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2005-03-18 Wafer tester monitors RF chip quality in realtime
Keithley Instruments is now introducing a third-generation on-wafer RF measurement capability with some very promising features that address the conundrum
2010-09-08 Verigy installs SoC testers at KYEC
King Yuan Electronics Co. Ltd adopted Verigy test equipment for its RF SoC line
2009-02-11 RF chips find big market in medical apps
Radio frequency CMOS is being applied to a growing but fragmented set of medical applications ranging from imaging and DNA testing to networking in and around the body.
2007-12-07 One-box RF tester anticipates future tech developments
Featuring a frequency range up to 6GHz and an IF bandwidth of 40MHz/70MHz (analyzer/generator), the R&S CMW500 non-signalling tester has been designed to anticipate future technological developments.
2012-04-26 Enhancing production test of high-speed RF components
Know how to ease the testing of a VHF RF receiver in a production environment
2007-01-16 Microwave testers offer broadband capability
The innovations embedded in Agilent's microwave test accessories provide broadband capability and enhanced measurement accuracy.
2004-07-22 M/A-COM unveils PIN diodes for MRI circuits, testers
M/A-COM released a family of nonmagnetic, high-power PIN diodes suitable for use in Magnetic Resonance Imaging circuits and test equipment.
2007-08-09 Agilent testers support WiMAX Forum's Wave 2 system profiles
Agilent has enhanced its Vector Signal Analyzer, Signal Studio and Mobile WiMAX Test Set measurement solutions to facilitate testing of the WiMAX Forum's Wave 2 system profiles.
2007-12-13 Aeroflex beefs up A-GPS testers with OMA SUPL support
Aeroflex announced that its 6103 and 6401 A-GPS conformance test systems for location-based services now support for the Open Mobile Alliance Secure User Plane (OMA SUPL) 1.0.
2006-10-17 Tektronix adds new test capabilities to spectrum analyzers
Tektronix unveiled new software measurement capabilities for digital RF tests that support 3G mobile phone technology, HSUPA and Project 25 - Mobile Land Radio standard
2003-12-01 Challenges confront RFIC, WLAN testing
Two major challenges associated with testing WLAN devices are the broad-frequency spectrum of each channel and measuring error-vector magnitude.
2007-01-05 Vector signal generator addresses EVM price barrier
Priced at $11,500, precisionWave's p1511A RF vector signal generator compares favorably with instruments costing several times more
2014-03-13 Test sol'ns from Advantest target wireless mobile devices
The 32-port WLS32-A module and the 16-port WLS16-A module use vector signal generation and vector signal analysis software to meet the modulation issues presented by current advanced portable devices.
2004-02-02 SoCs challenge production test methods
The success of the SoC has driven down direct silicon costs as a component of system cost, it has accentuated the very factor engineers are struggling to control: test cost.
2005-05-02 Nomadic fiber-optics tester supplants multiple instruments
The T9080s from Anritsu are compact optical time-domain reflectometers that are designed for metro area FTTx access network testing.
2008-11-26 Mobile spectrum analyzers suit up for field work
Rohde & Schwarz is presenting two all-purpose instruments for mobile spectrum analysis: the R&S FSH4 and the R&S FSH8.
2006-12-13 Wideband op amp targets industrial equipment
New Japan Radio has announced a high-speed, high-voltage-resistant wideband op amp engineered for RF signal processing and high-speed pulse detection in IC testers, industrial equipment and measurement hardware.
2008-02-01 Parametric probe cards reduce cost of tests at 45nm
Cascade Microtech has launched two new Pyramid parametric probe cards that allow single-pass high performance DC and RF measurements and reduce the cost of parametric production test for advanced process nodes at 65nm, 45nm and beyond
2008-02-05 Parametric probe cards cut testing costs at 45nm, beyond
Cascade Microtech has introduced two new Pyramid parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors at 65nm, 45nm and beyond
2006-11-14 Keithley, Mesatronic team up for wafer probe solution
Keithley Instruments has partnered with Mesatronic to develop advanced probe cards for semiconductor parametric testers used in RF and low-current DC applications.
2004-04-16 Wireless manufacturers look to pare costs
A philosophy implemented by wireless manufacturers is to push a particular operation to the lowest possible level.
2008-07-01 WiMAX Wave 2 tests commence
Even as WiMAX technology begins riding its first wave of deployment, second-generation equipment design is entering the water. WiMAX developers are targeting what they call Wave 2 development, which aims to increase security and performance in fixed and mobile applications.
2008-12-16 WiMAX demands conformance
WiMAX, has become the poster child of the mobile Internet world but WiMAX devices, terminals and base stations require rigorous testing and conformance to tight specification standards, more so than those required for Wi-Fi.
2006-10-02 Validator matches DUT signals to simulations
Advantest Corp.'s Certimax design validation test system matches signals from a device under test to simulations.
2014-01-28 Trimming down automated test rack size
Many automated test stations are made up of racks of individual test instruments. In many cases, you can replace them with modular instruments.
2007-04-16 Test systems spell 3G LTE future
The test-and-measurement community must help ensure a smooth migration to LTE so that pitfalls associated with past rollouts of next-gen cellular networks can be avoided.
2011-06-08 Test solution validates at 5.8Gb/sec speed
Agilent Technologies announced a comprehensive Mobile Industry Processor Interface (MIPI) M-PHY test solution to help design engineers turn on, debug and validate all layers of mobile devices.
2004-09-09 Tektronix tools target next-gen video compression
Tektronix's new software-based analyzer gives users the ability to investigate compressed video data that's been encoded using various video standards.
2004-02-02 Open architecture ATE tackles test woes
The basic idea behind the open architecture test system is to provide such modularization with specific focus on the use of third-party modules and test instruments.
2010-05-31 Malaysia's Unisem sets sight on China market
Malaysia IC-packaging and test specialist Unisem plans to expand in China, develop an automotive expertise and look for acquisitions in the market.
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