Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > confocal reflectance microscopy

confocal reflectance microscopy Search results

?
?
total search1 articles
2002-11-27 Innovative optical imaging method seen to lower IC test costs
A group of physicists led by Dr. Caesar A. Saloma of the National Institute of Physics at the University of the Philippines have developed an inexpensive optical imaging technique to detect IC defects.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top