Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > automated test

automated test Search results

total search646 articles
2005-03-04 Seica platform addresses electronic testing problems
Seica said its new platform is based on a unique software and hardware architecture which includes cutting-edge technology to implement the multiple test strategies needed to address the challenges of electronic testing
2004-07-06 Sanmina-SCI, Agilent develop new x-ray technique for PCBAs
Agilent Technologies Inc. and Sanmina-SCI Corp. have revealed a new technique for rapidly generating high-resolution, sub-surface 3D scans of complex multilayer backplane and printed circuit board assemblies (PCBAs).
2004-06-21 Samsung adopts Tektronix video measurement set
Samsung Electronics has chosen Tektronix Inc.'s VM5000 automated video measurement set for measuring HDTV and progressive component video signals
2007-07-03 RF generator accommodates larger waveforms
Keithley Instruments adds a series of enhancements to its Model 2910 RF vector signal generator, including additional wireless signal generation waveforms and a new power calibration feature.
2013-07-18 QSFP+ solution enables data rates of 4x10Gb/s
Tektronix new QSFP+ solution includes all the necessary components to design, test and validate QSFP+ designs including HCB fixtures and test automation and debug software tools
2005-03-08 Protocol analyzer slated for ASI
Supporting design verification for the forthcoming ASI high-speed data plane standard, Agilent is debuting a Windows-based protocol-test approach for the switched-fabric interconnect
2003-02-27 Prodrive selects Agilent manufacturing, inspection solution
Prodrive B.V. has purchased a complete manufacturing and inspection solution from Agilent Technologies Inc.
2006-12-18 Oscilloscope-based compliance tester rolls for DDR2
Test-and-measurement equipment supplier Agilent Technologies is debuting what it says is the industry's first oscilloscope-based DDR2 compliance test application
2013-10-03 Online quoting service drastically cuts MPW quote time
eSilicon's automated, instant, online quoting service for MPW Shuttle Services takes only around 15 minutes, a vast improvement from the usual process that takes 40 hours
2005-11-24 New optical power meter instrument offers 100,000-readings/s
The new optical power meter instrument from dBm Optics provides both speed and repeatability when measuring fiber optic systems.
2014-04-22 Mining big data sees increasing value across businesses
Companies are placing a premium on big data, seeking to harness it and boost overall business processes. This creates an urgency to narrow, if not close the gap between data and usable information with intelligent data analysis.
2014-07-09 Minimising embedded software development costs
There are various effective test strategies for cutting development costs. Deciding what tests to employ is a bit of an art-form best guided by experience, but here are some tips on what's important
2003-05-06 Microchip buys Nextest systems for EEPROM testing
Microchip Technology Inc. has purchased Maverick II test systems from Nextest Systems Corp. for production testing of serial EEPROM devices used in automobiles and a myriad of consumer products
2015-04-20 Managing measurement data with openMDM
In this article, we will explore openMDM, a software platform which enables the user to manage measurement data for long-term and systematic usability.
2008-08-22 JTAG boosts boundary-scan offering with latest release
JTAG Technologies continues to solidify its presence in the boundary-scan sector with the latest release of its flagship development tool, JTAG ProVision.
2003-09-05 Ixia toolset enables conformance testing
Ixia has announced the availability of a suite of Ipsec test tools, which it claims to be the industry's first comprehensive test suite for conformance and performance validation of secure Ipsec networks
2010-11-05 IP reduces embedded memory transient errors
Synopsys announced the availability of the DesignWare Self-Test and Repair Error Correcting Codes IP as a part of its DesignWare STAR Memory System product family. This new IP offers a highly automated design implementation and test diagnostic flow which assists SoC designers to rapidly reduce the number of embedded memory transient errors.
2002-10-04 inTEST acquires semiconductor ATE company
inTEST Corp. has acquired Intelogic Technologies GmbH.
2013-01-24 Imec, Cadence team up for DFT solution for 3D memory
Cadence's and imec's solution includes generation of DRAM test control signals in the logic die and inclusion of the DRAM boundary scan registers test access mechanisms of the 3D test architecture
2005-09-21 ICI unveils latest back-end capabilities
IC Interconnect (ICI) has revealed that its wafer test, laser marking, die singulation, and tape and reel capabilities are now available as standard service offerings
2013-09-10 Hitex upgrades TESSY tool to support Melexis' MCUs
TESSY uses the gcc-based compiler from Melexis to compile and link the test application that tool automatically generates
2011-06-29 HAVEit project demos series maturity
Demonstrations of highly automated driving systems have proven the maturity of several building blocks, strengthening the possibility of series production in the next five to ten years
2009-08-25 Handheld analyzers simplify wireless field tests
The introduction of Anritsu's 'E' platform for handheld analyzers redefines wireless field test
2002-03-06 Fairchild Suzhou plant breaks ground
Fairchild Semiconductor Int. has started constructing an 800,000-square-foot IC assembly and test plant in Suzhou, China
2003-10-02 Fairchild commences operations at China facility
Fairchild Semiconductor has launched the first phase of its 800,000-square-foot assembly and test facility and automated warehouse in Suzhou, China.
2012-07-19 Exploring innovations in hardware debug
Searching few new ways to inject quality into a design is where the focus should be in hardware development, not in improving debug tools and techniques.
2012-05-14 Employ .NET methods to add functionalities to IVI-COM drivers
Know how to add functionality to existing IVI-COM drivers through the extension and inheritance methods.
2015-01-30 EMC tester accommodates individual probes, IC pins
According to Langer EMV-Technik, two of the special features of the ICT1 include automatic pin recognition and the highly-precise positioning (10um) of the measurement systems.
2008-05-09 Dual-channel sampling oscilloscope delivers 12GHz
Pico Technology has released the PicoScope 9201 dual-channel PC sampling oscilloscope with a bandwidth of 12GHz.
2013-08-05 Designing a MOST infotainment system
The solid methodology used to build a MOST based infotainment system is close to the development process of enterprise Web services.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

Back to Top