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2010-09-21 Zenith 3D AOI system offers measurement-based inspection
Koh Young Technologies has just introduced their revolutionary Zenith 3D AOI System. It measures the Z-axis profilometry of whole PCB assemblies, including components, leads, and solder joints, based on Moir technology.
2011-08-04 X-ray inspection system eases board failure detection
The Akila XR-3 X-ray inspection system claims accurate detection of defects such as excess solder, insufficient solder and voids in printed circuit fabrication.
2007-04-30 X-ray inspection system delivers high-throughput 3D coverage
Agilent Technologies says its Medalist x6000 3D X-ray inspection systems offer more than double the throughput of leading 3D solutions while using full 3D capability to find PCB assembly (PCBA) solder and manufacturing assembly defects.
2011-08-23 Wafer inspection tool targets 20nm device nodes
KLA-Tencor has introduced the eDR-7000 e-beam wafer defect review system, an enabling tool for chip manufacturing at the 20nm device nodes and below.
2003-08-11 Wafer inspection system allows rapid testing
Nikon's SITECH group has introduced the AMI-3000 wafer inspection system that is designed to meet 300mm wafer production in the 90nm node and beyond.
2012-09-03 ViTrox to unveil its latest IC device inspection tool
ViTrox Technologies is set to debut its TH-1000 which caters to tray-to-tray IC device inspection and is further enhanced with Double Unit Inspection.
2008-06-23 Vistec inspection system touts 30% increase in utilization
Vistec Semiconductor Systems has added a new option called "Parallel Control Job" for its macro inspection product line LDS3300 that increases the system utilization by up to 30 percent.
2005-01-03 Vision sensors aimed at inspection, process control
Vision Control introduced the S24 family of vision sensors that offers a simple to use teach-in operation.
2014-09-15 Vision sensor kit offers high-speed part inspection, QA
The Inspector I20 kit from RS Components is able to check parts in any orientation or position and reliably determine in real-time if objects pass or fail.
2015-03-10 Viscom delivers system for coating inspection
The S3088 system for conformal coating inspection, Viscom says, is now available with high-precision plasma coating inspection. It works with UV LEDs and has 11.75?m/px or 23.5?m/px resolution.
2012-07-31 Viscom boosts manual, semiautomatic inspection capabilities
Targeted at the electronics industry, the company has intensified its technical development of X-ray inspection with the redesign of the X8011.
1999-12-01 Using in-line inspection to improve PCB assembly yields
Identifying defects in your process and improving product quality calls for a suitable pre-flow in-line component inspection system. While choosing a system, keep in mind your specific process needs, inspection accuracy and repeatibility requirements, and last but not the least, its robustness vis--vis actual operating conditions.
2013-06-27 Understanding deep packet inspection (Part 2)
Learn about several architectures and building blocks that ease the creation of scalable, reliable DPI.
2013-06-19 Understanding deep packet inspection (Part 1)
Here's a look at the use cases and common requirements for DPI applications.
2003-10-24 UMC deploys August Tech wafer inspection equipment
United Microelectronics Corp. has selected August Technology's NSX Series wafer inspection system to inspect fully processed outgoing wafers.
2014-11-19 Ultratech outs in-line inspection system for patterned wafers
The Superfast 4G promises a high degree of flexibility enabling the use of a single type of wafer inspection tool to measure the front side of patterned wafers across the entire fab line at the lowest cost.
2009-08-18 The importance of deep packet inspection in wireless nets
Mobile broadband is today's growth engine for wireless network operators. Even in the current economic downturn, wireless network operators continue adding new subscribers on their data plans.
2000-04-01 Test requirements boost X-ray inspection uptake
Improvements in automated X-ray inspection throughput and accuracy, and reduction in costs are driving the adoption of this test technology in conjunction with traditional ICT.
2015-10-26 Terahertz imaging company to make headway in chip inspection
The company, which claims to be a pioneer of the solid-state generation and detection of terahertz light for imaging and characterising materials, has received an investment of nearly $10 million.
2015-11-12 Teledyne LeCroy intros packet capture, inspection system
The Hammerhead for SierraNet Protocol Analysis systems is a dedicated, line-rate protocol analyser that comes with the Wireshark network packet capture application.
2015-04-27 Teardown: Chromecast for your inspection
Suspecting either hardware failure or a flawed automatic firmware update, the author gave up trying to revive his Chromecast and instead put it on top of the teardown pile. Here it is for your inspection.
2002-04-26 TCE adopts Numerical's Virtual Stepper for photomask inspection
Taiwan-based photomask manufacturer Toppan Chunghwa Electronics (TCE) has incorporated Numerical Technologies' Virtual Stepper System into its photomask manufacturing process.
2006-07-20 System enables fully automated inspection of 300mm wafer surface
Vistec Semiconductor Systems announced that its new-generation LDS3300 enables fully automated inspection of the complete 300mm wafer surface.
2002-12-26 Startup taps digital holography for wafer inspection
A metrology startup is pitching the use of digital holography to peer into the narrow and deep spaces, such as contacts and trench capacitors, on semiconductor wafers.
2015-04-22 SSL inspection sol'n for network monitoring, security apps
The Transparent SSL Proxy solution from EZchip claims to deliver 20Gb/s of SSL Proxy throughput and more than 30,000 new connection set-ups per second on a single TILE-Gx processor.
2002-09-04 Speedprint stencil printer allows paste inspection
The SP200avi inline stencil printer features a "paste on stencil" inspection feature, enabling users to determine whether there is adequate paste on the stencil before running the print cycle.
2014-06-27 Sonoscan unveils MEMS wafer inspection system
The AW322 200 system features two loadports, two stages and multiple transducers, enabling it to image two 8in MEMS wafers simultaneously.
2009-06-02 Sonoscan to debut operator-free wafer inspection system
Sonoscan Inc. will launch its new C-SAM series AW300 for bonded wafer inspection system that carries out robotic handling and acoustic imaging of bonded wafer pairs up to 300mm in diameter.
2002-06-20 Seiko Epson certifies Electroglas in LCD wafer inspection
Seiko Epson certifies Electroglas in LCD wafer inspection
2006-03-16 Security ICs add muscle for faster, deeper inspection
Bottlenecks in today's security appliances are pushing chipmakers to offer more integrated silicon and systems that promise to speed throughput to gigabit rates.
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