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2005-03-04 Seica platform addresses electronic testing problems
Seica said its new platform is based on a unique software and hardware architecture which includes cutting-edge technology to implement the multiple test strategies needed to address the challenges of electronic testing.
2008-04-09 AWGs ease communication equipment testing
Two 15bit arbitrary waveform generators that can create simultaneous wide-bandwidth and high-resolution signals for electronic testing of communication equipment is offered by Agilent Technologies.
2008-05-30 USB modules match electronic functional test
Agilent Technologies Inc. has introduced a family of USB-based instruments designed for flexible configurations, quick setup, and affordability in electronic functional test and troubleshooting applications
2011-10-28 UPnP compliance testing skyrockets
Device certifications for the home networking standard exceeds 900 while a new test tool streamlines interoperability testing
2011-12-09 Two-stage MIMO over-the-air testing
Read about the methods of MIMO over-the-air testing, and find out why the two-stage method has the advantage of being fast, efficient and flexible
2006-10-11 Testing tools roll for Certified Wireless USB devices
Agilent announced it is shipping key test equipment and software necessary to verify operation of devices based on Certified Wireless USB.
2007-06-01 Testing signals for UWB aerospace systems
This article discusses test instrumentation that can address the special needs of advanced aerospace/defense applications.
2015-04-27 Testing limits: Sensor detects electron charge in nanoseconds
Researchers at the University of Cambridge created an electronic device that they say can detect the charge of a single electron in less than one microsecond
2015-01-12 Testing libraries target Intel Bay Trail processors
The VarioTAP libraries from Goepel enable flexible execution of processor emulation tests using the native debug port and allows users to use the processor for hardware design validation of prototypes.
2007-12-03 Testing beyond the required specs
An increasing number of new and proposed EMC standards are pushing the upper frequency test limits further up the microwave spectrum. The latest EMC standard released, IEC 61000-4-3:2006, is no exception.
2014-08-14 Sweat to power electronic devices
Biobatteries offer certain advantages over conventional batteries: They recharge more quickly, use renewable energy sources, and are safer because they do not explode or leak toxic chemicals.
2015-04-15 SRC to standardise 3D chip testing
Duke University lays down the plan to designing-for-test the TSVs, so that large inexpensive probes can touch many TSV microbumps simultaneously to take measurements that ensure defect-free stacked die.
2008-03-12 Software simplifies BER testing
Tektronix has announced the availability of its SerialXpress advanced software package that performs direct synthesis of waveforms for high-speed serial data receiver testing
2006-09-16 Reducing the cost of cellphone testing
As phones increase in complexity, requiring more tests, manufacturers must find strategies that will keep rising test costs down.
2008-02-11 Putting the system in electronic system design
The narrow scope of most ESL approaches and tools has limited their adoption. A more encompassing methodology, one that steps beyond the SoC, is needed to dramatically reduce time, cost and errors in complex system development.
2008-09-29 Power supply ready for high-speed testing of mobiles
Keithley introduces the Model 2308, a dual-channel battery- and charger-simulating power supply designed to support low-cost testing of portable products
2014-05-08 POET integrates electronic, optical elements in one chip
The Planar Opto Electronic Technology (POET) platform is semiconductor fabrication process that uses gallium arsenide technology to combine electronic and optical elements on a single integrated circuit
2007-08-15 Plastics electronic technology center rises in UK
PETeC, a plastics electronic technology center in the UK, is expected to become a national prototyping facility, offering clean rooms and laboratories, as well as production and testing equipment which will be available on an open-access basis.
2009-09-21 Perform systematic testing of HDMI EDID
This article looks at the risks inherent in an ad hoc approach to testing EDID with a selection of random HDMI sources and sinks, and advocates a more systematic approach to HDMI test
2006-02-15 PCIe tool delivers in-depth characterization testing
Dishing up parallel BERT software that enables compliance and characterization testing for PCIe, Agilent announces this capability for its existing 81250 series ParBERT
2008-12-09 Oscilloscopes carry hardware-based mask limit testing
Agilent Technologies Inc. has released what it claims to be the first hardware-based mask limit testing application for general-purpose oscilloscopes
2010-09-24 New testing solutions for PCB manufacturers
Digitaltest GmbH expands line of testing solutions
2003-10-01 MiNT system allows simultaneous signal testing
MiNT Systems Corp. has introduced the Synasys modular mixed-signal instrument system that offers flexibility, time-saving and seamless plug-and-play integration.
2002-10-28 Level accuracy and electronic level settings of SMIQ
This application note describes the electronic attenuator functions of the SMIQ and how these functions can be used in production and production testing where frequent level setting is necessary.
2008-03-20 Joint project eyes laser, LED testing analysis
HKSTP and the STC will be working together to offer testing services for the international and European safety standard IEC/EN60825-1 for solid-state lighting solutions including LEDs and lasers
2014-11-19 Inline testing, programming sol'n for non-volatile memories
The RAPIDO RPS910 from GOEPEL electronics includes boundary scan/JTAG testing as an option to gain confidence in the build quality as early as possible in the production process
2014-07-08 Explore pre-compliance testing for WLAN transmitters
Cost-effective and familiar test equipment can be used for in-house pre-compliance testing to uncover potential problems early on and reduce the risk of costly failure at the compliance test stage
2002-01-17 ESI test system provides fast, accurate multilayer varistor testing
The Model 3330 electronic test system for surface-mount, multilayer varistors enables fast, accurate and repeatable testing of a variety of multilayer varistor chip sizes and configurations.
2005-08-12 Elma Electronic telescopic rails promise maximum reliability
The new telescopic rails from Elma Electronic feature a rugged, ultra-thin 7mm wide construction that enables full size 84HP wide sub-racks to be mounted in 19-inch cabinets
2008-01-24 Electronic contact lenses promise virtual display
Electronic contact lenses, made by depositing circuitry and LEDs on organic plastic, have been demonstrated by researchers at the University of Washington
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