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2004-01-06 Zarlink diodes suit industrial measurement systems
Zarlink Semiconductor has unveiled the long-wavelength Fabry-Perot laser diodes that can be customized for surveillance systems
2002-04-29 Virtual Silicon selects IMS test systems for embedded memories
Virtual Silicon Technology has selected Integrated Measurement Systems' (IMS) Orion memory engineering validation test system for design verification of its 0.25?m non-volatile embedded memory cores.
2002-04-15 Matsushita surface measurement unit called Blu-ray disk system enabler
Matsushita Electric Industrial Co. Ltd. has developed a 3D profilometer that it says is a crucial tool for making the lens for the next-generation Blu-Ray DVD systems
2009-11-25 Efficient impedance measurement of a large amount of components by using a scanning system
This application note describes how to adopt measurement systems using an LF LCR meter and an LF impedance analyzer with a scanner and how to solve problems related to residual impedance, which can occur when using a scanning system.
2007-06-21 Digitizer maximizes measurement throughput
Agilent Technologies Inc. introduces its first digitizer from the Acqiris product line, the Acqiris DP1400 high-speed digitizer.
2007-07-11 ADC requirements for temperature measurement systems
This application note by ADI's Mary McCarthy and Eamonn Dillon describes the available temperature sensors and the circuitry needed to interface a sensor to an ADC.
2008-02-13 Acquisition ASIC rolls for EEG systems
IMEC rolled out a complete 200?W 8-channel EEG acquisition ASIC suitable for miniaturized ambulatory EEG measurement systems.
2005-03-29 A 'universal measurement device
NI disclosed that design and test engineers can now use a single modular instrument to make a wide range of dynamic measurements with its new flexible resolution digitizer.
2015-04-27 Xylon, Hexagon partner for CT-based quality control systems
Hexagon Metrology and Xylon International reveal a joint development aiming to bring solutions for non-destructive testing and test data processing for applications in research and development.
2006-08-28 Wirewound resistors suit military, avionics systems
TT electronics IRC WAFT Division said its new RB/RBR Series wirewound resistors meet or exceed the stringent reliability requirements of the military and avionics industries.
2012-03-12 Vishay pays $85 million for HiRel Systems
The acquisition would substantially expand and strengthen its specialty magnetic product business.
2003-08-01 Using FPGAs for measurement, control
Find out the benefits and challenges of using FPGAs in systems that require measurement and control functionality.
2007-07-02 Use current monitors for accurate measurement
Many modern electronic systems now require some form of current measurement to improve power dissipation, efficiency and reliability. They range from LED driving to portable equipment to power supplies of all sizes.
2004-01-09 Toshiba device reduces measurement errors
Toshiba Corp. has announced that it would market a focus measurement technology that improves the focal measurement performance of semiconductor systems.
2007-10-17 Timing controller synchronizes multiple PXI systems
NI has released what it claims is the industry's first PXI Express timing and synchronization controller and a PXI module that synchronizes PXI systems over GPS, IRIG and IEEE 1588
2014-06-23 Thermal measurement methodology of RF power amps
Thermal measurement methodology has been developed and implemented by Freescale Semiconductor to accurately characterise high power RF power amplifiers
2004-11-09 The subsidiary will operate as the China business hub engaging in development, manufacturing, sales and after-sales service of SII NanoTechnology's analysis and measurement instruments
SII NanoTechnology Inc. has established SII NanoTechnology (Shanghai) Inc.
2012-08-15 Testing next-gen optical systems with simulated OFDM signals
Learn about software and hardware that can handle a wide range of modulation schemes, channel spacings, spectral widths, and detec¬tion methods.
2007-04-16 Test systems spell 3G LTE future
The test-and-measurement community must help ensure a smooth migration to LTE so that pitfalls associated with past rollouts of next-gen cellular networks can be avoided
2012-02-28 Test suite supports WLAN 802.11ac measurement
The PXI 3000 series test system from Aeroflex performs parametric measurements for manufacturing.
2005-09-22 Tektronix' measurement solution enables VIA to drive innovation
VIA Technologies Inc. has selected digital systems analysis tools from Tektronix Inc. to develop digital products based on serial data standards such as second-generation PCI-Express and SATA III
2015-11-30 Tektronix intros economical electrochemistry lab systems
The Keithley interactive solutions promise a more flexible and easier method for conducting a range of electrochemistry experiments such as cyclic voltammetry, chronoamperometry and chronopotentiometry.
2004-01-09 Technology allows enhanced accuracy of IC exposure systems
Toshiba Corp. has bared plans to market a focus measurement technology that greatly improves the focal measurement performance of semiconductor exposure systems.
2007-06-15 Systems enable fast, easy semiconductor characterization
Keithley Instruments Inc. announces the availability of the Automated Characterization Suite (ACS) integrated test systems for semiconductor characterization at the device, wafer and cassette level
2006-02-28 Spdt switch allows time-sensitive systems to respond faster
M/A-COM announced a new RoHS-compliant spdt switch for applications that require fast settling time, high linearity, low insertion loss, high isolation and small size.
2009-09-16 Source measurement handles up to nanoamp levels
The three-channel source measure unit can simultaneously provide power and perform measurements.
2012-08-28 Simplify complex acquisition systems in big physics experiments
Read about multichannel digitizers touted to contain all the timing and synchronization technologies to create synchronous sampling across 10's or 100's of channels at a time.
2003-10-27 Signal integrity: faster and simpler debugging with integrated digital and analog measurement
This application note details steps to debugging signal integrity problems in high-speed digital systems using integrated digital and analog measurement.
2007-06-08 Signal analyzers offer high accuracy measurement
Anritsu Corp. unrolls two new models of its MS2690A (50Hz to 6GHz)/MS2691A (50Hz to 13.5GHz) high performance signal analyzer supporting a wide range of wireless communications systems
2009-09-02 Sequential analysis ensures accurate power measurement
Calypto Design Systems Inc. has developed what it touts to be the most accurate register-transfer level (RTL) power analysis capability by applying its patented sequential analysis technology
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