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2012-05-29 JEDEC releases LED thermal testing standards
The JESD51-5x series is in compliance with the International Commission on Illumination's existing LED measurement recommendations.
2010-05-14 Verification platform suits algorithm design, LSI testing
Xilinx K.K. and Hitachi Information & Communication Engineering Ltd have released the LogicBench system-level design verification platform that uses Xilinx Virtex-6 LX760 FPGA
2012-12-21 Testing EPC for precise LTE/4G billing structures
Through a full EPC evaluation using test tools for all mobile network elements from layer 2-7, service providers can meet the high demands of LTE while simultaneously making profits.
2011-10-14 Reduce yield fallout by avoiding over and under at-speed testing
Here's a look at the problems associated with SoC at-speed testing such as overtesting and under-testing. This article also provides suggestions on how to overcome them
2008-09-29 Power supply ready for high-speed testing of mobiles
Keithley introduces the Model 2308, a dual-channel battery- and charger-simulating power supply designed to support low-cost testing of portable products
2014-12-17 Packaging and testing industry trends from 2013 to 2014
In 2014, the output value of OSAT industry is seen to grow by 8.4 per cent and the advanced packaging industry is expected to increase by 10 per cent.
2000-11-01 LDO noise testing depends on filters
Telecommunications, networking, audio and instrumentation require low-noise power supplies. In particular, there is an interest in low-noise, low-dropout linear regulators (LDOs).
2016-03-24 Explore model-based testing for production hardware
Here is a look at Time Partition Testing, a model-based testing technique, which is based on hybrid, hierarchical, parallel running automatons with continuous behaviour
2006-12-20 eInfochips verification component supports Mentor's Questa
A component that provides building blocks for efficient design-under-test in module and system-level verification for Mentor Graphics' Questa Vanguard program, including assertion testing, is now available from eInfochips Inc.
2008-12-11 Component test solution: move over obsolete curve tracers
Keithley Instruments Inc. announces ACS Basic Edition, a characterization and curve tracer software for component test applications. ACS Basic Edition, pared with SourceMeter instruments, replaces obsolete curve tracers with a solution that performs both basic curve tracing and parametric test
2008-07-15 Component arrays ease design, manufacturing
Novacap has introduced the Cap-Rack series of component arrays that integrate a custom selection of individual ceramic components into a single surface-mount package
2014-11-12 Determine acceptable jitter level in embedded design
Learn about the nuances of clock jitter specifications, and know how to determine the acceptable level of jitter early on in the development cycle to prevent dire impact on end product release schedules
2014-06-05 Agilent, Cascade simplify wafer-level RFIC testing
The alliance aims to combine Cascade's probe stations with Agilent's measurement and analysis software to provide tools that deliver differentiated RF wafer-level measurements
2014-07-09 Minimising embedded software development costs
There are various effective test strategies for cutting development costs. Deciding what tests to employ is a bit of an art-form best guided by experience, but here are some tips on what's important.
2007-04-02 Five filter tips for better RF design
As products get rushed into the market and put to the test, shortcomings in frequency management crop up through noise, crosstalk, signal dropouts and even complete transmission interruption. Sam Benzacar summarizes five RF design tips to avoid frequency-management problems.
2015-02-18 Understand product failures through bathtub curves
The likelihood of a component failing to properly function over time can be described by the bathtub curve. Read this article to learn more about this concept
2015-03-23 The development of JTAG/boundary-scan standards
Learn about the fruits of labour of the JTAG or Joint Test Action Group committee, and how these altered the test landscape dramatically.
2010-09-21 Rigid-corner BLS design improves PCB durability, ease of use
Laird Technologies says rigid corner improves coplanarity and toughness and makes inspection easier.
2007-08-30 Process makes leaded devices Pb-free
A study presented a process by which leaded devices are converted to Pb-free for use in consumer-grade electronics.
2012-05-15 Platform tests A/V interface functionality, compliance
Rohde & Schwarz's VTC platform tests the A/V interfaces of smart phones, tablets and STBs, including HDMI and MHL, providing realtime protocol and media content analysis.
2008-05-01 Partition and package to miniaturize handsets
Designers are turning to system-in-package, 3D IC stacking and wafer-level packaging to enable the acute miniaturization found in handsets, particularly for RF functions
2012-08-30 Overcoming challenges for SoC verification team
Know the unique problems that SoC verification engineers face and the approach that provides them a level of automation similar to that enjoyed by block-level verification teams
2005-03-14 In Hindsight, SW debug can run backward
Claiming a huge leap forward for embedded-software debugging, Virtutech's new debugger can run programs backward in time.
2014-12-01 Examining ISO 26262 from a developer's viewpoint
Here's an overview of the standard from system designer and implementer's viewpoint. It is based on QNX Software System's recent experience certifying its operating system to ISO 26262.
2013-04-02 Boost RF harmonic measurements with PXI digitizer
Learn about the measurement challenges involved in measuring low-level harmonics and look into a practical example test set-up
2010-12-21 Automotive-qualified 40V to 100V MOSFETs
IR expands its 40V to 100V automotive qualified MOSFETs, delivering RDS(on) across a range of voltages from as low as 8m at 55V. Meanwhile, logic level devices simplify gate drive requirements
2013-09-19 Adopting aerospace verification standards (Part 1)
Here's a two-part series on other embedded sectors' adoption of the avionics industry’s comprehensive certification and verification process.
2008-02-26 8bit PCI digitizer adds DAQ options
Agilent Technologies Inc. has introduced two new options for its compact, low-power (less than 15W), high-speed Acqiris 8bit PCI digitizer.
2010-08-03 Automotive MOSFETs feature low on-state resistance
International Rectifier announces the expansion of its family of automotive-qualified power MOSFETs for applications requiring low on-state resistance (RDS(on)), including on-board power supplies and heavy loads on ICE/micro/full hybrid platforms.
2004-04-16 Wireless manufacturers look to pare costs
A philosophy implemented by wireless manufacturers is to push a particular operation to the lowest possible level
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