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2001-05-10 Performance analysis of line echo cancellation implementation using TMS320C6201
This application note summarizes the results of a performance analysis on the LMS (least mean square) filter-based line echo canceller (LEC) implementation using the TMS320C6201 DSP.
2008-10-16 Parallel tech simplifies system analysis, task execution
Mentor Graphics Corp. has launched a new task-oriented parallelism technology in the company's Olympus-SoC place-and-route system that provides timing analysis and optimization tasks to run in parallel.
2005-04-07 Oscilloscopes offer enhanced analysis
The SignalXplorer DL9000 series of digital oscilloscopes from Yokogawa combine high-performance waveform display and analysis functions with the most compact and lightweight design in their class. Featuring a maximum frequency bandwidth of 1.5GHz, maximum sampling rate of 10GS/s, and maximum memory length of 6.25MW, these 4-channel instruments feature a new enhanced waveform accumulation function which allows up to 450 million digitised points to be acquired and displayed every second
2015-03-31 Oscilloscopes integrate PAM-4 analysis option
A software option for Keysight's S-series, V-series and Z-series real-time oscilloscopes allows users to characterise pulse amplitude modulation with four amplitude levels (PAM-4) signals.
2003-02-03 Oscilloscopes for CDMA RF wireless signal analysis
Analysis and capture of the full band of ultra high-frequency RF signals with oscilloscopes is now possible due to the rapid performance advancements in real time oscilloscope technology.
2002-11-01 Oscilloscope simplifies vibration analysis
Sigma Design claims to have found a cost-effective tool, the digitizing oscilloscope with FFT, that enables to conduct preliminary vibration analysis in emerging designs.
2008-01-23 Oscilloscope function steps up system integrity analysis
Vitesse Semiconductor claims its high-speed IC-based oscilloscope function will significantly change the economics of signal integrity analysis and network reliability.
2001-04-26 Oscillator noise analysis in SpectreRF
This application note explains phase noise, tells how it occurs and shows how to calculate phase noise using SpectreRF.
2006-10-19 Optimal announces enhancements to SiP analysis suite
Optimal is announcing chip/package/PCB co-design support in the form of enhancements to its Optimal SiP Analysis Suite.
2010-08-12 Optical spectrum analyzer expedites analysis
EXFO's FTB-5240S test module was designed for DWDM network commissioning and high-speed network upgrades up to 40G.
2013-02-05 Optical fibre touts panoramic spectrograph, sensor analysis
The FBPI broadband optical fibre from Polymicro FBPI boasts a low-OH pure silica core that demonstrates significantly reduced content of UV defects and other UV absorption centres.
2010-05-21 Opinion: Custom IC design needs variation analysis
Incorporating optimal sampling and design-specific corner methods into variation-aware custom IC design can avoid costly over-margining or under-designing, and avoid delaying project schedules.
2007-01-24 NXP sets up Asia's 'first' die-level failure analysis center
Beefing up its Asian operations, NXP Semiconductors will put up Asia's first and its second die-level failure analysis center in Taiwan.
2013-11-26 Novel processor architecture offers speedy big data analysis
Micron's Automata Processor (AP) architecture's design is based on an adaptation of memory array architecture, exploiting the inherent bit-parallelism of traditional SDRAM.
2004-11-30 Nomadic tester makes short work of statistical analysis on Ethernet networks
Agilent's new nomadic performance analyzer lets users readily run pre-defined performance test suites.
2001-04-17 Noise histogram analysis
This application note is intended to show how histogram analysis is used to quantify static performance of high-resolution A/D converters.
1999-12-14 Noise analysis of FET transimpedance amplifiers
The availability of detailed noise spectral density characteristics for the OPA111 amplifier allows an accurate noise error analysis in a variety of different circuit configurations. The fact that the spectral characteristics are guaranteed maximums that allow absolute noise errors to be truly bounded. Other FET amplifiers normally use simpler specifications of rms noise in a given bandwidth (typically 10Hz to 10kHz) and peak-to-peak noise (typically specified in the band 0.1Hz to 10Hz). These specifications do not contain enough information to allow accurate analysis of noise behavior in any but the simplest of circuit configurations. This application note discusses in detail how the OPA111 is utilized to perform noise error analysis in different circuit configurations.
2001-05-31 Noise analysis in MMICAD
This application note describes MMICAD's ability to analyze complex models incorporating internal noise that are created using a variety of special built-in noise elements, which can be used in networks.
2002-03-16 Noise analysis catches hidden timing flaws
This technical paper discusses how with shrinking process technologies, designers must cope with escalating crosstalk noise effects that impact high-speed SoCs prior to manufacturing.
2010-12-02 NIST shows thermogravimetric analysis for nanotube purity
A thermogravimetric analysis technique that places a microbalance atop a quartz crystal enables measurement of microsamples of carbon-nanotubes and coated-nanoparticles.
2014-10-08 Nikon Metrology delivers software for advanced BGA analysis
The new BGA tool provides powerful image processing, fully automated analysis and detailed reporting to inspect complex packages such as Package on Package (PoP) or dual-layered boards.
2011-05-09 Next-gen virtual machine tech ideal for live app analysis
Atego has rolled out the Aonix Perc Ultra 6, its latest version of embedded virtual machine technology that features Java 6 language compatibility and a graphical console for live application analysis.
2007-03-16 New tools solve CDC-analysis troubles
CDCs have become a leading cause of design errors. Errors may even find their way into silicon, necessitating respins.
1999-11-18 New techniques for complex modulation analysis
This application note examines the wireless applications of a new acquisition and display technology ? the digital phosphor oscilloscope.
2006-12-05 New microscope enables atomic-scale wafer analysis
FEI will unveil a family of transmission electron microscopes (TEM) that it says will enable atomic-scale imaging and analysis of semiconductor wafers.
2004-03-04 Nassda simulator gets analysis tools
Nassda Corp. has announced a complete nanometer analysis platform with the release of HSIM v5.0.
2004-05-11 Nassda adds hierarchical timing analysis
Nassda is preparing Hanex v5.0, an upgrade of its static and dynamic circuit simulator.
2007-06-05 Multifunctional tester simplifies signal analysis
Anritsu's MS269X series communications test unit streamlines signal analysis for GSM, GPRS, EDGE, WiMAX and HSPA, increases measurement speed and combines multiple test features in one module.
2010-08-09 Multicore software analysis tool supports OCTEON / OCTEON II
CriticalBlue's Prism software enables Software Developers to immediately analyze the benefits of migrating their software to Cavium's Multicore (OCTEON and OCTEON II) Processors.
2008-09-02 Multi-interface WiMAX R1 protocol analysis with Tektronix G35 and WaveJudge 4800
Verifying the correct function of the air-interface is a key issue in any type of base station testing. In the case of Mobile WiMAX, test engineers must not only be able to analyze the PHY and MAC layers of the R1 interface, but also all MAC Management messages specified in IEEE 802.16e, that is, the control-plane messages exchanged between the mobile station and the base station.
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