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2013-09-03 Select precision resistor for 4C20 mA current loop
The low output voltage level of the analog sensor and the long distance to the control room together contribute to considerable system design challenges. Here are clues on how to solve them.
2013-01-15 Scientists forge world's lightest glass nanofibres
University of Southampton's Optoelectronics Research Centre has claimed to have created the strongest, lightest weight silica nanofibres which can be used in aircraft, speedboats and helicopters.
2008-04-16 Scientists develop safer Li-ion batteries
Scientists at the Fraunhofer Institute for Silicate Research ISC in Germany, have found a way to create energy-dense Li-ion batteries without the use of flammable organic electrolytes.
2013-07-17 Saving embedded PCB design with forensic tech
Find out how forensics inspections can alleviate OEM concerns over maintaining high reliability for their systems and sub-systems.
2003-12-04 Sandia: Output/wavelength firsts for deep-UV LEDs
Sandia National Laboratories is reporting new levels of wavelength/power output for deep-ultraviolet LEDs, which are critical to future comms apps.
2010-02-23 Samsung to push EUV litho by 2012
Samsung Electronics Co. Ltd announced its plans to push wants extreme ultraviolet (EUV) lithography by 2012 despite signs that the technology will not be ready by that time at the LithoVision 2010.
2002-06-11 RVSI receives order for 3-D wafer inspection system
Robotic Vision Systems Inc. has received an order for a WS series bumped wafer inspection system from an undisclosed major supplier of materials for BGA semiconductors.
2002-09-20 RVSI mulls semiconductor tool business sale
Robotic Vision Systems Inc. announced that it has started discussing the sale of its Semiconductor Equipment Group with interested parties.
2013-09-05 Rudolph rolls NSX tool for IC, MEMS and LED packaging
The NSX 220 is an automated macro defect inspection system that uses grey-scale image analysis to provide accurate inspection and metrology in final manufacturing applications for wafers up to 300mm in size.
2012-07-24 Roll-to-roll processing for small molecule flexible OLED devices
Read about a roll-to-roll line designed to carry out research and develop flexible OLED lighting modules.
2006-01-01 RF locator system uncovers shopping patterns
The RF Cart Solution of RetailTech can provide retailers information such as popular stopping points, the duration of stay and the merchandise they actually bought.
2011-04-20 Researchers: Vacancies can create magnetic graphene
Hoping to find new graphene applications such as magnetic sensors, researchers claim that graphene can be doped for magnetism by introducing empty spaces into its otherwise perfect hexagonal pattern.
2009-06-30 Researchers tout key to future electronics
Researchers say that phase transitions to implement memory and computing is the real fundamental distinction of future information technologies.
2010-09-21 Researchers inspect Li-ion batteries at nanoscale
New microscopy technique used to view Li-ion movement
2012-11-08 Researchers find hurdles for future chips
Researchers have demonstrated that electrical current can be drastically reduced when wires from two dissimilar metals meet.
2014-07-24 Researchers embed InAs crystals into Si nanowires
The hybrid nanowires are produced by implantation and annealing, which are carried out using ion beam synthesis and heat treatment with xenon flash-lamps.
2003-06-25 Researchers demostrate Schottky barrier, aim for ferroelectric
Researchers are creating a Schottky barrier model in the hopes of finding that missing link for smaller, faster computers.
2013-10-02 Researchers demonstrate carbon nanotube powered computer
Stanford researchers hope to revitalise carbon-nanotube development efforts by surmounting its problems with a CMOS compatible process they call "imperfection-immune design".
2002-02-19 Researchers close to delivering molecular circuits
Although it's a little like watching a chess match in slow motion, molecular electronics researchers are converging on viable circuit-fabrication methods.
2009-01-19 Researchers claim 'world-record' PV efficiency
Researchers from Fraunhofer Institute for Solar Energy Systems have managed to squeeze an efficiency of 41 percent out of photovoltaic cells, which it is a world record.
2009-05-26 Researchers alert of transistor model glitch
Researchers at the U.S. National Institute of Standards and Technology have warned of a fundamental flaw in the understanding of transistor noise, and suggest that unless it is solved, it could stand in the way of developing more efficient, lower powered devices.
2006-07-06 Research team achieves UV-accelerated oxide growth
University College London has succeeded in oxidizing silicon using ultraviolet light rather than a high-temperature furnace.
2007-09-24 Report: The need to redirect China's GPS market
CCID Consulting has recently released its report analyzing the current status of China's GPS operations market and the development direction for GPS operations in the country.
2008-10-06 Report: Telecom re-org boosts China WLAN market
China's WLAN market developed rapidly in 1H 08 under China's policy of telecom reorganization and wireless city, according to a new report from CCID Consulting.
2007-11-28 Report reveals China solar panel vendors to slash prices
In the face of higher polysilicon prices, 88 percent of China solar panel manufacturers plan to lower or keep prices intact to win market share.
2013-05-29 Removing field failures at wafer level (Part 1)
Here's a look at Sonoscan's new automated wafer inspection system and its advantages.
2011-10-14 Reduce yield fallout by avoiding over and under at-speed testing
Here's a look at the problems associated with SoC at-speed testing such as overtesting and under-testing. This article also provides suggestions on how to overcome them.
2007-12-03 Recipe for an embedded success story
Writing embedded software code is not rocket science; it is doable by a wide range of people with a broad set of skills.
2005-01-24 Readers weigh in on package woes
The problems I had identified are more widespread than I suspected, and engineers were glad to see them brought out in a public forum.
2012-01-09 Rapid acoustic inspection for 300MM wafer generation (Part 2)
Read about a system that is touted to deliver superior precision, resolution and throughput in wafer inspection.
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