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2001-09-12 DC mode magnetic force microscopy using a Burleigh AFM
This application note describes the modification of the Burleigh METRIS-2000 AFM (Atomic Force Microscope) so that magnetic materials could be examined for magnetization using a magnetically active tip.
2002-03-25 Applications of force volume imaging with the NanoScope atomic force microscope
This application note discusses how force volume imaging can be used to investigate material, adhesive, electrical, magnetic and chemical properties of samples by recording an array of force curves over an entire area
2005-07-28 Veeco, JNCASR launch nanoscience center in Bangalore
Veeco Instruments Inc., supplier of instrumentation to the nanoscience community, has established a nanotechnology center in Bangalore, India. The facility will be staffed with local scientists and engineers and equipped with Veeco's latest atomic force microscope (AFM), scanning tunneling microscope (STM) products and other advanced nanotechnology application modules.
2012-03-13 Using FE-SEM in MEMS analysis
Learn about the Agilent 8500 compact FE-SEM, a low voltage, field emission SEM which employs an electrostatic lens design.
2001-09-12 Using an oscilloscope to optimize AFM images
This application note discusses the use of an oscilloscope to provide a reliable method for obtaining optimal images with the Burleigh AFM (Atomic Force Microscope).
2001-09-12 Use of the AFM to study spin-polarized photo-emission sources
This application note describes the use of the Burleigh ARIS-3500 AFM (Atomic Force Microscope) to examine photoemission sources.
2001-09-12 Surface characterization of semiconductor materials by AFM
This application note presents a comparison of roughness measurements by AFM (Atomic Force Microscope) and SEM (Scanning Electron Microscope) of silicon substrates bombarded and analyzed during SIMS (Secondary Ion Mass Spectrometry) experiments.
2016-04-11 Probing ReRAMs: Forming scaling, quantised conductance
Learn about the new ReRAM challenges as an IMEC team have formed and characterised the electrical conductance and topology of some of the smallest ReRAM filaments ever reported.
2013-01-29 Low voltage scanning electron microscopy films
Here are examples where Agilent 8500 FE-SEM provides high resolution images of sensitive organic and biological samples.
2015-02-10 Extending Moore's Law with 1.5nm metrology tool
Argonne National Laboratory teamed up with aBeam and LBNL to develop what they say is the finest metrology tool in the world, at 1.5nm to target advanced semiconductor nodes.
2015-08-28 EUV reaches angstrom resolution
The angstrom-level resolution of a new type of microscope uses femtosecond pulses of extreme ultraviolet light (EUV), the same wavelength light to be used for sub-10nm semiconductor lithography
2001-09-12 Nanomechanical measurements on polymers using contact mode AFM
This application note describes the use of AFM (Atomic Force Microscopy) coupled with force curve analysis in helping to characterize the nanomechanical properties of polymer surface
2001-09-12 Aluminum channel profile analysis and conducting polymer surface characterization
This application note discusses AFM (Atomic Force Microscopy) as a powerful high-resolution imaging technique for examining microstructures on aluminum substrate and conductive gratings in conducting polymer films
2001-09-12 AFM: A complimentary technique for SEM investigation
This application note explains the advantages of using AFM (Atomic Force Microscopy) over SEM (Scanning Electron Microscopy) in preventing surface contamination during routine imaging
2001-09-12 AFM study of thermally etched alumina ceramics
This application note demonstrates the powerful capability of Atomic Force Microscopy to examine microstructures and growth phenomena on ceramic surfaces
2003-06-10 Veeco acquires NanoDevices probe business
Veeco Instruments Inc. has purchased the atomic force microscope probe business of NanoDevices Inc.
2004-09-03 KLA-Tencor, SIINT to bring surface metrology solution
KLA-Tencor Corp. and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments, have formed a partnership to distribute SIINT's Nanopics 2100 high-speed, high-resolution atomic force profilometer to markets outside of Japan
2014-07-01 2D graphene nanosheets developed using Scotch-tape method
A team of researchers looked into the physics, kinetics and energetics behind the regarded "Scotch-tape" technique using molybdenum disulphide (MoS2) atomic layers as a model material
2011-07-21 TCNL fabs ferroelectric nanostructures on plastic
Georgia Tech researchers have developed a way to fabricate nanometer-scale ferroelectric structures directly on substrates.
2011-03-17 Researchers use carbon nanotubes to scale PCM
Non-volatile memory bits can be made by applying phase-change material to previously created nanometer-scale gaps in carbon nanotube filamentary conductors, according to a paper.
2007-04-02 Researchers pitch nanowires as litho replacement
HP Lab and a trio of academic labs have scored advances that will make it easier to use nanowires as a replacement for lithography in semiconductor manufacturing, potentially taking chipmaking to the angstrom scale.
2009-02-23 Researchers craft nanoscale one-stop shop platform
University of Pittsburgh researchers have created a nanoscale one-stop shop, a single platform for creating electronics at a nearly single-atom scale that could yield advanced forms of technologically important devices such as high-density memory devices, transistors and computer processors.
2016-03-16 Probing ReRAMs: 3D filaments, brain-like functions
Here's a look at a research on ReRAMs based only on the sub-oxides of silicon to make the case for the suitability of their devices for use as emulators of brain-like neural functions.
2011-04-11 PCM progress report no. 2: Review of PCM-related activities in early 2011
In this report, the author explores the PCM-related activities over the first quarter of 2011.
2006-05-01 Nanotransistors ripe for CMOS
IBM's T.J. Watson Research Center has crafted an experimental IC that uses a single-molecule nanotube as the common transistor channel for five CMOS-like inverters wired as a ring oscillator.
2003-04-23 Nanostructures eyed to identify biomolecules
Two research groups are collaborating on an attempt to find a general solution to the problem of identifying biomolecules.
2003-12-15 Nanofabrication achieved on a biological substrate
Dip-pen nanolithography, a process being developed for ultrasmall feature definition on semiconductor ICs, may blaze new trails in medicine as well, if preliminary work reported at the fall meeting of the Materials Research Society can be turned into practical procedures.
2014-07-17 Nano-pixels to bring flexible, high-res displays
Oxford University scientists found that phase change materials could lead to low-energy, flexible displays for applications such as 'smart' glasses, synthetic retinas and foldable screens.
2008-07-10 Memristors ready for 2009 debut
The fourth passive circuit in electronic circuit theory, memristor, has moved a step closer to prototyping with the harnessing of a substrate material that could yield a new memory device by 2009.
2014-08-05 Is there a bright optoelectronic future for PCM?
Here's a look at a venture modestly described as an optoelectronic framework. It has the potential to spawn whole new families of optoelectronic phase-change-based switching displays and modulators.
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