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2005-04-25 USB high-voltage I/O module supplants PCI equivalent
Measurement Computing's new digital I/O module is designed as an alternative to, or replacement for, PCI-based systems used for high-voltage monitoring and controlbut its' entirely plug-and-play, thanks to USB.
2005-06-17 USB box controls, monitors relays
As a follow-on to its recently introduced digital I/O module, Measurement Computing announces its $299 USB-SSR24, a USB device for monitoring and controlling solid-state relays.
2011-08-25 Upgraded PXI platform cuts test times, costs
NI has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit modules and source measure unit modules.
1999-04-08 Understanding the evolution of serial interface in analog-to-digital converters
This paper discusses the evolution of ADCs in temperature measurement systems and how the devices has become more of a system on a chip solution for such systems.
2012-04-24 TV analyzer aimed at DTV transmitters
The R&S ETC compact TV analyzer supports ISDB-T, DVB-T and DVB-T2, and features spectrum analysis, TV analysis, scalar network analysis and power measurement.
2003-05-28 TSMC adopts Therma-Wave Opti-Probe tool
TSMC has selected Therma-Wave's Opti-Probe Measurement Film System as its Tool of Record for 193nm film metrology.
2009-02-18 True-rms ammeters promise accurate reading
From Murata Power Solutions comes the Datel ACA5-20RM series of complete, high current, true-rms responding AC ammeters designed to interface directly with an external 5A output current transformer.
2013-08-16 Triaxial DC accelerometer withstands more than 5000G shock
The Model 3803A accelerometer is hermetically sealed in a welded, stainless steel housing and is offered in dynamic ranges from 2G's to 2,000G's.
2010-08-09 Tips for optimising your switch matrix performance
This application note offers eight tips to help you optimise your measurement matrix switching performance and give you the edge you need to be competitive.
2014-01-27 TI's op amp boasts high precision aimed at industrial apps
The OPA192 achieves stable offset voltage drift over the full specified temperature range, which eliminates the need for system level calibration.
2002-04-02 TI logarithmic amplifier provides 20-bit dynamic range
The LOG102 logarithmic amplifier measures the log ratio of input currents from 1nA to 1mA with 0.5 percent accuracy and produces an output voltage of change of 1V for each decade change of input current.
2007-05-02 TI intros two-stage current sense monitors
TI's voltage-output, high-side current sense monitors feature a two-stage architecture to ease the design of circuits requiring additional filtering of the current signal.
2006-11-20 TI announces high-accuracy temperature sensor
Texas Instruments has announced the TMP275, a low-power, 0.5C-accurate, digital-output temperature sensor.
2008-09-04 Thermocouple power sensors claim 'widest' dynamic range
Agilent Technologies Inc. has introduced thermocouple power sensors that the company claims to be industry-leading in terms of dynamic range in average-power measurements.
2003-06-29 The most common abbreviations used in the standards for digital TV: MPEG2, DVB and ATSC
This application note provides a list of the most common abbreviations used in the standards for digital TV.
2002-02-25 The benefits of input reversal and excitation reversal for voltage measurements
This application note discusses the theory behind using input reversal and excitation reversal in voltage measurement systems.
2002-03-08 TH3-PH calibration procedure pH and Redox (ORP) electrodes
This application note illustrates the calibration procedure for pH and Redox electrodes in measurement applications.
2007-01-03 Testing solutions roll for RF conducted immunity
AR RF/Microwave Instrumentation has unveiled two complete testing solutions for RF conducted immunity testing that are both fully self-contained in a single rack.
2006-07-01 Testing solder joints for Pb-free connectors
OEMs and contract manufacturers in the electronics industry have been accelerating efforts to replace tin-lead finishes on electronics components and tin-lead solder in interconnects with lead-free finish and solder. Test shows that solder joints constructed from lead-free solder show higher voiding content than those of eutectic tin-lead solder.
2001-08-27 Testing inductors at application frequencies
This application note discusses accurate measurement of coil parameters at the application frequency.
2006-05-01 Test takes new role in yield improvement
New test methodologies focusing on identifying failure mechanisms provide a valuable feedback link to help you gauge success in product development.
2014-05-13 Test instruments advance fool-proof user interfaces
Innovations in test equipment do not only feature improved accuracy and sensitivity, but also better and more intuitive user guidancewith touch screen interfaces and Internet-accessible measurements.
2010-03-26 Test instrument handles BER, eye pattern analysis
From Anritsu comes the MP2100A BERTWave measurement solution, an all-in-one instrument that performs simultaneous BER measurements and eye pattern analysis of active optical devices.
2010-11-09 Test equipment revenue grows in 2010
Test equipment semiconductors revenue is expected to reach $6.7 billion in 2010 fuelled by demand from telecom and consumer electronics testing according to Databeans.
2006-10-19 Teridian debuts industrial automation product line
Teridian Semiconductor has officially entered the industrial automation and control market with the introduction of 71M8100, a measurement controller designed for industrial applications.
2004-03-10 Teradyne to develop Ford instrumentation solutions
Ford Motor Co. has selected Teradyne Diagnostic Solutions Ltd, a subsidiary of Teradyne Inc., to develop its latest instrumentation product for Ford service facilities worldwide.
2012-12-28 Temperature sensing sol'n geared for LED MOCVD
LumaSense Technologies' UV 400 and UVR 400 pyrometers help manufacturers using MOCVD improve efficiency and reduce waste in their LED manufacturing process.
2004-12-21 Tektronix, IBM partner on new SiGe chips
A partnership that began in 1996 between Tektronix and IBM Corp. is just beginning to show results with a new generation of SiGe chips for high speed instruments from the test and measurement vendor.
2008-04-07 Tektronix waveform monitors now support 3Gbit/s SDI
Tektronix Inc. has upgraded its WFM and WVR series of waveform monitors and rasterizers including the addition of 3Gbit/s Single Link SDI support to the WFM7020 and WFM7120 waveform monitors.
2002-04-01 Tektronix upgrades optical test system with software toolkit
Tektronix Inc. has announced the OTS Toolkit software upgrade for its Optical Test System product family, and is aimed to support rapid design and production of optical network elements, while eliminating repetitive setup time and redundant test runs.
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