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2004-03-18 Vimicro selects Teradyne J750 for audio processor test
China-based chip solution provider Vimicro Corp. will use Teradyne Inc.'s J750 MSO system to test a new audio processor device designed to provide high-quality music ring tones and game sounds for mobile phones.
2010-01-28 Vector signal analyzer, generator improve test times
The NI PXIe-5663E 6.6 GHz vector signal analyzer and the NI PXIe-5673E 6.6 GHz vector signal generator improve automated test times for a wide range of devices
2004-04-21 Unisem expands RF test business with Teradyne
Unisem has purchased Teradyne Inc.'s FLEX system for its Malaysia test facility in order to support multiple fabless companies in Europe and the U.S
2008-05-26 Tool cuts test time for automotive devices
Advantest has introduced the T7723 mixed-signal test system with high-throughput and highly parallel test capabilities for testing high-density automotive devices
2011-08-01 Test kit for Android enables enhanced user experience
Wind River's Android test development kit validates device user experience by reproducing human interactions to test user interfaces.
2009-02-13 Test finds 3G handset reliability glitches
A testing study by Signals Research Group (SRG) focusing on popular 3G handsets found dramatic differences in the ability of different phones to reliably make and maintain calls.
2005-09-23 Teradyne UltraFLEX checks Micronas video graphics device
Teradyne Inc. announced that German-based Micronas has purchased multiple Teradyne UltraFLEX test systems. The systems will be used in the engineering and production test of next-generation video graphics controllers used in LCD and HDTV applications
2004-07-15 Teradyne system to test Foveon image sensor
Foveon Inc. has selected the IP750 test system from Teradyne Inc. to be used in CMOS image sensor device test.
2004-11-10 Teradyne provides Infiniti with FLEX test system
Teradyne Inc. disclosed that Infiniti Solutions Ltd has purchased the FLEX test system to expand device test market opportunities for its test lab in Santa Clara, California.
2003-11-12 Startup rolls test gear for wireless LANS
Touting scalability, repeatability and analysis, Azimuth Systems will launch a test gear suite that will fill the requirements of WLAN systems in a laboratory
2003-04-01 SMIC to deploy Teradyne logic, mixed-signal test systems
Semiconductor Mfg Int. Corp. has purchased multiple logic and mixed-signal test systems from Teradyne Inc., for a range of applications at wafer test
2009-03-03 Self-test device packs CPU interface support
LogicVision Inc. has developed new technology that will enable easy access to chip level built-in-self-test (BIST) capabilities for board and system-level test and maintenance activities
2012-01-12 Products for ASK/FSK wireless device testing
Read Agilent N9310A RF signal generator and Agilent N9320B RF spectrum analyzer, and their use in ASK/FSK wireless device test set ups.
2006-11-29 OptimalTest promises better yields through test management
OptimalTest has launched what it touts as the optimal test software suite for maximizing IC yields through managed test results
2009-02-24 LTE: Up for a test
Long Term Evolution is the next big thing in mobile wireless broadband, but design engineers working on LTE, as well as the more mature WiMAX, have their work cut out for them in testing devices and infrastructure.
2008-12-12 LitePoint debuts 'first' device test for Multicom
LitePoint Corp. has launched the first device test solution designed specifically for Multicom devicessingle devices containing multiple radios and wireless connectivity standards.
2003-11-10 King Yuan to deploy Credence networking test platform
King Yuan Electronics Co. Ltd, an integrated IC back-end service provider in Taiwan, has selected Credence Systems Corp.'s ASL 3000 RF test system as one of its wireless device test platforms.
2005-10-05 Ironwood's microBGA prototyping adapter simplifies device test
Ironwood Electronics offers a new prototyping adapter for 0.5mm pitch, 84-position, microBGA (?BGA) ICs.
2004-01-23 Intersil deploys Teradyne FLEX test system
Intersil Corp. has purchased Teradyne Inc.'s FLEX test system for CD and DVD writable drive device test.
2007-10-30 Intel exec calls for advanced test tools for next-gen SoC
In his talk at the opening of last week's International Test Conference, Gadi Singer, Intel Corp. VP and assistant general manager, stressed the need to improve test development tools for next-generation SoC
2002-05-21 Communication test equipment makers unify business operations
Yokogawa Electric Corp. will acquire 100 percent of Ando Electric Co. Ltd shares through a stock swap on October 2002.
2003-04-29 China's GAPT deploys Teradyne device test system
Global Advanced Packaging Technology Co. Ltd has purchased another test system from Teradyne Inc. - the Catalyst, for a wide range of device testing.
2005-01-11 Xilinx rolls out first Virtex-4 device with PowerPC processor
Xilinx introduced its new FX12 FPGAs, which are the first Virtex-4 devices with embedded PowerPC processor.
2010-05-26 WLAN test solution validates actual network traffic
VeriWave's WaveDeploy WLAN site assessment solution analyzes network readiness, real performance and the impact of growth and change, with a single pass through a facility.
2011-08-05 Wireless test platform offers accurate OTA
octoScope's octoBox is a wireless testing product that offers accurate OTA testing of conventional and MIMO wireless devices in a customisable refrigerator-sized anechoic enclosure.
2005-04-14 Wireless PHY test software works in LabVIEW
SeaSolve Software's test suite is tightly coupled with existingand provensignal analyzer and signal generator hardware
2007-07-19 WiMAX test system revs up production throughput
Agilent Technologies Inc. and GCT Semiconductor Inc. have partnered to jointly implement a WiMAX manufacturing test system for GCT's WiMAX chipsets
2006-09-14 Wi-Fi Alliance, CTIA launch Wi-Fi/mobile phone test program
Wi-Fi Alliance and CTIA jointly developed a testing program for Wi-Fi/mobile phones and released a test document for laboratory tests that provide RF performance mapping in a mixed-network environment
2002-04-29 Virtual Silicon selects IMS test systems for embedded memories
Virtual Silicon Technology has selected Integrated Measurement Systems' (IMS) Orion memory engineering validation test system for design verification of its 0.25?m non-volatile embedded memory cores
2002-09-17 VIA to use LogicVision test systems
VIA Technologies Inc. has adopted LogicVision Inc.'s Embedded Test technology for its next chip designs
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