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2005-03-17 Teradyne supplies RFID test systems to J750 systems
Teradyne Inc. disclosed that Beijing Huada, a VLSI testing service and solution provider for Beijing and Northern China, has purchased multiple J750 test systems to meet production capacity for RFID smart card testing
2005-03-31 SST selects Personal Kalos 2 test system from Credence
Silicon Storage Technology Inc. (SST) has chosen the Credence Systems Corp.'s Personal Kalos 2 (PK2) test system to test their 89 Series of FlashFlex51 microcontrollers
2006-07-03 Low-cost test system targets mobile phones
Agilent Technologies has introduced a low-cost mobile-phone functional test system designed for the wireless communication market.
2004-11-02 LCD storage scopes are low cost performers
Protek offers two versions of its dual-channel digital scopes - Model 6810CN and Model 6810MN.
2015-10-15 Do you really want to get rid of test costs
Eliminating test, and thus its cost, might seem like a good strategy, but it will hurt in the long run. In this article, we explain why
2006-03-16 Creating low-cost solution for memory test
Explore the development of a memory test solution and its required features to verify functionality and physical connections
2006-11-17 Agilent RF signal generator reduces cost of tests
Agilent has announced the worldwide availability of its N9310A RF Signal Generator that promises high performance and superior quality at a lower cost, while significantly reducing the cost of test
2007-05-10 Zigbee software package enables low-cost, one-box testing
LitePoint Corp.'s Zigbee software package is said to provide test support for Zigbee 802.15.4-based products and can be used with existing LitePoint IQview and IQflex Test Solutions
2005-08-25 Xilinx says low-cost PCI Express solution compliant
Xilinx Inc.'s programmable PCI Express endpoint silicon solution has passed the latest PCI Express compliance and interoperability tests, the company announced Tuesday (Aug. 23) at the Intel Developer Forum in San Francisco, California.
2005-09-12 Xilinx low-cost solution passes PCI Express compliance tests
The programmable PCI Express endpoint silicon solution from Xilinx Inc. has passed all the latest PCI Express compliance and interoperability tests.
2013-10-04 Xicanto unveils low cost LM-79 test program for LEDs
The new LM-79 test service lowers testing costs by 50 per cent per luminaire, and reduces testing turn-around time to just 5 business days
2002-02-25 Velio, Alvesta develop, test OC-192 VSR optics solutions
Velio Communications Inc. and Alvesta have completed the interoperability testing of Velio's SONET-EOS family with Alvesta's 3100 optical transceiver.
2010-10-26 USB boundary scan controller lowers cost
JTAG debuts JTAGLive USB Controller
2014-06-27 Tofu component helps cut cost of solar panels
Magnesium chloride, an ingredient used to make bean curd or tofu, is low cost, easily obtainable, and can simply be substituted for cadmium chloride in creating solar panels
2014-02-19 Tips for cost-effective 3D IC production
Know how to distribute the cost-of-ownership across the supply chain
2003-06-25 TI starter kits provide low-cost DSP designs
Texas Instruments has announced the availability of two low-cost DSP starter kits for the TMS320C64x and the TMS320C67x devices
2008-09-11 TI brings 32bit real-time control to cost-sensitive apps
Helping bring processor intensive, real-time control to cost-sensitive applications, Texas Instruments Inc. announced a new series of 32bit TMS320F2802x/F2803x MCUs starting at less than $2 in volume
2007-10-30 Test tool 'first' to validate IPTV QoE on IPv6 nets
Agilent Technologies claims its N2X multiservices test solution is the industry's first test solution for validating IPTV service quality for thousands of subscribers on IPv6 network architectures
2002-08-16 Test systems move to the desktop
This technical article introduces a low-cost, efficient desktop test system aimed to replace traditional, expensive automated testing systems.
2015-11-20 Test active optical cables during design, production
Testing and analysis done at critical junctures during the design process can further reduce costs by optimising the design for high yield given specified manufacturing tolerances.
2005-08-22 Ten steps to a low cost, high performance switcher to power your FPGA
Here's a simple synchronous buck regulator circuit that can provide high performance at a very low cost
2010-11-19 System brings boundary-scan test to small designers
Corelis Inc.'s TestGenie offers a low-cost, low-risk boundary-scan test solution for companies with limited resources, minimal JTAG experience, fixed schedules and tight test budgets.
2006-10-16 Strategic Test claims 'smallest' PXA270 SOM
Measuring 67.6-by-31-by-4.2mm and claimed to be the smallest PXA270 SOM, Strategic Test's Triton-270 is a complete computer on a module that has been optimized for mobile embedded designs where low power consumption and extremely small size are critical
2006-09-01 Solving the MCP memory test challenge
Multichip packages (MCPs) are the standard for cellphones, with nearly all modern cellphones having at least one MCP. Using MCPs allows manufacturers to offer the new multifunction devices while maintaining small form factors.
2004-06-17 SiS buys low-cost production test solutions from Agilent
Silicon Integrated Systems Corp. (SiS) has purchased manufacturing test solutions from Agilent Technologies Inc. for its PCI Express devices
2012-02-20 Signal analyzers boast low-cost performance
The Scout, Hunter and Explorer analyzers locate, record and analyze complex communications signals for commercial, military and aerospace applications.
2005-04-01 Semtech chip with low propagation delay dispersions
A low power, four channel BiCMOS pin electronics IC designed to bring high-end features to low-cost logic, memory or mixed signal ATE systems was unveiled by Semtech
2006-08-16 Semicon biosensor IC shrinks immunoassay test systems
The new semiconductor biosensor chip from Hitachi introduces electrical measurement into immunoassay, in place of light absorption measurement.
2007-03-22 RF spectrum analyzer targets cost-sensitive apps
Agilent's N9320A RF spectrum analyzer addresses this need by providing quick measurement with performance and enhanced usability packaged in a low-cost solution
2006-10-02 Revolutionize automated test equipments
This article features a multipurpose wafer-sort and final-test solution designed to address the economic requirements of the MCU, wireless baseband, display driver and low-cost consumer mixed-signal devices.
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