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2004-06-17 SCAN90CP02 design for test features
This app note shows several SCAN90CP02 designs for test features.
2004-11-02 JTAG test adjunct to focus on Gbps nets
ASSET InterTech will soon be offering the capability to test 1Gbps to 10Gbps serial buses on PCBs.
2011-04-18 Teradyne, JTAG team up for boundary scan solution
Teradyne Inc. is collaborating with JTAG Technologies to design a boundary scan test option for manufacturers.
2006-06-06 Serial RapidIO switch targets DSP-intensive apps
Tundra expanded its Serial RapidIO switch family with a device that is designed to perform DSP aggregation on line cards in wireless, networking and video infrastructure apps.
2006-03-08 Serial RapidIO switch has multicast capability
Tundra Semiconductor announced the Tundra Tsi578 Serial RapidIO switch for applications such as wireless base stations and video infrastructure.
2006-07-31 New Serial RapidIO switch offers 40Gbps bandwidth
With 40Gbps of non-blocking bandwidth, Tundra's new Serial RapidIO switch is expected to set industry benchmarks for high performance and low power consumption.
2005-08-15 LVDS buffer/repeaters extend signal integrity of FPGAs, ASICs
National Semiconductor's new high-performance buffer/repeaters for LVDS systems extend the signal reach of FPGAs and ASIC across backplanes and cables in telecom, datacom, industrial, medical, automotive and office imaging apps
2011-10-07 Corelis launches advanced JTAG sol'n for Teradyne testers
Corelis has launched the USB-1149.1/CFM, an advanced JTAG solution that offers seamless integration of advanced boundary-scan test patterns into Teradyne testers.
2008-06-19 Boundary-scan controllers allow functional testing
JTAG has unveiled the latest member of its DataBlaster line of boundary-scan controllers that allow electronics manufacturers to easily combine boundary-scan performance and test coverage with functional validation.
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