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2014-10-13 RF probes offer mechanical reliability for semicon test
The Z1 boasts an insertion loss of about 30Ghz at -1dB, while Z0 is ECT's ultra-high bandwidth series featuring 1.5mm test height of and 0.60nH of inductance that touts an insertion loss of 40Ghz at -1dB.
2013-09-10 LTX-Credence to acquire Multitest, ECT
LTX-Credence will acquire Dover Corporations two businesses for a purchase price of $93.5 million.
2013-11-18 Checksum, ECT unveil universal-probe test system
The Tilt 12KN claims to deliver in-circuit coverage and increased throughput using Tilt fixturing at a low bed-of-nails tooling cost of about $2 per pin.
2015-12-23 Interconnect system from ECT aimed at high-speed apps
The VG Mass Interconnect System acts as the connector interface between test instruments (PXI, VXI, LXI, GPIB, SCXI & PCI) and devices/units under test (DUT/UUT).
2015-01-20 ECT offers hard plating on long-travel probes
ECT enhances its probe offerings with long-travel LFRE-plated probes that are often used in dual-stage fixture applications. The latest products come in different tip styles.
2014-06-06 ECT beefs up connector reliability
The connector is designed with an active biasing to allow for continual internal contact, and a deep draw plunger make for a low mass had to cope with shock and vibration.
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