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2008-04-21 Worldwide semi equipment spending to drop 20% in '08
Gartner Inc. is forecasting a total of $47.5 billion in worldwide semiconductor capital equipment spending in 2008, reflecting a 19.8 percent decline from 2007 due to the weakening of the U.S. economy and the DRAM market
2002-08-16 Test systems move to the desktop
This technical article introduces a low-cost, efficient desktop test system aimed to replace traditional, expensive automated testing systems
2004-06-17 SiS buys low-cost production test solutions from Agilent
Silicon Integrated Systems Corp. (SiS) has purchased manufacturing test solutions from Agilent Technologies Inc. for its PCI Express devices
2002-05-07 Simplify manufacturing by using automatic test equipment for on-board programming
This application note provides design information and benchmark data to help ATE vendors integrate Flash memory programming into their manufacturing test procedure
2006-10-02 Revolutionize automated test equipments
This article features a multipurpose wafer-sort and final-test solution designed to address the economic requirements of the MCU, wireless baseband, display driver and low-cost consumer mixed-signal devices
2007-09-03 Perform hassle-free test for safety-critical apps
Safety-critical products can now be manufacturing-tested using ICT or MDA with full accuracy at high speed, directly followed by a functional testall of which can be done on one test system
2002-10-16 Passing the SoC test with flying colors
The key concern of product developers, SoC design houses and wafer fabs is to provide higher performance and functionalities of SoC at the lowest cost.
2001-04-15 New thinking needed amid runaway test costs
There is a need to achieve test-cost reductions that rival the reductions in wafer fabrication costs to ensure continued growth of semiconductor markets. ATE should not wait for someone else to do it
2008-08-13 Low cost, large multisite test capacity sets apart Credence's HDVI instrument
Automated test equipment (ATE) solution provider Credence Systems Corp. introduces the latest addition to instruments line for the Diamond test platform.
2002-07-24 Intel, Advantest back open test platform
Advantest Corp. is spearheading an effort to create an industrywide platform for IC test that addresses the often rocky relationship between chip suppliers and ATE providers
2007-07-13 IC equipment spending to increase this year, Gartner says
Gartner forecasts that worldwide IC equipment spending will amount to $43.1 billion in 2007, a 2.7 percent increase from 2006
2004-04-14 Global semiconductor equipment sales experienced 10% hike
The worldwide semiconductor manufacturing equipment sales totaled $22.8 billion in 2003, a 10.3 percent increase from 2002 sales, according to Gartner Inc
2005-10-07 Gartner: Semi equipment capex to fall 12 percent in 2005
Despite strong demand in some consumer electronics segments, global semiconductor capital equipment spending is expected to fall 11.6 percent in 2005, according to market research firm Gartner Inc
2011-06-20 Gartner eyes 10.2% growth in semi equipment spending
Gartner raised its 2011 growth forecast for global semiconductor capital equipment spending to 10.2 percent, citing aggressive foundry spending and IDM logic capacity ramping up at the leading edge
2006-04-24 Gartner boosts '06 capital equipment forecast
Gartner raised its overall IC capital equipment forecast for 2006 to $38.8 billion, a 14.3 percent increase from 2005
2002-07-18 Credence SoC tester cuts time-to-volume, test costs
Credence Systems Corp. has introduced the Octet SoC test platform that is designed to decrease time-to-volume and test costs, while delivering high configurability
2007-10-22 Consortium drafts IC test interface extension standard
The Semiconductor Test Consortium Inc. has published the first draft of terminology specifications for the Semiconductor Test Interface eXtensions (STIX) initiative
2002-05-14 Cadence allies with Credence to link design, test
Looking to forge a closer link between chip design and manufacturing test, Cadence Design Systems Inc. and Credence Systems Corp. have formed an alliance to better integrate the companies' software
2014-01-28 Trimming down automated test rack size
Many automated test stations are made up of racks of individual test instruments. In many cases, you can replace them with modular instruments
2012-02-28 Test suite supports WLAN 802.11ac measurement
The PXI 3000 series test system from Aeroflex performs parametric measurements for manufacturing
2011-06-08 Test solution validates at 5.8Gb/sec speed
Agilent Technologies announced a comprehensive Mobile Industry Processor Interface (MIPI) M-PHY test solution to help design engineers turn on, debug and validate all layers of mobile devices
2006-03-10 Test software enhances large data-set signal acquisition/analysis
Test and measurement software from National Instruments and Agilent Technologies make data-set signal acquisition and analysis easier
2002-11-05 Telco purchases Motorola test equipment business
Motorola Inc. has entered into an agreement to sell the equipment repair and manufacturing assets of its Motorola Manufacturing Solutions test equipment business to Telco Inc
2010-09-14 SoC test platform integrates customizable modular solutions
Advantest integrates OptimalTest's solutions in semiconductor test equipment
2005-12-09 Shielded RF test chambers are manual or automatic
Designed for making more reliable noise-free RF tests on modules and devices with radio interfaces, test equipment maker Rohde and Schwarz is offering a number of shielded RF test chambers
2006-04-28 RF switches suit automated test platforms
National Instruments announced its PXI and SCXI RF multiplexing switch modules that route signals ranging from DC to 5GHz for communications test applications
2014-06-25 RF conformance test system targets C2C applications
The R&S test system makes it possible to verify compliance with regional standards such as ETSI EN 302 571 in the EU, IEEE 802.11-2012 in the United States, or the ARIB standard in Japan
2010-09-20 Pre-packaged test content accelerates IPv6 testing
Mu Dynamics and the University of New Hampshire InterOperability Lab, have just announced the availability of pre-packaged IPv6 test content for use by network equipment manufacturers, Tier-1 global service providers and government agencies
2012-12-17 Perform automated communications measurement
Here are two examples of how to automate the entire measurement process in MATLAB.
2004-10-18 Miniature module adapts IEEE-488 test gear for USB
ICS' 488-USB USB-to-GPIB controller module should prove cost-effective and useful in extending the life of test equipment that might otherwise be deemed obsolete
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