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2005-09-12 Tektronix rolls RFID software suite for its spectrum analyzers
Tektronix introduced a new RFID software measurement suite for WCA200A, RSA3300A and RSA3408A real-time spectrum analyzers.
2006-02-02 Tektronix rolls out new monitoring tool for video over IP
Tektronix Inc. announced the availability of the Spectra2|VQM (video quality measurement) monitoring solution for the diagnosis and analysis of streaming video transmitted over IP.
2002-01-08 Tektronix oscilloscope boasts 6GHz operation
The TDS6604 digital storage oscilloscope (DSO) is a 2G high-performance SiGe instrument that provides up to 6GHz bandwidth and simultaneous 20GSa/s sampling rate on two channels.
2003-03-18 Tektronix obtains ISO-14001 compliance
Tektronix Inc. has obtained an ISO-14001 certification - an international standard for environmental management systems.
2002-10-04 Tektronix fully acquires Sony/Tektronix joint venture
Tektronix Inc. has finalized the acquisition of Sony's interest in its Japanese joint venture, Sony/Tektronix and will be called Tektronix Japan Ltd.
2003-05-12 Tektronix execs see phased recovery for test industry
The test and measurement sector of the electronics industry will undergo a phased recovery that will depend on more than just an overall economic turnaround, according to executives at the annual Tektronix Analyst Day.
2003-04-11 Tektronix establishes another factory in China
Tektronix Electronics Co. Ltd has opened a new factory in Shanghai, mainland China.
2010-05-07 Tektronix buys signal integrity test developer
Tektronix has completed the acquisition of SyntheSys Research, a developer of signal integrity test and measurement instrumentation for the computer, storage and communications industries.
2006-07-27 Tektronix announces new VP of APAC sales for comms biz
Tektronix announced that Bernie Reinke has joined the company as vice president of sales for its communications business in Asia Pacific.
2011-07-07 Tektronix acquires Veridae
Tektronix has signed an agreement to buy ASIC/FPGA prototyping vendor, Veridae Systems.
2004-01-09 Technology allows enhanced accuracy of IC exposure systems
Toshiba Corp. has bared plans to market a focus measurement technology that greatly improves the focal measurement performance of semiconductor exposure systems.
2014-06-23 TE expands into high-growth sensor market
TE Connectivity's $1.7 billion acquisition sensor maker Measurement Specialties broadens its range of solutions, increasing its addressable market by nearly $40 billion.
2007-07-30 TDC boasts 25 million EPS throughput at full speed
Running at full speed, Agilent's TC890 TDC offers a 25 million events-per-second (EPS) data-throughput rate.
2012-02-07 T&M execs on the hot seat
Although the panelists were criticized that they were not doing enough to address the customers' toughest challenges, everyone agreed that test engineering increasingly involves multidiciplinary skills.
2002-10-28 Swept adjacent channel power analysis on digital TV amplifiers
The application software described here provides swept Adjacent Channel Power analysis, using AMIQ and SMIQ for signal generation and FSP, FSU or FSE for signal analysis, on power amplifiers used in digital TV systems.
2003-04-28 Stec, Ferran ink manufacturing pacts
Stec Inc. has established global sales and manufacturing contracts with Ferran Scientific Inc. on vacuum components of capacitance diaphragm gauge (CDG) and residual gas analyzer (RGA) for semiconductor and FPD/LCD businesses.
2005-12-01 Statistical sensitivity key to manufacturable designs
Understand the four major steps of statistical design to increase product yield and make for a more manufacturable design.
2006-10-02 Spectrum, signal analyzers boost RF test
Here are instrument and measurement basics that will help you avoid frequency-measurement errors in spectrum and vector signal analyzers.
2011-05-13 Spectrum analyzer offers EMC diagnostic option
Rohde & Schwarz adds an EMI measurement application option for the R&S FSVR real-time spectrum analyzer and the R&S FSV signal and spectrum analyzer.
2007-07-02 Solve complexity issues in 4-port RF designs
This article shows how to solve complexity issues arising from the measurement of 4-port RF devices and to ensure RF test system calibration is accurate, reliable and repeatable.
2006-12-15 Solution eases monitoring, control of remote tests
NI said its Measurement Studio 8.1 simplifies and accelerates remote monitoring and control with new network variables that help engineers communicate between Microsoft Windows or Web-based applications and remote test machines.
2002-03-08 Soil water content measurements: Considering variability and uncertainty
This application note presents a simple approach for improving water content estimation under spatially variable conditions.
2013-01-17 SMM imaging of dopant structures of semiconductors
SMM can be engineered to measure differential capacitance by applying a low-frequency modulation signal to the MW measuring signal.
2007-04-23 Small signal RF-transistor: S-Parameters, Noise-Figure and Intermodulation
With the increasing need to reduce development time, RF designers are increasingly employing simulation tools which need accurate device data. This note is intended to help understand the origin of the values required and to reconstruct a similar setup for own analysis and verification.
2002-01-24 Silicon Wave protocol analyzer software offers new protocol decodes
The Version 2.2 software for the company's BPA100 Bluetooth protocol analyzer offers new protocol decodes for additional translation and analysis of extended Bluetooth layers.
2013-10-21 Sensor-based system optimises industrial cleaning
Fraunhofer researchers created a sensor-based measurement system that is integrated directly in the cleaning system, where it registers and analyses particles caught up in the cleansing fluid.
2005-04-08 Semiconductor analyzer packs integrated CV, IV capability
Agilent is introducing a Windows-based semiconductor device analyzer that integrates CV and IV measurements into a single instrument.
2006-12-11 SeaSolve, NI ink WiMAX collaboration in India
SeaSolve Software and National Instruments announced a partnership wherein the two companies will provide the hardware and software required for efficient testing, analysis and troubleshooting of fixed and mobile WiMAX stations and chipsets.
2011-01-14 Rugged clamp meters offer versatility, safety
Electronic test and measurement company Fluke's clamp meters are now available through element14. Available models include Fluke 381, 376, 375, 374, iFlex 12500-18 and 12500-10.
2002-10-16 Rudolph Tech establishes China office
Rudolph Technologies Inc. has established an office in Shanghai, China.
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