Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > measurement

measurement Search results

total search3293 articles
2001-09-10 Motor/Polygon speed stability definition and measurement
This application note describes speed stability in polygon/motor assemblies for use in laser printing machines.
2013-07-03 MOSFET load switch PCB with temp measurement
Read about a demo PCB with identical load switch MOSFET crystals in a DFN2020, DFN3333 and an SO-8 package which can be compared depending on their thermal performance.
2006-12-05 Module enhances temperature measurement accuracy
TT electronics BI Technologies Electronic Components Division has developed a cold junction compensation module, providing design engineers a device to enhance the accuracy of temperature measurements.
2011-07-19 Modes of operation on MAX9949 and MAX9950 parametric measurement units
Here's a discussion on the four main operating modes for the MAX9949/MAX9950 parametric measuring units (PMUs).
2010-06-08 Mobile WiMAX PHY layer (RF) operation and measurement
This application note is intended for engineers developing and testing mobile or subscriber stations (MS or SS) and their components, based on the IEEE 802.16e OFDMA amendment to the 802.16-2004 standard.
2007-10-16 MMICs address needs of test & measurement tools
Avago Technologies has announced three new MMICs designed to address the complex needs of test and measurement equipment applications for wireless networks.
2002-03-01 Millimeter wave vector analysis calibration and measurement
This application note describes the vector network analysis calibration kits for the WR-08 through WR-03 waveguide bands.
2002-10-08 Microstar adopts Tektronix measurement tools
Microstar Int. Ltd has purchased multi-units of test instruments from Tektronix Inc.
2005-09-13 Metrology tool offers atomic layer measurement accuracy
A manual, benchtop non-destructive R&D metrology tool that offers atomic layer measurement accuracy to 7 angstroms of oxide has been launched by Metryx.
2008-01-15 MEMS measurement tech could increase wafer yields
NIST claims that CMOS semiconductor makers could take advantage of its MEMS measurement regime to increase wafer yields by reducing the frequency of failures.
2010-11-11 MEMS device claims complete inertial measurement
When used with a magnetometer, the device provides nine-degree-of-freedom functionality for smart phones, touchscreen tablets, 3D TV remote controls, gaming consoles, DSCs and video cameras.
2006-05-01 Measurement, location relating to EFT/ESD
The E1 disturbance immunity development system offers engineers a new and effective measurement method that can help them locate the sensitive spot in a circuit.
2006-12-01 Measurement technique for determining RF immunity
This article describes a general technique for measuring the RF noise-rejection capability of an integrated circuit board. RF-immunity testing subjects the board to controlled levels of RF, representing the stress likely to be encountered during its operation.
2014-05-28 Measurement system features expandable architecture
Advantest's platform provides the flexibility to conduct a wide range of measurement functions including analogue and middle power IV sources, signal capture module, and synchronised sequence control.
2002-07-17 Measurement Specialties to sell Milpitas wafer fab
Measurement Specialties Inc. has signed an agreement to sell its wafer fab facility in Milpitas, California.
2008-08-07 Measurement software supports 2.5G GSM/Edge
Anritsu's measurement software packages can be incorporated into the MS269xA series that allow the signal analyzers to support 2.5G GSM/Edge and G Edge Evolution (EGPRS2) mobile phone systems.
2008-04-02 Measurement receiver supports all wireless techs in all RF bands
Agilent has launched six new models for its W1314A measurement receiver platform designed to simultaneously measure all wireless technologies in all RF bands in a given market using a single unit.
2002-10-28 Measurement reading and modifying the correction data for system errors and power of a ZVR vector network analyzer
This application note covers system error and power correction data for vector network analyzers of the ZVR family.
2000-12-11 Measurement of Zener voltage to thermal equilibrium with pulsed test current
This application note discusses the zener voltage correlation problem, which sometimes exists between the manufacturer and the customer's incoming inspection. A method is shown to aid in the correlation of zener voltage between thermal equilibrium and pulse testing.
2001-09-10 Measurement of surface roughness
This application note describes a different test for the measurement of surface roughness of diamond turned and conventionally polished mirrors.
2002-05-07 Measurement of SNR, THD, THD+N and IMD
This application note discusses and illustrates the process of measuring SNR, THD, THD+N and IMD.
2002-09-06 Measurement of adjacent channel leakage power on 3GPP W-CDMA signals with the FSP
This application note explains the concept of Adjacent Channel Leakage Ratio (ACLR) measurement on 3GPP W-CDMA signals with the spectrum analyzer FSP.
2015-11-13 Measurement Computing to merge with Data Translation
Although both companies make PC plug-in and USB data-acquisition systems, Data Translation is known for high-performance data-acquisition products while Measurement Computing is known for lower-cost products.
2005-11-17 Measurement bits test WLAN, GSM/EDGE RFIC, mobile handsets
Designed for use with Aeroflex's PXI-based modular RF platform, these software suites help speed up testing during the development and manufacture of WLAN and cellular devices.
2008-07-03 Measurement app, signal analyzers roll for LTE devices
Agilent Technologies Inc. has developed a new 3GPP Long Term Evolution (LTE) measurement application for its X-Series signal analyzers.
2009-10-16 Measurement amp tailored for gauge sensors
From Burster comes the 9236 series of measurement amplifiers that offer multichannel capability to process the standard output signal from strain gauge sensors.
2002-10-28 Measurement accuracy of the ZVK vector network analyzer
This application note evaluates the measurement accuracy of the ZVK vector network analyzer.
2013-09-25 MCU evaluation platform comes with power measurement tool
Renesas' RX111 Promotion Board is geared to facilitate the evaluation of Renesas' RX111 MCUs in applications including mobile healthcare, smart meters and industrial and building automation.
2014-06-09 Maximising battery measurement AFEs
This application note provides a framework for, and examples of, selecting system building blocks that satisfy diverse accuracy and cost requirements.
2002-04-15 Matsushita surface measurement unit called Blu-ray disk system enabler
Matsushita Electric Industrial Co. Ltd. has developed a 3D profilometer that it says is a crucial tool for making the lens for the next-generation Blu-Ray DVD systems.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

Back to Top