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total search123 articles
2009-05-26 Using the PIC MCU CTMU for temperature measurement
The Charge Time Measurement Unit (CTMU) uses a constant current source to calculate both capacitance changes and the time difference between events. This application note describes the basic concepts of temperature measurement using the CTMU.
2009-09-16 Source measurement handles up to nanoamp levels
The three-channel source measure unit can simultaneously provide power and perform measurements
2003-04-04 Falcon ac power source targets tough noise
Falcon Electric Inc. has integrated several power blocks common to the company's UPS to create its SVR series.
2013-01-29 1/f noise measurement system supports 1Hz-10MHz
ProPlus Design Solutions' 9812D can measure low-frequency noise characteristics of on-wafer or packaged semiconductor devices such as MOSFETs, BJTs, JFETs, diodes and diffusion resistors.
2013-02-25 Memory test tip: Boost flash memory testing
Know how to tune your test system parameters to get the optimal results.
2011-08-25 Upgraded PXI platform cuts test times, costs
NI has expanded the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit modules and source measure unit modules.
2005-04-08 Semiconductor analyzer packs integrated CV, IV capability
Agilent is introducing a Windows-based semiconductor device analyzer that integrates CV and IV measurements into a single instrument.
2005-02-03 I/O box expands PC systems with plug-and-play USB
Measurement Computing Corp.'s new multi-I/O USB-1096HFS is a smashing example of the power of USB 2.0 on the bench and in the lab
2006-10-13 ADI claims 'first' quad-channel PMU
Analog Devices touts its new AD5522 as the industry's first parametric measurement unit (PMU) that combines four independent channels in a 12-by-12mm TQFP package, with each channel featuring on-chip sense resistors
2003-05-12 Tektronix execs see phased recovery for test industry
The test and measurement sector of the electronics industry will undergo a phased recovery that will depend on more than just an overall economic turnaround, according to executives at the annual Tektronix Analyst Day
2007-07-30 TDC boasts 25 million EPS throughput at full speed
Running at full speed, Agilent's TC890 TDC offers a 25 million events-per-second (EPS) data-throughput rate.
2013-01-17 SMM imaging of dopant structures of semiconductors
SMM can be engineered to measure differential capacitance by applying a low-frequency modulation signal to the MW measuring signal.
2015-10-09 Simplifying battery charge/discharge cycling
Read about source measure unit instruments touted to offer simpler battery charge/discharge cycling, offering voltage and current sourcing and measurement ranges that are well suited for such application.
2007-03-17 Pair Rogowski coils, rejustors to measure current
Rogowski coils perform passive current measurement and are used in test and measurement devices and power-monitoring activities. Calibration is required to account for manufacturing variations in the coil and to provide uniform device-to-device sensitivity
2005-02-17 High-speed relay modules are USB plug-and-play peripherals
Measurement Computing's USB-ERB modules rely on the Microsoft-defined HID class drivers that are part of Windows
2014-07-08 Explore pre-compliance testing for WLAN transmitters
Cost-effective and familiar test equipment can be used for in-house pre-compliance testing to uncover potential problems early on and reduce the risk of costly failure at the compliance test stage.
2004-06-16 Agilent offering evaluates all RF, microwave sources
Agilent's new instrument can evaluate the critical performance characteristics of nearly all types of RF and microwave signal sources.
2006-10-05 Agilent adds test option to accelerate yield ramp-up phase
Agilent announced a new parametric test option that claims to accelerate the yield ramp-up phase for IC makers.
2015-06-17 Fairchild brings 'smart' IMUs to MEMS market
The company describes the offering as a "smart" technology more sophisticated than SUMMiT, namely a six-axis inertial measurement unit (IMU) with nine-axis sensor fusion algorithms
2013-05-06 Transparent thin film metrology system for 28nm node
The latest member of the S3000 family uses focused beam ellipsometry and newly-designed small site measurement optics to measure the thickness of single layer and multi-layer films on product wafers
2014-08-20 Toshiba integrates two ARM core units in smart meter MCU
Aside from the cores, the MCU implements tamper detection, failure detection and key security functions, enabling independent control of the measurement and communication units on one chip
2014-07-04 Test platform supports high voltage, high-current devices
Advantest released its PVI8 floating power source that extends the capabilities of its V93000 test platform for high-voltage and high-current testing of embedded power devices
2014-11-26 Start-up eyes parallel CPU with 10x leap in performance
A start-up founded by two teenagers is designing a parallel processor that it hopes delivers a 10x leap in performance per watt for high-end systems. Rex Computing will make open source its instruction set architecture in hopes of rallying supporters around it
2014-05-14 Sensor chipsets mfg costs same across various vendors
ST, Bosch Sensortec and InvenSense are taking very different routes yet spending roughly the same amount to produce nine-axis inertial measurement units, according to System Plus Consulting
2008-07-01 NEC upgrades its CPU peripherals' capacity
Enhancing its lineup of CPU peripherals, NEC introduced three ASSPs, including USART, programmable timer/counter and parallel interface unit for standard applications such as computers, office equipment, communications equipment, test and measurement equipment etc
2016-05-18 Benefits of adding isolation to LVDS interfaces
Adding isolation to LVDS interfaces provides a transparent solution that can be inserted into existing signal chains for high-speed and precision measurement and control applications
2004-05-24 Anritsu device supports various comm standards
Japan-based test and measurement firm Anritsu has rolled out its latest offerings at the recently concluded Expo Comm Wireless 2004 held in Seoul, South Korea
2006-06-12 30V buffer amp target industrial, medical apps
National Semiconductor has introduced a high-speed, 30V buffer amplifier for industrial, medical, and test and measurement applications
2013-11-05 Optimise wireless medical devices' battery life
The medical device industry is ripe for a new approach to analysing the energy requirements of battery powered medical devices.
2015-06-30 What chips are inside Apple Watch?
The good news for the winners of the design slotsSTMicroelectronics, NXP, AMS, Dialog Semiconductoris that Yole reckons the wearable electronic equipment will grow steadily.
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