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2006-03-23 NTS, SIINT announce electron, ion-beam system alliance
Carl Zeiss Nano Technology Systems and SII NanoTechnology jointly announced a global strategic alliance in the electron and ion-beam systems, service and solutions market
2011-06-16 FEI ion beam cuts imaging time for MEMs, 3D chips
The Vion PFIB tool can cut the time to image MEMS and 3D chip features by 20x, from more than 10hrs to under 40mins for TSVs, revealing in minutes chip features ranging in size from 30nm to 1mm.
2002-04-23 Sanyo blue-violet laser diode has low-noise beam structure
Sanyo Electric Co. Ltd has developed a blue-violet laser diode that features a low-noise beam structure and is suitable for use as a light source in next-generation DVD systems
2002-06-20 Silicon Laboratories installs FEI's circuit edit system
Silicon Laboratories Inc. has installed FEI Co.'s Vectra 986 circuit edit system. Silicon Labs will use the system to edit prototype devices while reducing overall cost and preserving critical time-to-market advantages.
2002-09-17 FEI to deliver edit systems to Taiwan, North America
FEI Co. has received the first two orders for its Vectra 986+ circuit edit system from a U.S.-based semiconductor manufacturer and a Taiwan-based semiconductor service lab.
2003-07-21 Silicon debug tools lengthen their reach
Credence Systems and FEI have unveiled new products and acquisition this week that could assist design teams with leading-edge ICs.
2003-01-21 Seiko Instruments to set up lab in Shanghai Jiao Tong University
Seiko Instruments Inc. has collaborated with Shanghai Jiao Tong University in the enhancement of its fine semiconductor process technology
2007-12-21 Israeli researchers develop 'nano-Bible'
Technion Israel Institute of Technology researchers announced they have successfully put the full version of the Hebrew Bible, with vowel points, on an area smaller than the size of a pinhead
2009-01-16 Researchers rethink concepts of magnetic data storage
Researchers from Forschungszentrum Rossendorf in Germany, the Universitat Autonoma de Barcelona in Spain and other research institutions in Switzerland, Sweden and the United States succeeded in generating very small magnetic zones in a material by irradiating the surface with highly focused ion beams
2006-08-09 Carl Zeiss NTS, SIINT expand joint workstation portfolio
Carl Zeiss SMT's Nano Technology Systems division and SII NanoTechnology Inc. introduced the latest member of its CrossBeam family of combined scanning electron and focused ion beam workstations.
2002-01-09 Veeco, Photronics partner in next-generation photomasks
Veeco Instruments Inc. and Photronics Inc. have formed a strategic relationship focused on developing manufacturing technologies for fabrication of enhanced reticles and next-generation lithography masks
2009-01-30 GPS Snitch gets scrutinized
The dizzying pace of progress in GPS navigation, Internet mapping and mobile data support has reached an intriguing confluence. As devices such as the Blackline GPS Snitch roll out, live tracking is now in the hands of the masses. Let's spy on the spyware now, with a private eye on the enabling technology
2003-11-18 Keithley, Zyvex sign marketing collaboration
Keithley Instruments and Zyvex have signed an agreement to work together to develop new solutions for the nanotech marketplace.
2004-03-01 Intel boosts nanotech work via Zyvex link
Intel Corp. is studying the use of carbon nanotube-based polymers in thermal-interface materials, the latest evidence that nanotechnology is no longer a curiosity but is being put to work in the electronics industry.
2008-07-01 Hardware secures standards
With global competition growing in ferocity, standards of conduct getting looser, and the manufacturing supply chain operating in countries with weak intellectual-property protection, what's the best way to safeguard the security keys integral to standards-based security schemes for everything from HDTV to iPods?
2015-04-28 Exploring the failure analysis process
Determining the root cause of electronic system failures requires a disciplined and systematic analytical process, along with sophisticated tools for testing and visualizing the behaviours of sample devices.
2008-10-01 Chip package options abound
When creating a new IC, device packaging is often overlooked until the end of process. However, choosing the right package can reduce time-to-market and create tangible benefits for customers. Here is a look at some of the available options and what they have to offer.
2012-11-05 Address power, security issues with antifuse tech
Learn how to resolve the new constraints of battery-powered system-on-chip design.
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