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2011-10-07 Corelis launches advanced JTAG sol'n for Teradyne testers
Corelis has launched the USB-1149.1/CFM, an advanced JTAG solution that offers seamless integration of advanced boundary-scan test patterns into Teradyne testers
2007-07-23 Commentary: Imagination turns to reality in verification
It is vital for design and verification teams to work together so that each team member can benefit from this new field that combines verification innovation and automated management
2007-06-01 Check interconnections between FPGAs on a high-density board
This article describes a simple, effective and generic solution to check signal connectivity between FPGAs on a high density prototyping board with multiple FPGAs and hundreds of signals.
2003-05-28 Catalyst hot-swap interface complies with PCI-X
Catalyst Enterprises has announced the availability of its 64-bit PCIBX64 and 32-bit PCIBX32 multifunction Hot-Swap test systems
2003-06-24 Cascade, Microvue release Wavevue modules
Cascade Microtech and Microvue have announced two measurement modules for Wavevue Measurement Studio Software, which enable complete on-wafer characterization.
2007-09-03 Bring Zigbee designs to high volume
Devices without the cost or power budgets to support wireless connectivity now can leverage proven Zigbee technology for new innovation possibilities.
2008-01-02 Automate EMC measurement
This article shortly describes how to establish an automation EMI test system, emphasize the problems during the test and the solution and how to configure the system and parameters correctly
2007-05-16 Analyze source code for Net app flaws
Automated source code analyzers are good at locating anomalies. They can also be used with little or no impact on build times and are easily integrated with the regular software development environment
2004-09-07 AMD selects InSite apps for production operations
Advanced Micro Devices Inc. (AMD) has revealed that it is replacing its existing Manufacturing Execution System (MES) with Camstar Systems Inc.'s InSite application suite for test, assembly and packaging operations at its five manufacturing facilities in Singapore, Penang and Kuala Lumpur in Malaysia, Suzhou, China and Bangkok, Thailand
2002-01-31 Agilent releases solder-paste inspection system
Intended for solder-paste inspection of PCB assemblies, the SP50 automated optical inspection system produces accurate measurements of pad offset and skew, solder-paste area, height and volume
2013-01-04 Agilent opens repair, calibration lab in Vietnam
The facility will offer local services that claim to incorporate the same automated procedures used at service centres and mobile calibration labs around the world
2007-08-17 Agilent debuts DisplayPort compliance tester
Agilent has introduced what it claims to be the industry's first DisplayPort source compliance tester that fully implements the tests identified in the DisplayPort PHY compliance test specification
2006-11-21 Aeroflex unveils EvDO Rev. A signalling conformance solution
Aeroflex has announced a comprehensive EvDO Rev. A signaling conformance solution following the delivery of a fully automated C.S0038-A-compliant suite of test cases for its 6402 CDMA AIME network emulator.
2008-06-20 Aeroflex tips 3GHz RF generator
Aeroflex has rolled the 3020C PXI modular digital RF signal generator, a 3GHz variant to the growing PXI signal generator line.
2003-12-08 Aeroflex enters licensing pact with NavLabs
Aeroflex Inc. has signed an exclusive technology license and master distribution agreement with NavLabs for the development and sale of GPS test equipment
2011-08-23 Advantages of digital calibration
Learn about the benefits of digital calibration and the common calibration circuits by application.
2003-11-26 ADIC, Benchmark expand outsourcing agreement
Advanced Digital Information Corp. announced that it has finalized its agreement with Benchmark Electronics Inc. to expand an existing outsource manufacturing relationship to include a significant portion of ADIC's entry-level line.
2015-02-06 3D AOI system touts multi-reflection suppression tech
The SQ3000 3D automated optical inspection system from CyberOptics inhibits reflections that could result in measurement inaccuracies, which is especially important for inspecting shiny objects
2000-05-01 20128, 12094, 15694
Current templating approach has its limitations in classifying relevant defects. A knowledge-based reasoning method fills many information-processing holes in testing board assembly components.
2002-02-26 Photronics recticle manufacturing software cuts lead time
The CyberMask software suite facilitates a seamless interface among semiconductor manufacturers, allowing them to receive and prepare IC design data for recticle manufacturing.
2010-01-21 Low-cost oscilloscopes deliver up to 2GSps rate
LeCroy has beefed up its low-end WaveAce oscilloscope series to include four-channel and 40MHz models for simple and efficient debug.
2003-01-29 IFR spectrum analyzer tests microwave links
The company's 2395 26.5GHz spectrum analyzer is targeted for apps such as microwave point-to-point radio links.
2007-02-01 Agilent intros solder paste inspection system
Agilent has introduced a new solder paste inspection system that enables manufacturers of PCB assemblies to slash inspection time in half, without compromising capability.
2007-12-07 Software aids in DisplayPort compliance testing
Tektronix offers an early adopter software that fully implements and automates the tests identified in the DisplayPort physical layer source compliance test specification
2005-02-23 NI unveils two more digital waveform generators
NI said that automated test engineers can now use its new 400Mbps and 200Mbps digital waveform generator/analyzers to interface to LVDS devices using the PXI platform.
2003-12-18 NI launches Pentium 4, Celeron PXI controllers
National Instruments has announced the PXI-8180 series of Pentium 4 and Celeron-based embedded PXI/CompactPCI controllers that ease system integration while meeting the reliability requirements of real-time and automated test applications.
2004-09-13 NI embedded controllers increase productivity
NI disclosed that its three new Pentium III-based embedded controllers will enable engineers to increase productivity and speed execution time in their automated test apps.
2005-05-12 Low-cost solution for high-channel-count switching systems
National Instruments disclosed that its new USB switch mainframes, which introduce plug-and-play switch control to the SCXI platform, will enable automated test engineers to significantly reduce switch system hardware setup time.
2005-03-15 In-system programming board targets Atmel MCUs
Data I/O now has an in-system programming system for use in automated test systems, as well as during production runs.
2007-01-18 Fanout buffers suit telecom, networking apps
Used to create multiple copies of clocks at full system frequencies, ON Semi's new clock fanout buffers are suitable for use in telecommunications, networking and automated test equipment.
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