Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > expandable test platform

expandable test platform Search results

?
?
total search10 articles
2007-05-14 Test software enables enterprise-wide collaboration
VI Technology Inc.'s Arendar 2007 test platform expands on the highly-configurable and expandable Arendar platform to provide instant access to design, characterization, validation and verification, and manufacturing test information across the enterprise.
2005-11-08 LitePoint announces two new wireless test solutions
LitePoint Corp. announced the availability of two new wireless test solutions for advanced MIMO wireless LAN products
2010-09-02 Platform enables optical networking development
The fully programmable development system can be used with individual optical modules or with multiple 40Gbit/s optical paths connected together into a network.
2014-05-28 Measurement system features expandable architecture
Advantest's platform provides the flexibility to conduct a wide range of measurement functions including analogue and middle power IV sources, signal capture module, and synchronised sequence control
2009-04-01 LTE test system promises complete RF testing
AT4 wireless has unveiled the T4010 LTE RF test system, a complete and cost-effective platform to perform RF parameter verification throughout the development life of LTE-enabled user equipment
2007-10-23 RF module carries out testing of RF SoC devices
Advantest Corp. is set to roll out in November a RF test solution for low-cost testing of multiport RF SoC devices used in cellular phones and other wireless products and equipment
2007-10-19 Multicore DSP rolls for media gateway platforms
Its bid for gaining a stake in the online multimedia market, Octasic introduced Vocallo, its next generation multicore gateway DSP platform for voice, video and data over IP applications
2005-06-17 Fiberbyte's modules give synchronous realtime control on USB
Fiberbyte's DAQ-2500X module has four independent 16-bit resolution 100kS/s simultaneous-sampling analog input channels. Each channel packs its own A/D converter.
2007-11-09 Synopsys, UMC co-develop 65nm reference flow
Synopsys and UMC have co-developed a 65nm hierarchical, multivoltage RTL-to-GDSII reference design flow.
2005-10-18 Agilent's latest serial BERT
Agilent recently announced what it claims as the industry's first high-performance serial bit error ratio tester with advanced jitter generation capabilities for jitter-tolerance testing of serial gigabit devices up to 12.5Gbps.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top