Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > automatic test equipment

automatic test equipment Search results

?
?
total search199 articles
2000-06-28 Using serial vector format files to program XC9500 devices in-system on automatic test equipment and third party tools
This application note describes how to program XC9500 devices in-system, using standard serial vector format (SVF) stimulus files.
1999-11-03 Using serial vector format files to program XC9500 devices in-system on automatic test equipment and third party tools
This application note describes the steps required to generate an SVF (Serial Vector Format) file, and how to use this file to program and test a device
2004-03-17 Teradyne blasts U.S. export controls on test gear to China
IC test supplier Teradyne Inc. blasted new U.S export controls for China despite an effort to relax the rules on exports of automatic test equipment to China.
2002-05-07 Simplify manufacturing by using automatic test equipment for on-board programming
This application note provides design information and benchmark data to help ATE vendors integrate Flash memory programming into their manufacturing test procedure
2014-08-22 PXI test systems bring time-to-market, test cost advantages
The PXI market is expected to rake in $1.75 billion revenues by 2020, driven by an uptake in RF wireless communications where firms turn to PXI-based platforms to reduce costs and time to market.
2005-07-26 Powerful final-test memory system debuts
Agilent Technologies now has a new final-test memory tester targeting MCPs and discrete flash. Dubbed the Versatest Series Model V5500, this ATE system offers a tester-per-site architecture
2006-11-29 OptimalTest promises better yields through test management
OptimalTest has launched what it touts as the optimal test software suite for maximizing IC yields through managed test results
2008-10-30 New IC test group consolidates ATE standards
Advantest, Amkor, Infineon, Intel, LTX-Credence, Qualcomm, Roos Instruments, Teradyne, and Verigy have collaborated under a new group to foster precompetitive partnership and standards in automatic test equipment.
2011-04-11 Gartner: Semiconductor equipment market up nearly 150% in 2010
Gartner Inc. report shows strong growth in sales of semiconductor equipment after global slump
2012-04-26 Enhancing production test of high-speed RF components
Know how to ease the testing of a VHF RF receiver in a production environment.
2012-02-10 Developing automatic test systems for extended duty
Know the challenges that are faced by maintenance organizations and automatic test systems providers who sustain the weapons systems programs. Also, learn how to address such concerns
2007-12-17 DAC targets industrial process control, test equipment
TI says its 16bit, single-channel, buffered voltage-output DAC is an attractive option for industrial process control, automatic test equipment, DAQ systems and communications applications.
2011-04-11 Conducting at-speed test at RTL (Part 1
Learn how to facilitate at-speed test at the register transfer level
2011-12-02 ATML standard eases test equipment data exchange
An XML-based standard for ATE and test information data exchange, known as Automatic Test Markup Language, has emerged with widespread support among test and measurement industry leaders and major government programs alike
2006-11-07 Agilent completes separation of automatic test equipment spinoff
Agilent Technologies has completed the separation of Verigy, distributing all of its 50 million shares on Verigy.
2007-03-19 Aeroflex opens test applications group in China
Aeroflex announced the opening of its Test Applications Group in Shanghai, China, a programming and fixturing facility that supports ATE systems
2006-03-10 Test software enhances large data-set signal acquisition/analysis
Test and measurement software from National Instruments and Agilent Technologies make data-set signal acquisition and analysis easier
2005-12-09 Shielded RF test chambers are manual or automatic
Designed for making more reliable noise-free RF tests on modules and devices with radio interfaces, test equipment maker Rohde and Schwarz is offering a number of shielded RF test chambers
2014-06-25 RF conformance test system targets C2C applications
The R&S test system makes it possible to verify compliance with regional standards such as ETSI EN 302 571 in the EU, IEEE 802.11-2012 in the United States, or the ARIB standard in Japan
2007-02-06 Network analyzer cuts cost, test complexity
As a highly integrated solution, Agilent's PNA-X microwave network analyzer reduces test costs, setup time, measurement complexity and the time it takes to make measurements on the broadest range of components
2004-11-02 JTAG test adjunct to focus on Gbps nets
ASSET InterTech will soon be offering the capability to test 1Gbps to 10Gbps serial buses on PCBs
2002-05-14 Cadence allies with Credence to link design, test
Looking to forge a closer link between chip design and manufacturing test, Cadence Design Systems Inc. and Credence Systems Corp. have formed an alliance to better integrate the companies' software
2004-02-02 Toolset eyes process test-chip design
Silicon Canvas released a platform for process test-chip development that is designed to help foundries create test chips to verify, optimize and calibrate silicon processes
2008-08-29 Test companies live up to the WiMAX challenge
In an effort to put complete WiMAX analysis in the hands of RF designers, test and measurement companies continue to develop software upgrades, spectrum analyzers, test sets and network analyzers to comply with the rapid build out of these wireless networks
2004-11-03 Software promises realtime test, product quality, performance insight
SigmaQuest is rolling out a new product that provides actionable information that can help ensure product intergrity and process integrity.
2004-04-05 Quantum integrates HDMI technology to video test systems
Quantum Data has announced the integration of high-definition multimedia interface (HDMI) certified technology into its line of video test generators
2014-11-26 Modular platforms enable wiring of RF test equipment, DUTs
The modular R&S OSP gives test engineers in production facilities, test labs and R&D departments options for quickly setting up RF wiring configurations and controlling them manually or via a computer
2002-04-10 HiTek switching supplies handle motor-driven equipment
HiTek Power's HT9827 series of universal input switching supplies can power thermal printers, medical devices, ATM machines, wireless radio amplifiers, computer peripherals, telecom, test and other equipment with high-output current-pulse requirements
2003-09-26 EGLS announces new automatic probing technology
Test handling solutions provider Electroglas (EGLS) showcased its EG5300 NETprober and Sidewinder equipment at the Semicon Taiwan for the first time
2002-04-05 45th Institute of MII focuses on research of 8-inch semicon equipment
The 45th Institute of MII has revealed plans to embark on the R&D of 8-inch semiconductor equipment in 2002, to meet the increasing demand from domestic and foreign IC manufacturers in mainland China
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top