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2005-05-31 TDK launches UWB test system for device evaluation, measurement
TDK Corp. has disclosed the availability of a total solution integrated UWB evaluation and measurement system. Sales of the new system will start in both Japan and the U.S. in June 2005.
2008-05-23 Standalone RPM measurement system with LED display and PSoC
The simple design in this application note by J. Jayapandian from Cypress Semiconductor accurately measures the speed, in RPMs, of a rotating wheel using an inexpensive IR optocoupler connected to a PSoC device.
2011-05-16 SoC demonstrates AC/DC-power measurement
Teridian Semiconductor demonstrates AC/DC-power measurement targeted for high-power LED-lighting ballasts using the Teridian/Maxim 78M6613 energy-measurement SoC
2011-09-06 SMD placement system touts speed of 600C800cph
The EXPERT-SAFP is designed for rapid prototyping, and is available in manual and semi-automatic models.
2013-10-21 Sensor-based system optimises industrial cleaning
Fraunhofer researchers created a sensor-based measurement system that is integrated directly in the cleaning system, where it registers and analyses particles caught up in the cleansing fluid.
2011-10-06 Selecting the right switch for test and measurement system
Here's a document to assist you in selecting the most appropriate switch type for a given application.
2013-05-14 Scanning system touts 5ms response time, speed up to 20kHz
Tekscan's High Speed I-Scan is a pressure and force measurement system capable of capturing data from high speed events such as impact studies and automobile safety and crash testing.
2014-01-14 RPI demonstrates prototype light measurement system
The prototype Google Glass-based personal light measurement system is designed to use an Android app to help people understand their circadian rhythms to improve heath, happiness, and productivity.
2007-03-15 Photomask CD measurement system suits 45nm node
Vistec's new SEM-based CD measurement system is designed for the 45nm technology node photomask production and the 32nm process development.
2015-01-22 Optical system promises more efficient generators, engines
More efficient wind turbines, lighter racing cars and safer medical instruments are three objectives of an innovative measurement system being developed by scientists from Hannover.
2004-12-06 NI gives engineers embedded system platform flexibility
NI said that engineers can now extend its CompactRIO reconfigurable embedded system platform by creating their own custom I/O modules
2013-01-30 Nano-positioning system uses magnetic levitation
The platform levitates on a magnetic field that is generated by six coils and is actively monitored via a 6D sensor. The magnetic field functions as a drive and actively guides the platform
2014-05-28 Measurement system features expandable architecture
Advantest's platform provides the flexibility to conduct a wide range of measurement functions including analogue and middle power IV sources, signal capture module, and synchronised sequence control
2002-11-14 Korea's Willtech sets sight on world measurement market
Chang Boo-Kwan, South Korean local entrepreneur and CEO of Willtech, recounts how the company pioneered the country's test and measurement industry
2006-12-18 Kit simplifies weight measurement designs
Loadstar Sensors has launched a wireless weight measurement kit that enables product designers and end users to easily build an accurate and reliable weight measurement system.
2005-05-16 Isabellenhuette unveils USB temperature measurement system
Isabellenhuette's ITS-TC is a temperature measurement system with a thermocouple working on an USB 2.0 bus.
2014-02-25 Goniometer system simulates light distribution
At the upcoming Light + Building fair, Radiant Zemax will demonstrate a line-up of testing solutions that address the requirements for manufacturing light.
2004-12-21 Engine test system enhanced with wireless connectivity
SAKOR now has an updated version of its DynoLAB PT product that may interest those working with instrumentation for large motors or automotive engines.
2013-04-02 Designing liquid-level measurement system
Learn about the DS1WM synthesisable 1-Wire bus master that can be implemented as a function block of an ASIC or FPGA.
2002-12-11 Contactless Angle Measurement using KMZ41 and UZZ9000
This application note describes how to build a MR based measurement system using the KMZ41 magnetoresistive sensor and the UZZ9000 sensor signal conditioning IC.
2002-12-20 Contactless angle measurement using KMZ1 and UZZ9001
This application note describes how to build a MR-based measurement system using the KMZ41 magnetoresistive sensor and UZZ900 sensor signal conditioning IC.
2007-08-06 Choosing, designing the best filter for an effective DAQ system
Filters are very necessary and unavoidable "evil" of the signal path thus, designers must understand their options when making the filter decisions.
2008-06-02 Cascade offers fully integrated flicker noise measurement system
Cascade Microtech introduces the EDGE Flicker Noise Measurement System that provides measurements from 1Hz to 30MHz,
2014-03-14 Boost accuracy with cell-monitoring system
Cell-measurement architectures may be utilised for cell balancing and battery-measurement applications
2003-06-16 Automating optical-beam measurement system
Using NI's IMAQ and LabWindows/CVI to acquire signal and image data, developing a cost-effective and automated visual inspection system for scrutinizing the quality of laser beams can be easy
2003-06-29 Automatic measuring in standard M/PAL using a M/NTSC video analyzer UAF or video measurement system VSA
This application note provides a method to for automatic measuring in standard M/PAL signals using a UAF M/NTSC video analyzer or VSA video measurement system.
2007-03-05 Agilent, Decomsys team on FlexRay measurement system
Agilent and Decomsys has introduced a measurement system that provides the highest-level FlexRay triggering and protocol decode measurements available in an oscilloscope.
2013-01-29 1/f noise measurement system supports 1Hz-10MHz
ProPlus Design Solutions' 9812D can measure low-frequency noise characteristics of on-wafer or packaged semiconductor devices such as MOSFETs, BJTs, JFETs, diodes and diffusion resistors.
2010-09-21 Zenith 3D AOI system offers measurement-based inspection
Koh Young Technologies has just introduced their revolutionary Zenith 3D AOI System. It measures the Z-axis profilometry of whole PCB assemblies, including components, leads, and solder joints, based on Moir technology
2007-07-19 WiMAX test system revs up production throughput
Agilent Technologies Inc. and GCT Semiconductor Inc. have partnered to jointly implement a WiMAX manufacturing test system for GCT's WiMAX chipsets
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