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| 2013-12-20 | CyberOptics expands WaferSense line with 450nm devices WaferSense products are wireless, wafer-shaped, real-time measurement devices that travel through fabrication tools similar to actual wafers. |
| 2007-02-01 | WaferSense ATS helps eliminate wafer scrap CyberOptics claim its WaferSense ATS employs machine vision to see inside semiconductor equipment and to help avoid costly wafer mishandling, a significant cause of wafer scrap in highly automated semiconductor manufacturing plants. |
| 2004-11-10 | Wafer processing device provides quick, accurate leveling CyberOptics announced a wireless, wafer-like device that enables quick and accurate leveling of semiconductor wafer processing and automation equipment. |
| 2015-02-06 | 3D AOI system touts multi-reflection suppression tech The SQ3000 3D automated optical inspection system from CyberOptics inhibits reflections that could result in measurement inaccuracies, which is especially important for inspecting shiny objects. |
| 2011-08-11 | Modular AOI tech touted as industry's first CyberOptics' AOI and SPI systems deliver high-speed, flexible inspection of solder and lead defects, presence and position, correct parts and polarity down to 01005 components. |
| 2011-09-07 | AOI tabletop system inspects at 100cm2/sec CyberOptics Corp. is displaying a prototype version of the QX100 AOI Tabletop System alongside its latest inspection technologies. |
| 2009-01-09 | Tough '09 awaits fab-tool, materials sector Based on the early returns, the fab-tool and electronic materials markets are off to a rough start in 2009. And don't expect the market to improve, prompting the possible acceleration of a shake-out in the sector. |
| 2010-11-04 | Test coverage analysis tool features yield estimation ASTER's TestWay Express now allows estimates for new product yields |
| 2016-04-15 | Oven-like 3D scanning system boasts of one-button simplicity Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important. |
| 2011-04-06 | ASTER rolls DfT, test coverage analysis tool ASTER Technologies releases the first tool to provide an integrated workflow for DfT and test coverage analysis. |
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