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2008-07-14 Wireless test systems integrate wider signal capabilities
LitePoint Corp. has launched three new systemsthe IQnxnplus, IQultra and IQnay for testing four wireless standards.
2010-01-28 Vector signal analyzer, generator improve test times
The NI PXIe-5663E 6.6 GHz vector signal analyzer and the NI PXIe-5673E 6.6 GHz vector signal generator improve automated test times for a wide range of devices
2014-01-28 Trimming down automated test rack size
Many automated test stations are made up of racks of individual test instruments. In many cases, you can replace them with modular instruments.
2008-06-02 TestStand 4.1 with multicore support ups test throughput
National Instruments' latest version of the TestStand test management software 1 helps engineers develop faster test systems with multicore processor support
2011-09-01 Test, debug solution for SFP+ cuts test time
The TEKEXP SFP-TX option for DPO/DSA/MSO70000 Series oscilloscopes simplifies measurements for SFF-8431 SFP+ testing.
2002-08-16 Test systems move to the desktop
This technical article introduces a low-cost, efficient desktop test system aimed to replace traditional, expensive automated testing systems.
2003-05-16 Test system simulates and validates ECMs
VI Engineering provided the services for a major automotive supplier that wanted them to specify and develop a test system for simulation and design validation of the company's ECMs
2012-02-28 Test suite supports WLAN 802.11ac measurement
The PXI 3000 series test system from Aeroflex performs parametric measurements for manufacturing
2009-11-20 Test solution meets HDMI 1.4 compliance
The increased complexity that enables the enhancements of HDMI 1.4 calls for stricter compliance and interoperability tests.
2011-06-09 Test solution automates 3D IC deployment
Imec and Cadence has released a test solution that automates 3D stacked ICs deployment
2011-08-01 Test kit for Android enables enhanced user experience
Wind River's Android test development kit validates device user experience by reproducing human interactions to test user interfaces
2010-08-03 Test framework speeds Android app development
Wind River announces the Framework for Automated Software Testing (FAST) for Android, an automated software testing solution for Android-based devices
2002-04-01 Tektronix upgrades optical test system with software toolkit
Tektronix Inc. has announced the OTS Toolkit software upgrade for its Optical Test System product family, and is aimed to support rapid design and production of optical network elements, while eliminating repetitive setup time and redundant test runs
2008-02-21 Tektronix releases test suite for SATA Gen-2 PHY
Tektronix has released the TekExpress compliance test automation framework and TekExpress SATA automated compliance test software.
2005-05-31 TDK launches UWB test system for device evaluation, measurement
TDK Corp. has disclosed the availability of a total solution integrated UWB evaluation and measurement system. Sales of the new system will start in both Japan and the U.S. in June 2005.
2015-06-25 Software development: Automated vs manual testing
Should we manually test applications or automate this process? Companies can get into a real dilemma trying to answer this question, but is there really a rivalry between these two testing techniques
2004-06-17 SiS buys low-cost production test solutions from Agilent
Silicon Integrated Systems Corp. (SiS) has purchased manufacturing test solutions from Agilent Technologies Inc. for its PCI Express devices
2002-05-07 Simplify manufacturing by using automatic test equipment for on-board programming
This application note provides design information and benchmark data to help ATE vendors integrate Flash memory programming into their manufacturing test procedure
2004-02-02 Serial storage SoCs demanding to test
The storage industry this year began widespread implementation of serial-based technologies to replace parallel physical-interface standards currently used to connect a system bus to disk storage devices.
2006-04-28 RF switches suit automated test platforms
National Instruments announced its PXI and SCXI RF multiplexing switch modules that route signals ranging from DC to 5GHz for communications test applications
2014-06-25 RF conformance test system targets C2C applications
The R&S test system makes it possible to verify compliance with regional standards such as ETSI EN 302 571 in the EU, IEEE 802.11-2012 in the United States, or the ARIB standard in Japan
2006-10-02 Revolutionize automated test equipments
This article features a multipurpose wafer-sort and final-test solution designed to address the economic requirements of the MCU, wireless baseband, display driver and low-cost consumer mixed-signal devices
2005-08-11 Programmable supply taps Ethernet for automated test
Elgar Electronics' Sorensen DLM600 series of 1U, half-rack (8.5 inches wide) ac-dc power supplies is now available with Ethernet/LAN connectivity
2005-08-05 Programmable supply taps Ethernet for automated test
Elgar Electronics' Sorensen DLM600 series of 1U, half-rack ac-dc power supplies is now available with Ethernet/LAN connectivity
2010-09-20 Pre-packaged test content accelerates IPv6 testing
Mu Dynamics and the University of New Hampshire InterOperability Lab, have just announced the availability of pre-packaged IPv6 test content for use by network equipment manufacturers, Tier-1 global service providers and government agencies
2007-09-03 Perform hassle-free test for safety-critical apps
Safety-critical products can now be manufacturing-tested using ICT or MDA with full accuracy at high speed, directly followed by a functional testall of which can be done on one test system
2002-10-16 Passing the SoC test with flying colors
The key concern of product developers, SoC design houses and wafer fabs is to provide higher performance and functionalities of SoC at the lowest cost.
2005-09-26 NI's new switch modules address RF, microwave test applications
National Instruments disclosed that engineers can now use its four new 26.5GHz PXI switch modules with the latest version of its Switch Executive switch management software for PXI-based RF and microwave test applications
2005-09-19 NI eases development for data-logging, functional test apps
NI announced that engineers can now use its PXI-2527, which is a 300V, 32-channel multiplexer, along with the new DMM/Switch Express VI to ease development for data-logging and high-channel-count functional test applications
2001-04-15 New thinking needed amid runaway test costs
There is a need to achieve test-cost reductions that rival the reductions in wafer fabrication costs to ensure continued growth of semiconductor markets. ATE should not wait for someone else to do it
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