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2010-08-02 PV measurement tools promise consistency
Konica Minolta Sensing Americas Inc. launches a full line of photovoltaic measurement and characterization instruments that feature a reference cell as a standard point of calibration.
2002-05-06 Pulling measurement of Z-COMM VCOs
This application note describes the pulling test setup and procedure of verifying measured pulling performance of Z-COMM VCOs.
2002-09-25 Program for Measurement Uncertainty analysis with Rohde & Schwarz Power Meters
This application note describes the Measurement Uncertainty Analysis Program NRV-Z.
2002-09-25 Program for Measurement Uncertainty Analysis with Rohde & PC Software
This application note describes the use of the SetupAccelerator PC software in the SMIQ signal generator.
2014-07-09 Probe series touts 1THz high-accuracy measurement
The T-Wave probe series includes millimetre and sub-millimetre wavelength on-wafer ground-signal-ground probes and components for electrical measurement with frequencies up to 1.1THz.
2002-03-01 Preventing and attacking measurement noise problems
This application note discusses some basic methods available for minimizing the effects of interference noise in voltage measurement applications.
2001-04-17 Precision temperature measurement using RTDs (resistance temperature detectors) with the CS5516 and CS5520 bridge transducer A/D converters
This application note discusses how the CS5516/CS5520 bridge-measurement A/D converters can be configured for precise measurement of resistance using a ratiometric resistance measurement technique.
2008-02-27 Power monitor delivers accurate dynamic measurement
IR offers the IR3721 output power monitor IC for low-voltage DC/DC converters used in notebook computers, desktop computers and energy-efficient server applications.
2007-03-15 Photomask CD measurement system suits 45nm node
Vistec's new SEM-based CD measurement system is designed for the 45nm technology node photomask production and the 32nm process development.
2004-12-14 Phase noise measurement using the phase lock technique
This app note discusses phase noise measurement using the phase lock technique
2002-05-03 Phase noise measurement of Z-COMM VCOs
This application note presents the procedures and setup of phase noise test for the purpose of verifying published phase noise performance.
2012-12-17 Perform automated communications measurement
Here are two examples of how to automate the entire measurement process in MATLAB.
2015-12-08 PCIe clock jitter measurement tool streamlines timing design
Silicon Labs' clock jitter tool features an intuitive graphical user interface that guides developers through the few simple steps required to compute clock jitter from an oscilloscope data file.
2005-06-07 Parametric measurement unit (PMU) layout guidelines
This app note discusses ways to help system designers apply proper layout techniques and signal routing.
2011-02-03 Op amp family improves sensor measurement
TI's OPAx320 family supports high-impedance sensor signal conditioning with 0.9pA input bias current, zero crossover distortion, 150?V offset voltage, and common mode rejection rate of 114dB.
2009-08-25 One-button 10GBASE-T measurement halves cost
Tektronix's new oscilloscope-based solution removes complexity and improves usability.
2004-11-03 Omron's new sensors provide accurate measurement
Omron expanded its smart sensor family by introducing a contact displacement measurement sensor that is claimed by the company to be one of the most accurate in the industry.
2004-10-19 Omron IR thermosensor provides accurate measurement
Omron introduced a new infrared thermosensor that provides an accurate, highly stable and cost-effective way to measure the temperature of objects.
2003-05-27 NPR - noise power ratio signal generation and measurement
This application note describes Noise Power Ratio (NPR), an add-on tool for WinIQSim to generate noise power ratio stimulus signals and measure the resulting noise power ratio of a device under test (DUT) using Rohde & Schwarz instruments via the IEC/IEEE bus.
2011-05-13 Novellus subsidiary develops new gap measurement tech
Novellus' Peter Wolters subsidiary has developed an innovative gap measurement technology for double-side wafer polishing, resulting in outstanding control of wafer quality.
2010-06-21 Noise figure measurement accuracy: the Y-factor method
Noise figure is a key performance parameter in many RF systems. A low noise figure provides improved SNR for analog receivers, and reduces bit error rate in digital receivers.
2008-03-14 NI: Path leads to parallel for test and measurement
Actions, computing and instructions occurring simultaneously are increasingly common requirements in today's world, as evidenced by the unstoppable migration from single-core to multicore processors in PCs. This new paradigmthe Parallel Shiftbrings a huge challenge to test engineers: the marriage of parallelism with computing, and in related applications of measurement and control.
2011-03-08 NI wireless sensor networks extend measurement capabilities
National Instruments' new programmable gateway and voltage/resistance temperature detector increase each of the company's WSN platforms.
2006-05-04 NI upgrades Measurement Studio suite
National Instruments announced the release of Measurement Studio 8, a comprehensive suite of class libraries and controls for acquiring, analyzing and presenting data in apps built using Microsoft Visual Studio.
2005-05-18 NI measurement services software now includes VI Logger Lite
NI announced that its measurement services software for Windows 2000/XP shipped with plug-in data acquisition devices now includes free VI Logger Lite data-logging software.
1999-11-20 New timing measurement techniques for high-speed processors using TDS oscilloscopes
Today's high bandwidth acquisition circuits, extremely long record lengths, and custom SW applications are making possible a new level of precision in timing measurements. This application note describes the use of TDS oscilloscopes for high-speed processors for the enhancement of new timing measurement techniques.
2005-09-20 New solution for pressure measurement in semiconductor apps
MKS Instruments introduced a compact and low current solution for pressure measurement in difficult semiconductor and biopharmaceutical apps where condensable by-products exist.
2005-09-27 New digital controllers and indicators offer precise measurement
Macro Sensors, an American Sensor Technologies (AST) company specializing in the manufacture of LVDT-based linear and rotary sensors, gauging probes, support electronics and related instrumentation, introduced a new family of economically-priced and user-friendly digital controllers and indicators that promises to deliver precise measurement for applications using AC- and DC-LVDT (Linear Variable Differential Transformer) inputs.
2007-09-24 Network analyzers support embedded LO measurement
Agilent has announced the availability of a new embedded LO measurement capability for its PNA series network analyzers.
2005-05-06 National Instruments acquires Measurement Computing
National Instruments has acquired the operating assets of Measurement Computing Corp., a provider of low-cost data acquisition products.
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