Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > Multitest

Multitest Search results

total search15 articles
2011-06-22 Multitest reports growing contactor shipments
Multitest has reported that its installed base of WLCSP contactors has been steadily growing and with the contactors now running high-volume at subcontractors in manufacturing hubs.
2012-07-12 Multitest platform tests partially stacked dies
Electrical test during device assembly optimizes production yield.
2012-08-13 Multitest introduces integrated 2D code reader
Semiconductor test equipment manufacturer now offers advanced code reader
2015-04-21 Multitest delivers first shaker for MT9928 chip tester
The MT9928 has a kitable and modular architecture and therefore can be converted to different package types and configured with loading and unloading options.
2013-09-10 LTX-Credence to acquire Multitest, ECT
LTX-Credence will acquire Dover Corporations two businesses for a purchase price of $93.5 million.
2011-04-11 ATS unveils multitest-in-one thermal analysis tool
ATS says its iQ-200 laboratory instrument measures and records temperature, velocity and pressure simultaneously.
2015-02-13 Test equipment effectively manages power dissipation
Multitest said the add-on to the standard MT2168 can be mounted and demounted effortlessly and is geared for test development and high volume production.
2014-05-27 Capacitor implants power up load boards
Multitest has placed single capacitors close to the device under test, and added the capacitance core between the power and the ground layerdecreasing loop inductance in the power delivery network.
2013-04-22 Access+ CUH cuts test floor maintenance time
Multitest's Access+ contact unit holder MT9510 has been developed for quick and easy access to the contactors, centring plate and adapter board.
2011-08-15 Test device operates at -55CC175C
Multitest has introduced a 16-site tri-temp pick-and-place handler that features a range of options for advanced ESD protection.
2011-05-10 Test device adds XTC features
Multitest has announced that their MT9510 pick-and-place handler now provides extended temperature control with its extended temperature calibration (XTC) feature.
2011-08-08 MEMS test integrates 3D magnetic field sensors
Multitest introduces the MT MEMS, a MEMS test and calibration equipment that can be used for mobile applications and navigation applications without the use of a GPS.
2011-04-26 Contactor surpasses 4.5 mio insertions
Multitest announced that its ECON contactor exceeded 4.5 mio insertions at an Asian test house.
2012-05-18 Bowl feed module improves temperature test for small devices
Multitest's bowl feed module for the MT9928 xm gravity test handler enables an alternative to the Turret handling solution for accurate temperature testing.
2014-11-10 Handler runs characterisation in hot, cold temperatures
The "cold for characterisation" option allows engineers to utilise the same platform for qualification and final test without the need to invest in more and expensive tri-temp test equipment.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

Back to Top