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2011-11-02 NI expands PXI switching solutions
The new devices offer additional simultaneous connections and new differential measurement capabilities for high-channel-count switching applications.
2013-11-04 IXYS releases 450A high-power laser diode driver
The PCX-7500 claims to provide precision pulsed current with accurate microprocessor-based digital power control.
2012-05-14 Employ .NET methods to add functionalities to IVI-COM drivers
Know how to add functionality to existing IVI-COM drivers through the extension and inheritance methods.
2003-12-08 Aeroflex enters licensing pact with NavLabs
Aeroflex Inc. has signed an exclusive technology license and master distribution agreement with NavLabs for the development and sale of GPS test equipment.
2003-08-04 Aeroflex acquires wireless test solutions provider
Aeroflex Inc. has acquired the Racal Wireless Solutions Group.
2011-08-23 Advantages of digital calibration
Learn about the benefits of digital calibration and the common calibration circuits by application.
2015-03-06 Touchdowns are for football, not semiconductors
Executive David Park ponders the threat of expensive product recalls to semiconductor and device manufacturers, as they try to balance high product yield levels and good product quality.
2011-09-01 Test, debug solution for SFP+ cuts test time
The TEKEXP SFP-TX option for DPO/DSA/MSO70000 Series oscilloscopes simplifies measurements for SFF-8431 SFP+ testing
2011-06-09 Test solution automates 3D IC deployment
Imec and Cadence has released a test solution that automates 3D stacked ICs deployment.
2010-08-03 Test framework speeds Android app development
Wind River announces the Framework for Automated Software Testing (FAST) for Android, an automated software testing solution for Android-based devices.
2002-04-01 Tektronix upgrades optical test system with software toolkit
Tektronix Inc. has announced the OTS Toolkit software upgrade for its Optical Test System product family, and is aimed to support rapid design and production of optical network elements, while eliminating repetitive setup time and redundant test runs.
2007-06-15 Systems enable fast, easy semiconductor characterization
Keithley Instruments Inc. announces the availability of the Automated Characterization Suite (ACS) integrated test systems for semiconductor characterization at the device, wafer and cassette level
2012-10-31 Solve random tests' failure to identify regression
Random tests have one downsidethey cannot identify regressions, but there are ways to address this issue.
2004-06-21 Samsung adopts Tektronix video measurement set
Samsung Electronics has chosen Tektronix Inc.'s VM5000 automated video measurement set for measuring HDTV and progressive component video signals
2006-08-28 Power analyzer delivers needed accuracy, range
The new power analyzer from XiTRON Technologies Inc. provides both accuracy and range, attributes needed to ensure compliance with Energy Star or standby power testing
2012-05-15 Platform tests A/V interface functionality, compliance
Rohde & Schwarz's VTC platform tests the A/V interfaces of smart phones, tablets and STBs, including HDMI and MHL, providing realtime protocol and media content analysis.
2007-08-07 Parade picks Agilent tester for DisplayPort designs
Agilent announced that its Agilent J-BERT N4903A was picked by Parade Technologies for DisplayPort testing
2010-11-01 OpenADR test, certification program kicks off
The Open ADR Alliance has been established to create a test and certification program for energy demand-response systems.
2001-04-15 New thinking needed amid runaway test costs
There is a need to achieve test-cost reductions that rival the reductions in wafer fabrication costs to ensure continued growth of semiconductor markets. ATE should not wait for someone else to do it.
2011-01-26 Module offers flexibility for ATE design
The 24-bit high-resolution dynamic signal acquisition module PCI-9527 features two 24-bit simultaneous sampling analog input channels with a sampling rate up to 432 Ksps.
2014-07-09 Minimising embedded software development costs
There are various effective test strategies for cutting development costs. Deciding what tests to employ is a bit of an art-form best guided by experience, but here are some tips on what's important.
2002-07-31 IFR spectrum analyzer operates up to 13GHz range
IFR Systems Inc. has announced the availability of the 2394 13GHz spectrum analyzer targeted for use in mobile handset production and basestation transmitter testing
2012-09-17 How to overcome the triage challenge
Find out how an innovative approach solves the triage challenge, thus accelerating the bug fixing process by 30%.
2015-11-06 How to keep users of consumer electronics happy
Growing investment in research and development by some aftermarket services (AMS) companies means that screening and testing returned products is getting better and faster
2013-09-10 Hitex upgrades TESSY tool to support Melexis' MCUs
TESSY uses the gcc-based compiler from Melexis to compile and link the test application that tool automatically generates.
2015-12-23 Guard bands minimise MOSFET failures in space (Part 1)
Learn how guard band gives us confidence that that the device and its associated circuitry in the aerospace module will function properly.
2015-07-01 Growing ATE market to approach $4.48B in 2020
Grand View Research forecasted that increased demand for consumer electronics will fuel the market, as well as the rising design complexity due to adoption of SoC.
2012-01-17 Economic uncertainty provides GSD adoption opportunities
In Southeast Asia, we expect the machine makers to adopt rapid prototyping platforms based on graphical systems design (GSD) to differentiate their capabilities from their competitors.
2007-08-03 Debugger detects hardware problems 'on the floor'
Wind River has released its On-Chip Debugging for Manufacturing and Test, a standards-based offering that allows engineers to diagnose hardware problems on the manufacturing floor.
2008-02-11 Compliance test software supports new serial data standards
LeCroy said it has enhanced its QualiPHY automated serial data compliance test framework, which now supports standards for UWB, serial ATA and PCIe Gen 1
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