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2001-09-12 DC mode magnetic force microscopy using a Burleigh AFM
This application note describes the modification of the Burleigh METRIS-2000 AFM (Atomic Force Microscope) so that magnetic materials could be examined for magnetization using a magnetically active tip.
2001-09-12 Using an oscilloscope to optimize AFM images
This application note discusses the use of an oscilloscope to provide a reliable method for obtaining optimal images with the Burleigh AFM (Atomic Force Microscope).
2001-09-12 Use of the AFM to study spin-polarized photo-emission sources
This application note describes the use of the Burleigh ARIS-3500 AFM (Atomic Force Microscope) to examine photoemission sources.
2001-09-12 Surface study of oxidized niobium(110)
This application note outlines a surface study of oxidized niobium based on the results of Ultra-High Vacuum (UHV) Scanning Tunneling Microscopes (STMs).
2001-09-12 Surface characterization of semiconductor materials by AFM
This application note presents a comparison of roughness measurements by AFM (Atomic Force Microscope) and SEM (Scanning Electron Microscope) of silicon substrates bombarded and analyzed during SIMS (Secondary Ion Mass Spectrometry) experiments.
2001-09-12 Supplemental laboratory exercise for the ISTM: Calibration using the atomic lattice of graphite
This application note describes the use of the atomic lattice of graphite as a convenient standard for measuring and calibrating the STM (Scanning Tunneling Microscope) XY scanner.
2001-09-12 Nanomechanical measurements on polymers using contact mode AFM
This application note describes the use of AFM (Atomic Force Microscopy) coupled with force curve analysis in helping to characterize the nanomechanical properties of polymer surface.
2001-09-12 Aluminum channel profile analysis and conducting polymer surface characterization
This application note discusses AFM (Atomic Force Microscopy) as a powerful high-resolution imaging technique for examining microstructures on aluminum substrate and conductive gratings in conducting polymer films.
2001-09-12 AFM: A complimentary technique for SEM investigation
This application note explains the advantages of using AFM (Atomic Force Microscopy) over SEM (Scanning Electron Microscopy) in preventing surface contamination during routine imaging.
2001-09-12 AFM study of thermally etched alumina ceramics
This application note demonstrates the powerful capability of Atomic Force Microscopy to examine microstructures and growth phenomena on ceramic surfaces.
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