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2007-01-26 Silicon Image picks Agilent's tool for HDMI test
Silicon Image Inc. has adopted Agilent Technologies Inc.'s equipment for HDMI CTS 1.3a source and sink compliance testing and characterization in its HDMI Authorized Test Center
2005-12-09 Shielded RF test chambers are manual or automatic
Designed for making more reliable noise-free RF tests on modules and devices with radio interfaces, test equipment maker Rohde and Schwarz is offering a number of shielded RF test chambers
2002-12-02 See the future of broadband voice network test
Though useful as a baseline, Telcordia's GR-909 mechanized loop test needs to be modified for the demands of broadband networks
2014-12-15 Realigning test strategies for Internet of Things
The IoT brings with it the possibility of building much larger-scale systems, but it also raises a number of issues for effective validation and verification. Read more about these in this article.
2014-04-30 R&S tanks up network analyser with 24 test ports
The R&S ZNBT allows characterisation with multiple test ports in the 9kHz to 8.5GHz frequency range. It can determine all 576 S-parameters of a 24-port DUT, and carry out multi-port measurements faster than switch matrix-based multi-port systems
2015-10-06 PXIe vector transceiver speeds up test time
Keysight said the VXT PXIe vector transceiver is aimed at rapid solution creation and faster throughput in manufacturing test of wireless components and IoT devices
2012-12-17 Perform automated communications measurement
Here are two examples of how to automate the entire measurement process in MATLAB.
2010-11-01 OpenADR test, certification program kicks off
The Open ADR Alliance has been established to create a test and certification program for energy demand-response systems
2007-02-16 NI: The future of test is virtual
For National Instruments, virtual instrumentation and graphical system design are the answer as these two "empower local talent and allow engineers to add their domain expertise to the economy and their organization."
2010-11-04 Mentor Graphics, ARM team up for memory test
Mentor's Tessent memory test and repair solution now supports ARM's memory BIST bus and interface that provides external access to all memories contained within the processor core
2004-10-08 Mentor automates test tools, adds guru to staff
Mentor Graphics Corp. has added new automated functionality to its FastScan automatic test pattern generation tool (ATPG) and its TestKompress embedded deterministic test tool.
2003-07-16 Meeting ISO requirements for complex electronic test equipment
The article explores approaches balancing cost and engineering investment to achieve metrologically correct ISO 17025 calibration and meet the needs of the equipment end-user.
2015-06-17 Machine vision for automated LCD display testing
Read about a machine vision-based tool using a camera and Vision Option software from National Instruments for detecting dead pixels on LCD displays.
2004-08-04 LitePoint rolls out new WLAN test instrument
LitePoint announced shipment of its new IQflex 802.11a/b/g WLAN manufacturing test solution
2005-09-01 Leaky chips test designers' skills
To achieve longer battery life in portable products, the entire IC design chain must chip in and tackle leakage.
2007-12-21 LAN OTDR offers five-wavelength test capability
JDSU has released a short-range LAN (SRL) OTDR for the T-BERD/MTS-6000 and T-BERD/MTS-8000 optical test platforms, providing a unique testing combination of up to five wavelengths in both multimode and single-mode
2008-01-16 Keithley updates ACS test software
Keithley Instruments' updated Automated Characterization Suite V3.2 software enhances the powerful automation capabilities of ACS integrated test systems.
2003-07-03 ISPL acquires semiconductor test and assembly firm
Infiniti Solutions Pte Ltd (ISPL), a Singapore-based provider of semiconductor test and assembly services, has acquired Automated Technology Inc. (ATEC).
1999-11-01 Integrating handling for test, inspection, marking and packing
Deploying individual handling systems for testing, inspection, marking and packing leads to inefficiency, under-utilization of IC test equipment, and can even cause bottlenecks that can slow down related back-end processes. Not only do multi-function automated systems circumvent these problems, they also improve throughput and occupy far less floor space.
2008-04-01 Innovative flying probe test, soldering solution debut
Seica has announced its new Pilot V8 flying probe test system and the Firefly selective soldering solution, which will be exhibited at this week's IPC Printed Circuits Expo, Apex and the Designers Summit
2014-10-21 In-circuit test automation: Replacing the human touch
Which is better when it comes to automating in-circuit test: a robotic pick and place arm, or an inline system? This article tackles the pros and cons of these two popular deployment options
2013-03-18 How to test HDMI and MHL interfaces
Here's a set up for testing video transmitted by HDMI and mobile high-definition links for applications in cellular networks.
2010-05-28 How to run BSP unit test on Windows CE using i.MX platforms
This application note describes the setup process to use the CETK; describes how to use the Windows Embedded CE 6.0 Test Kit (CETK) with the tests provided by Microsoft; and describes how to use the custom test provided by Freescale, followed by an example of a custom test for the i.MX31 PDK platform
2015-07-20 HIL simulation for hybrid powertrain test
In this article, we explore how development of motor ECUs can be accelerated substantially through the application of hardware-in-the-loop methods.
2001-09-01 Functional test in a high-density PCB environment
In-circuit testing has a major problem, access, so functional test is important again. The paper outlines some of the design considerations and strategies to implement functional tests
2015-10-27 Fully-automated PHY test sol'n aimed at mobile storage apps
The M-PHY TX automated solutions from Tektronix promise to provide support for 100 per cent of tests as per M-PHY 3.1 and CTS 3.1 using the TekExpress 4.0 framework
2014-02-28 Ford launches self-driving test vehicle
Ford has teamed up with universities and institutions in developing sensors and driver assistance systems for its automated driving platform
2014-03-19 Employing automated frequency response analyser
Here's a new method of doing stability analysis testing by using basic lab equipment, while not requiring any specific instruments.
2014-12-15 Designing test tools to accommodate denser memories
Testing vendors should keep ahead in offering tools aimed at existing memory specifications and emerging denser memories technologies with automation as customers look to quickly verify products.
2005-10-20 Design-for-test analyzer validates boundary-scan
A product called DFT Analyzer from ASSET InterTech promises to reduce manufacturing and test costs when it debuts early next year
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