Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > automated test

automated test Search results

?
?
total search646 articles
2007-10-16 The challenges and potential of GPIB
GPIB continues to serve as a reliable I/O interface for a vast number of instruments that are still in use. GPIB also provides a convenient way to manage complex hardware handshaking.
2003-03-11 Teradyne tests Amlogic DVD device
Teradyne Inc. has been selected by Amlogic Inc. to test the latter's latest next-generation DVD decoder
2003-03-11 Teradyne tests Amlogic DVD device
Teradyne Inc. has been selected by Amlogic Inc. to test the latter's latest next-generation DVD decoder
2006-06-02 Techniques for measuring RF gain using the MAX2016
This application note discusses how to implement the MAX2016 RF detector into an automated test system for gain measurements in heterodyne transceiver applications.
2007-06-15 Systems enable fast, easy semiconductor characterization
Keithley Instruments Inc. announces the availability of the Automated Characterization Suite (ACS) integrated test systems for semiconductor characterization at the device, wafer and cassette level.
2008-08-07 Software speeds up field testing for Motorola radios
Aeroflex has launched the new Auto-Test II Motorola Test and Alignment support for the Motorola XTS-5000 radios. It is available for all 3900 Series products widely used in the field such as 3901, 3902 and the current 3920 Series
2016-02-01 Software promises more efficient IoT/M2M device verification
Anritsu's MX887032A/MV887032A software supports 802.11p RF tests for the 700MHz and 5.9GHz bands designed into car roadside and vehicle-to-vehicle wireless communications systems.
2002-02-14 Shenzhen Optoscape CATV tester exhibits 0.4dB accuracy
The Optical Power Meter CATV tester features an accuracy within 0.4dB and a measurement range of -26dBm to 26dBm, enabling it to measure high power levels in AM CATV networks and fiber amplifiers.
2004-01-01 Revisit the global supply-chain evolution
The tumultuous downturn has offered automated test equipment (ATE) vendors to fine-tune this supply chain business management model to meet new challenges.
2006-09-16 Reducing the cost of cellphone testing
As phones increase in complexity, requiring more tests, manufacturers must find strategies that will keep rising test costs down
2002-01-21 Racal GPIB switching system handles four switch cards
The 1255A GPIB switching system can install and mix up to four C-sized VXIbus 1260-series switch plug-in, providing switching capabilities for low-level RF/microwave and optical signals in a single system.
2011-01-10 R&S signal generator now with electronic step attenuator
R&S SMB100A expands range up to 12.75GHz for blocking tests. R&S SMB B112 option enables the R&S SMB100A with a wear-free electronic step attenuator.
2011-05-10 PXI digitizers boast industry's highest bandwidth
NI has announced the release of what they claim as the industry's highest bandwidth PXI digitizer, complementing the rapidly expanding suite of performance instrumentation available in PXI.
2006-08-28 Power analyzer delivers needed accuracy, range
The new power analyzer from XiTRON Technologies Inc. provides both accuracy and range, attributes needed to ensure compliance with Energy Star or standby power testing.
2007-08-29 Optical switch links up to 16 ports in ATE systems
The Yokogawa AQ2200-412 is a 1 x 16 low insertion loss optical switch for use in ATE systems.
2007-07-26 NI unrolls low-cost 6.5-digit multimeter for PXI
National Instruments expands its low-cost digital multimeter offering with the NI PXI-4065, a new 6.5-digit multimeter for PXI.
2011-07-04 NI touts industry's 'first' high-throughput frame grabber
National Instruments' PXI frame grabber boasts throughput as high as 850MB/s and 512MB of DDR2 onboard acquisition memory.
2004-12-14 NI PXI switch module suits data-logging apps
NI announced that automated test engineers can now use the PXI platform to create high-density data-logging and channel-scanning apps.
2008-01-14 NI intros USB-controlled RMS RF power meter
NI has announced the company's first USB-controlled true RMS RF power meter, which promises a highly flexible solution for automated test, measurement and monitoring applications in a small footprint.
2011-11-02 NI expands PXI switching solutions
The new devices offer additional simultaneous connections and new differential measurement capabilities for high-channel-count switching applications.
2008-02-12 NI buys virtual instrumentation solutions provider
NI has acquired all of the outstanding shares of microLEX Systems A/S, a provider of virtual instrumentation-based video, audio and mixed-signal test solutions
2006-12-18 NI adds low-cost DMMs for PCI, PCIe to portfolio
NI has added to its line of digital multimeters (DMMs) new low-cost 6.5-digit DMMs for PCIe and PCI.
2008-09-04 New wave of ATE consolidation emerges
Teradyne has signed an agreement to buyout fellow IC automated test equipment vendor Eagle Test Systems for approximately $250 million in cash.
2003-08-20 Mikros Systems obtains contract from U.S. Navy
Mikros Systems Corp. has received a Phase II SBIR contract from the U.S. Navy's Dahlgren Division for the continued development of the MFDAT.
2008-09-17 LTX-Credence streamlines operations
LTX-Credence Corp. plans to layoff an undisclosed number of employees and close redundant facilities as part of its integration plan following the August merger of the former ATE rivals, according to a regulatory filing.
2005-02-07 LeCroy suite complies to SATA 1.0a, SATA testing
LeCroy announced what it claims as the first automated test suite that meets the requirements of both SATA 1.0a and SATA II Serial ATA transmitter compliance testing.
2004-11-02 LCD storage scopes are low cost performers
Protek offers two versions of its dual-channel digital scopes - Model 6810CN and Model 6810MN.
2004-12-06 Interconnect system provides high density for high-speed signals
W. L. Gore & Associates introduced its new cable-to-board and cable-to-cable coaxial interconnect system.
2006-08-04 Infineon joins semicon testing consortium
Infineon Technologies AG has joined Semiconductor Test Consortium Inc. (STC), the leading proponent of worldwide adoption of the Open Semiconductor Test Architecture standard
2004-05-04 I-Tech storage tester conform to industry standards
I-Tech is rolling out its 4010 SANmark Test Suite, the second and final test suite in the company's 4000 Series of testers
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top