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2008-02-18 New SMU, switches enhance PXI platform for DC apps
NI has announced its first PXI SMU and two PXI switches that enhance the PXI platform for use in precision DC applications, such as semiconductor parametric tests and electronic device and component validation.
2012-07-17 National Instruments extends SMU line
Geared for parallel testing of multipin semiconductor DUTs, the NI PXIe-4143 SMU offers 600,000 samples per second and four channels.
2014-08-01 Testing resistive memory devices
In this instalment, we will address issues related to characterisation and forming, as well as endurance testing for 1R ReRAM structures.
2006-12-01 Test sequencing reduces test time, cost
Slimmer profit margins are driving component manufacturers to reduce production costs, including the cost of testing. Instruments with embedded test sequencers can help.
2009-09-16 Source measurement handles up to nanoamp levels
The three-channel source measure unit can simultaneously provide power and perform measurements.
2013-11-05 Optimise wireless medical devices' battery life
The medical device industry is ripe for a new approach to analysing the energy requirements of battery powered medical devices.
1999-11-26 Designing telecommunication applications using digital signal processing functions with FPGAs
This paper describes the use of a DSP targeted to Actel's A32200DX FPGA (Field Programmable Gate Array). It also describes the techniques that can be applied to similar applications customizing and reuse of the VHDL cores.
2006-10-05 Agilent adds test option to accelerate yield ramp-up phase
Agilent announced a new parametric test option that claims to accelerate the yield ramp-up phase for IC makers.
2015-10-29 IDT sol'ns to streamline network synchronisation compliance
The 82P339xx-1 products are composed of IEEE 1588-compliant software and SMU chips that offer a complete telecom network synchronisation solution for IEEE 1588 and synchronous Ethernet.
2010-09-28 Wireless-in-the-Sky soon to take off
AP Avionx bagged production orders from Row 44 for server management units and modem data units for an in-flight broadband system that can provide wireless connectivity and other services to airline passengers.
2011-08-25 Upgraded PXI platform cuts test times, costs
NI has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit modules and source measure unit modules.
2013-04-01 Suite targets automated wafer-level parameter testing
Keithley has enhanced its Automated Characterisation Suite (ACS) software that enables automated wafer-level testing of high power semiconductor devices like power MOSFETs, IGBTs, BJTs and diodes.
2015-10-09 Simplifying battery charge/discharge cycling
Read about source measure unit instruments touted to offer simpler battery charge/discharge cycling, offering voltage and current sourcing and measurement ranges that are well suited for such application.
2005-04-08 Semiconductor analyzer packs integrated CV, IV capability
Agilent is introducing a Windows-based semiconductor device analyzer that integrates CV and IV measurements into a single instrument.
2003-10-03 SDK co-establishes carbon nano-fiber company
Showa Denko K.K. and a faculty member of Shinshu University, Prof. Morinobu Endo, have agreed to establish a joint venture for research of advanced carbon materials and their application to energy devices.
2008-03-04 R&S bulks up 3GPP LTE signal generator firmware
Channel coding and MIMO precoding for up to four transmit antennas have been added to Rohde & Schwarz signal generator firmware for 3GPP LTE (uplink and downlink).
2014-03-10 Perform electrical characterisation of biosensors
Proper testing of the electrical portions of these sensors is essential to support their development.
2015-08-12 Managing battery life of IoT wireless sensors
In this article, we explore advanced power management techniques to conserve battery life of IoT battery-powered devices.
2008-01-16 Keithley updates ACS test software
Keithley Instruments' updated Automated Characterization Suite V3.2 software enhances the powerful automation capabilities of ACS integrated test systems.
2011-06-22 Iwatsu to produce curve tracers for Cascade Microtech
Iwatsu Test Instruments Corp. will manufacture CT-3100/3200 Curve Tracers exclusively for Cascade Microtech to provide versatile wafer-level measurement for the growing power device market.
2007-09-19 Instruments advance chip test productivity
Keithley Instrumnets has expanded its product line for semiconductor characterization and production tests.
2012-08-28 How to optimize low-current and high-resistance measurements (Part 2)
Learn how to determine the offset current of a low-current measurement system, and understand the sources of measurement error in such systems.
2012-08-22 How to optimize low-current and high-resistance measurements (Part 1)
Here's a series that provides tips and tricks for optimizing low-current and high-resistance measurements.
2013-12-12 Grasp shielding, guarding in high impedance apps
Find out how ground loops and poor or nonexistent electrostatic shielding can cause error or noise currents to flow in the device under test.
2015-10-02 Google exec shares insights on IoT, wearables
Colt McAnlis, a developer advocate at Google, will be a keynote speaker at the forthcoming ARM TechCon where he promises to challenge our perceptions and offer his unique view of the world we live in.
2014-07-24 Fundamentals of resistive memory devices
In this article, we address the basics of resistive random access memory(ReRAM) structures, as well as the test hardware available to characterise them.
2013-09-27 Enable depth discernment in embedded vision apps
Explore the depth sensor technology alternatives available for building vision applications with the ability to sense objects in three dimensions.
2013-01-29 1/f noise measurement system supports 1Hz-10MHz
ProPlus Design Solutions' 9812D can measure low-frequency noise characteristics of on-wafer or packaged semiconductor devices such as MOSFETs, BJTs, JFETs, diodes and diffusion resistors.
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