highly automated semiconductor manufacturing plants.
2004-11-10 Wafer processing device provides quick, accurate leveling
CyberOptics announced a wireless, wafer-like device that enables quick and accurate leveling of semiconductor wafer processing and automation equipment.
2015-02-06 3D AOI system touts multi-reflection suppression tech
The SQ3000 3D automated optical inspection system from CyberOptics inhibits reflections that could result in measurement inaccuracies, which is especially important for inspecting shiny objects.
2011-08-11 Modular AOI tech touted as industry's first
CyberOptics' AOI and SPI systems deliver high-speed, flexible inspection of solder and lead defects, presence and position, correct parts and polarity down to 01005 components.
2011-09-07 AOI tabletop system inspects at 100cm2/sec
CyberOptics Corp. is displaying a prototype version of the QX100 AOI Tabletop System alongside its latest inspection technologies.
2009-01-09 Tough '09 awaits fab-tool, materials sector
Based on the early returns, the fab-tool and electronic materials markets are off to a rough start in 2009. And don't expect the market to improve, prompting the possible acceleration of a shake-out in the sector.
2010-11-04 Test coverage analysis tool features yield estimation
ASTER's TestWay Express now allows estimates for new product yields
2016-04-15 Oven-like 3D scanning system boasts of one-button simplicity
Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
2011-04-06 ASTER rolls DfT, test coverage analysis tool
ASTER Technologies releases the first tool to provide an integrated workflow for DfT and test coverage analysis.
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