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2005-09-22 Tektronix' measurement solution enables VIA to drive innovation
VIA Technologies Inc. has selected digital systems analysis tools from Tektronix Inc. to develop digital products based on serial data standards such as second-generation PCI-Express and SATA III.
2002-09-10 Tektronix BTS tool adds CDMA2000 measurement options
Tektronix Inc. has added options to provide automatic CDMA2000 1x EV-DO measurements and analysis to its NetTek basestation field tool, and simplify, as well as reduce installation times.
2005-05-31 TDK launches UWB test system for device evaluation, measurement
TDK Corp. has disclosed the availability of a total solution integrated UWB evaluation and measurement system. Sales of the new system will start in both Japan and the U.S. in June 2005.
2000-02-28 Strain Gauge Measurement ?A Tutorial
There are several methods of measuring strain, the most common is with strain gauge, a device whose electrical resistance varies in proportion to amount of strain. This application note contains tutorial material about strain gauges.
2000-11-30 Startup time, profile measurement of PLL VCOs and crystal oscillators
This application note intends to alleviate the anxiety and pain that have been associated with startup time and profile measurements of PLL VCOs and crystal oscillators by introducing a test setup that is user-friendly and convenient to build.
2008-05-23 Standalone RPM measurement system with LED display and PSoC
The simple design in this application note by J. Jayapandian from Cypress Semiconductor accurately measures the speed, in RPMs, of a rotating wheel using an inexpensive IR optocoupler connected to a PSoC device.
2002-10-28 Spurious emission measurement on 3GPP base station transmitters
This application note provides information about the spurious emission measurement on 3 GPP base station transmitters.
2009-09-16 Source measurement handles up to nanoamp levels
The three-channel source measure unit can simultaneously provide power and perform measurements.
2011-07-19 Software tool expedites measurement data analysis
NI's NI DIAdem 2011 software is designed to improve efficiency in locating, inspecting, analyzing and reporting on measurement data.
2011-05-16 SoC demonstrates AC/DC-power measurement
Teridian Semiconductor demonstrates AC/DC-power measurement targeted for high-power LED-lighting ballasts using the Teridian/Maxim 78M6613 energy-measurement SoC.
2009-06-01 Skew margin measurement for 4-Channel (3 data channels plus clock channel) LVDS serializers/deserializers
This application note shows a step-by-step method for measuring skew margin. Following this approach, you can clarify the specification and definition of skew margin in the data sheets for these 4-channel Serdes devices
2003-10-27 Signal integrity: faster and simpler debugging with integrated digital and analog measurement
This application note details steps to debugging signal integrity problems in high-speed digital systems using integrated digital and analog measurement.
2007-06-08 Signal analyzers offer high accuracy measurement
Anritsu Corp. unrolls two new models of its MS2690A (50Hz to 6GHz)/MS2691A (50Hz to 13.5GHz) high performance signal analyzer supporting a wide range of wireless communications systems.
2007-05-10 Signal analyzer has added measurement, security features
Agilent Technologies Inc. has added significant measurement and security enhancements to the Agilent N9020A MXA signal analyzer, including the ability to create complete instrument security via CPU and HDD removal.
2003-09-29 Setram to acquire Agilent test, measurement products
Setram Int. has agreed to acquire Agilent Tech's Wizard Wireless Network Planning and Design Tool products within Agilent's test and measurement business.
2009-09-02 Sequential analysis ensures accurate power measurement
Calypto Design Systems Inc. has developed what it touts to be the most accurate register-transfer level (RTL) power analysis capability by applying its patented sequential analysis technology.
2006-04-21 Sensors accurate position measurement
Macro Sensors' new line of 24V spring-loaded position sensors offers accurate position measurement in a variety of dimensional gaging applications.
2012-02-10 Semicon measurement segment tops industry growth
The semiconductor metrology/inspection equipment market grew 24.8 percent last year while overall semiconductor equipment grew only 9.3 percent.
2011-10-06 Selecting the right switch for test and measurement system
Here's a document to assist you in selecting the most appropriate switch type for a given application.
2004-06-21 Samsung adopts Tektronix video measurement set
Samsung Electronics has chosen Tektronix Inc.'s VM5000 automated video measurement set for measuring HDTV and progressive component video signals.
2012-02-03 RSE measurement sol'n touts 80dB dynamic range
The R&S OSP-B155 plug-in module with 155dBm/Hz sensitivity claims to simplify measurement of radiated spurious emissions on LTE devices.
2014-01-14 RPI demonstrates prototype light measurement system
The prototype Google Glass-based personal light measurement system is designed to use an Android app to help people understand their circadian rhythms to improve heath, happiness, and productivity.
2002-05-07 Room acoustics: Acoustical parameters measurement
This application note describes how to use the Sample Champion Room Acoustics plug-in for computing RT20, RT30, RT custom, EDT, D50, C50, C custom and TS parameters.
2013-03-27 RMS power detector touts 10GHz, 67 dB measurement range
Analog Devices' ADL5906 TruPwr RMS detector is well-suited for a variety of applications that require an accurate RMS measurement of signal power.
2002-12-16 RF measurement using vector analysis
Vector analysis offers many advantages for measuring general-purpose RF signals by dramatically improving measurement throughput.
2003-05-27 RF level measurement accuracy of DTV test receivers
This application note illustrates the RF level measurement accuracy of Rohde & Schwarz's TV test receiver EFA.
2013-01-23 Reducing measurement uncertainty
This application note presents a number of techniques that can be used to minimise mismatch uncertainty.
2001-08-29 Rayleigh insertion loss measurement
This application note describes a method for measurement of insertion loss using Rayleigh backscatter suited for instances where the insertion loss is relatively small (0.01dB to 5dB).
2011-04-05 PXI measurement suite supports LTE TDD
Aeroflex introduces the measurement suite to support Time Division Duplex mode of 3GPP Long Term Evolution.
2010-04-26 PXI measurement suite cuts TD-SCDMA test costs
From Aeroflex comes the PXI 3030 TD-SCDMA measurement suite designed to provide fast and cost-effective production testing of mobile handsets and RFICs.
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