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2006-12-18 Test tool optimizes data for IC yield
LogicVision Inc. touts its solution Yield Insight to provide "yield learning," a process in which test failure data can pinpoint potential yield problems
2005-01-03 Test experts ponder cost of defects
Is 100 DPPM too tough to be practical for designs in 100nm or finer processes?
2006-11-03 Test challenges could trump future chip designs
Coming silicon process generations will bring not only immense increases in device density, but also the challenges of working with process and device variations that in many ways are worse than for the processes of 20 years ago.
2006-11-29 OptimalTest promises better yields through test management
OptimalTest has launched what it touts as the optimal test software suite for maximizing IC yields through managed test results
2004-10-08 Mentor automates test tools, adds guru to staff
Mentor Graphics Corp. has added new automated functionality to its FastScan automatic test pattern generation tool (ATPG) and its TestKompress embedded deterministic test tool
2007-10-30 Intel exec calls for advanced test tools for next-gen SoC
In his talk at the opening of last week's International Test Conference, Gadi Singer, Intel Corp. VP and assistant general manager, stressed the need to improve test development tools for next-generation SoC.
2007-10-22 Consortium drafts IC test interface extension standard
The Semiconductor Test Consortium Inc. has published the first draft of terminology specifications for the Semiconductor Test Interface eXtensions (STIX) initiative
2002-04-22 Sunplus reveals plans to shift test facility in Shanghai
At the 7th annual International IC ? IC Conference and Exhibition (IIC-China), Sunplus Technology Co. Ltd disclosed plans to transfer its business center from Taiwan to Shanghai
2006-08-02 Scope series offers a test platform for high-speed designs
Tektronix has introduced the new DPO70000 Digital Phosphor Oscilloscope and DSA70000 Digital Serial Analyzer to provide engineers with an ideal platform for their high-speed designs.
2006-08-01 New test platform targets wireless networking
Agilent's new Connected Solutions Workbench enables system-level testing for wireless networking and cellular communications systems.
2005-11-03 Nanotech conference chair calls for standards, funding
The development of international standards and an increase in funding are essential to the continued development of nanotechnology infrastructure, according to Lloyd Tan, chair of the International Congress of Nanotechnology 2005 conference here
2006-08-01 EDA&T-Taiwan showcases latest in EDA, test
To update engineers on the latest developments in EDA and test, the 14th Annual EDA & Test Taiwan Conference & Exhibition will gather the world's top vendors on August 17-18 at the Taipei International Convention Center.
2002-07-12 Tektronix offers wavelength selectable 10Gbps transmission test system
Tektronix Inc. has announced that its OTS9100 series of modular optical test system now offers what is claimed to be the industry's first fully integrated wavelength selectable 10Gbps transmission test system
2004-12-01 Scan design called portal for hackers
Any chip that uses scan designand any system built around it--may be vulnerable to hackers.
2003-10-03 Life-long testing prescribed for chips
Chip testing strategies continue to perplex the industry as sub-100nm node designs become more commonplace.
2006-10-30 ITC panel debates on cost-of-quality
Assessments of the total cost of quality need to take into account reliability, delivery, adherence to requirements, and the quality of the user experience, according to an executive panel at the ITC.
2004-10-29 ITC keynoters say designers need IC yield data
Chip yields are increasingly being determined as much by unseen design weaknesses as by process issues, experts at the International Test Conference here said Tuesday (Oct. 26).
2003-08-14 ITC 2003 to focus on MEMS technology
This year's test conference covering IC and board test issues will shift its focus to MEMS technology as a growing concern for test engineers
2002-12-02 Inovys' Ocelot leads parade of SoC, board testers at ITC
= Innovative SoC tests were the star at the recent ITC and Inovys' Ocelot was able to tie-up with companies like Mentor Graphics, Synopsys Inc., and Q-star.
2012-08-09 Improve SoC yields with diagnostic and repair tools for embedded memory
Learn about embedded memory test solutions, including fault detection in very deep submicron technologies, repair at the manufacturing level, as well as diagnosis for process improvement and field repair capabilities
2006-08-07 Zuken acquires German engineering software developer
Japanese EDA vendor Zuken has completed the acquisition of CIM-Team, a German provider of electronic computer aided engineering software.
2009-03-20 Yield tool minimizes design re-spin
Synopsys Inc. introduced Yield Explorer, a new yield management tool that minimizes design re-spin through rapid and comprehensive capture of design-process-test interactions causing low yield
2007-08-02 Wind River updates to Lab Diagnostics solution
Wind River Systems is now shipping the Wind River Lab Diagnostics 2.1, an updated release of its enterprise-wide software diagnostics solution designed for cross-functional development teams.
2002-03-25 Views of IC quality are clearly different at ISQED
The opening plenary session of the International Symposium on Quality Electronic Design inadvertently reenacted the proverb of the blind men and the elephant
2002-03-14 Verification gets no respect, panel says
Verification gets no respect, according to participants in a "value of verification" panel at the International HDL Conference
2003-11-06 Startup crafts 58-Gflops computer
On the eve of the Supercomputing Conference 2003, to be held Nov. 15-21 in Phoenix, startup OctigaBay Systems Corp. will introduce a high-performance computer that melds off-the-shelf X86 processors with internally developed high-speed interconnect and reconfigurable-computing subsystems
2002-03-11 SoC stumbling blocks cataloged at DATE
It's not enough to be fast, efficient and technically proficient. Designers now must become Renaissance engineers.
2006-07-17 New tools, solutions at ESC, EDA&T-Taiwan
Cutting-edge technologies and solutions, including the latest embedded development and EDA tools, will take centerstage at the 6th Annual Embedded Systems Conference and the 14th Annual EDA & Test-Taiwan Conference and Exhibition to be held on August 17-18
2006-07-31 New NI toolkit targets next-gen automotive ECUs
NI has released the ECU Measurement and Calibration Toolkit 2.0 that supports measurement and calibration applications for designing and validating automotive electronic control units (ECUs).
2005-12-09 NEC touts nanobridge, 45nm feats at IEDM
NEC has announced an enhanced three-terminal Nanobridge switch that will be the basis of a novel form of FPGA. The so-called cell-based IC is expected to be one-tenth the size of the equivalent FPGA.
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