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2006-06-28 Protection devices guard against electrical surges
STMicroelectronics's new protection devices protect LNB voltage regulator in satellite STB applications against lightning and electrical overstress surges.
2013-07-18 Failure signature of electrical overstress
Here's a catalogue of failure signatures from common electrical overstress failure modes.
2009-06-02 Electrical overstress damage of TI 1394 PHY devices
This application note provides information on how to recognize a 1394 PHY device that has been damaged by a late Vg event, an explanation of how the damage occurs and suggestions on both decreasing the frequency of late Vg events in a system and protecting 1394 PHY devices from damage due to late Vg events.
2014-01-30 Avoiding electrical overstress in electronics
Here are some of the ways in which electrical overstress can cause the failure of integrated circuits and electronic systems.
2014-06-02 Identify electrically overstressed LEDs (Part 3)
Here's a continuation of the discussion on the conditions that can induce electrical overstress and catastrophic failure. It focuses on the different types of failure mechanisms.
2014-05-27 Identify electrically overstressed LEDs (Part 2)
This second instalment continues to look at the conditions that can induce electrical overstress and catastrophic failure. It also tackles some ways to minimise the potential for EOS.
2014-05-22 Identify electrically overstressed LEDs (Part 1)
Understand the transient conditions that are benign to LED components and those that can induce electrical overstress and catastrophic failure, and know some ways to minimise the potential for EOS.
2003-05-26 ESD and Transient Protection Using the SP720
This application note discusses the importance of transient protection in ICs using the SP70, to reduce the risk of electrical overstress and ESD.
2007-02-28 Designing to protect MAX2140's internal ESD diode during nonstandard operation
This application note reviews the cause of the ESD diode problem during hot-plug, and helps calculate and properly design the circuitry to prevent the failure.
2001-03-01 Circuit protection for next-generation products
Circuit designers should be aware of the conditions that cause electrical overstress (EOS) and provide appropriate circuit protection to ensure safe and reliable operation.
2008-05-05 Wire-to-board connectors enable secure mating
Molex Inc. has introduced a series of 2mm (.079-inch) pitch SMT wire-to-board connectors designed for applications that require secure electrical contact
2011-02-10 Protection for EOS for IEEE1394 lines with TPD4S1394
Learn how to design a late-Vg protection circuit in their systems using the TPD4S1394.
2003-12-18 Linear Tech side drivers protect power MOSFETs
Linear Technology Corp. has introduced two secondary side synchronous N-channel MOSFET drivers that feature timer and current sense comparators to protect the external MOSFETs during normal and light load operation, power up/down, and when the driver supply voltage drops too low.
2014-02-04 Implement compact wireless battery charging
Wireless charging adds value, reliability and robustness in many applications.
2007-01-18 HVICs enable simple circuit designs
Compared to optocouplers, the IR's new family of 600V high-side single-channel driver ICs provide lower input current of 40?A and an output signal of 0 to 15V to reduce part count and simplify circuit design.
2007-02-06 HVIC with PFC eases multilamp circuits in fluorescent ballasts
IR's IRS2168D HVIC features a wide range input voltage PFC to simplify complex multilamp circuits.
2014-11-21 Grasping the significance of charge detectors
Learn about the role of charger detectors in the USB battery charging specification rev. 1.2, and understand how they keep the implementation clean and simple to use.
2008-05-20 Gate driver boosts robustness, reliability in motor drives
International Rectifier has introduced a rugged 600V three-phase gate driver IC for low-, mid- and high-voltage motor drive applications.
2015-04-28 Exploring the failure analysis process
Determining the root cause of electronic system failures requires a disciplined and systematic analytical process, along with sophisticated tools for testing and visualizing the behaviours of sample devices.
2012-09-07 Cool bypass switches cut cost per Watt for PVs
ST's SPV1512 and SPV1520 claim to enable higher percentage of harvested energy, and reduce both installation complexity and cost for consumers.
2011-09-12 Achieving reinforced insulation in data isolators
Here's a discussion on the requirements and mandates for electric-shock safety with respect to this common component.
2015-12-30 A primer on debugging video apps and beyond
Starting with the review of the application and culminating with the submission of parts through official failure analysis channels, this guide attempts to provide as comprehensive a framework as possible.
2015-02-18 Understand product failures through bathtub curves
The likelihood of a component failing to properly function over time can be described by the bathtub curve. Read this article to learn more about this concept.
2003-03-12 Molex Mini PCI connectors tout low mounting profile
Molex has introduced a line of 124-pin Type III Mini PCI connectors that feature a mounting profile of up to 5.2mm.
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