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2006-03-23 NTS, SIINT announce electron, ion-beam system alliance
Carl Zeiss Nano Technology Systems and SII NanoTechnology jointly announced a global strategic alliance in the electron and ion-beam systems, service and solutions market
2007-02-16 NI: The future of test is virtual
For National Instruments, virtual instrumentation and graphical system design are the answer as these two "empower local talent and allow engineers to add their domain expertise to the economy and their organization."
2005-08-17 NI toolkit eases ECU design
NI released the ECU Measurement and Calibration Toolkit that extends the company's LabVIEW, NI LabWindows/CVI and Microsoft C/C++ development environments to support measurement and calibration apps for ECU design and validation
2011-12-15 NI strengthens ASEAN presence with new Jakarta office
Setting up an office in Indonesia will also enable closer ties with National Instruments' Indonesia-based customers as well as its academic partners in the country.
2002-04-18 Newport to divest its metrology business
Newport Corp. has expressed its intentions to sell majority of its industrial metrology systems division in two separate transactions to unrelated buyers
2006-07-17 New tools, solutions at ESC, EDA&T-Taiwan
Cutting-edge technologies and solutions, including the latest embedded development and EDA tools, will take centerstage at the 6th Annual Embedded Systems Conference and the 14th Annual EDA & Test-Taiwan Conference and Exhibition to be held on August 17-18
2006-09-07 New test solutions ease transition to digital broadcasting
The new compressed video test and measurement tools from Tektronix are designed to help broadcasters and content providers improve the quality of their products and services and to ease their transition to digital broadcasting
2006-08-01 New test platform targets wireless networking
Agilent's new Connected Solutions Workbench enables system-level testing for wireless networking and cellular communications systems
2006-07-31 New NI toolkit targets next-gen automotive ECUs
NI has released the ECU Measurement and Calibration Toolkit 2.0 that supports measurement and calibration applications for designing and validating automotive electronic control units (ECUs
2002-11-11 New format of Electronica 2002 reflects technological trends
Organizers of Electronica 2002, the 20th International Trade Fair for Components and Assemblies in Electronics, say more than 2,800 exhibitors have signed up and that 85,000 visitors are expected from Germany and abroad.
2002-07-08 National Instruments: Offering virtual instrumentation-based solutions
In its bid to differentiate itself from other measurement solution providers, National Instruments pioneered the development of virtual instrumentation solutions for the measurement and automation sectors
2002-10-15 Multiprotocol label switching moves to VPN duties
As extensions to the multiprotocol label switching standard make MPLS viable for virtual private network transport, experts are warning against taking the protocol too far, too fast.
2010-08-02 Multifunction control boards highlight flexible I/O
Measurement Computing Corp.'s USB-2500 series of multifunction measurement and control boards designed for OEM or embedded applications and work with the Microsoft Windows operating systems.
2004-04-16 Multichannel RF struts smart antennas
For greater capacity and reliability, wireless data communications systems are incorporating multiple transmit and receive channels to support smart antennas
2004-09-21 Multi-channel PMC module is DC-coupled
Interactive Circuits and Systems is debuting its ICS-554D, a DC-coupled version of the company's popular 4-channel ICS-554C A/D PMC module
2003-05-26 Motorola unveils low-power tire sensor
Motorola rolled out an automotive tire pressure sensor which it claims to consume about one-tenth as much power as competing sensors.
2003-10-01 MiNT system allows simultaneous signal testing
MiNT Systems Corp. has introduced the Synasys modular mixed-signal instrument system that offers flexibility, time-saving and seamless plug-and-play integration
2007-01-16 Microwave testers offer broadband capability
The innovations embedded in Agilent's microwave test accessories provide broadband capability and enhanced measurement accuracy
2002-01-02 Micronic expands SLM licensing agreement with German group
Micronic Laser Systems AB has expanded its cooperation with Fraunhofer Institute for Microelectronic Circuits and Systems (IMS
2012-10-22 MEMS pave way for medical innovation
Know the fundamentals of MEMS motion sensing, as well as the challenges of medical navigation applications.
2008-03-03 MEMS gear up for medical mission
Microelectromechanical-system-based inertial and motion sensors are finding slots in medical applications, with demand fueled by implantable devices that must be highly reliable and very small, as well as by handheld devices for home monitoring and diagnostics.
2013-02-25 Memory test tip: Boost flash memory testing
Know how to tune your test system parameters to get the optimal results.
2005-01-17 Measuring stations sample at up to 1GS/s on up to 270 channels
Yokogawa adds two measuring stations to its WE7000 series pf PC-based measurement system product line
2014-12-18 Measuring RTOS performance
There are three areas of interest if you are looking at the performance and usage characteristics of an RTOS. This article tackles these areas in detail.
2013-09-02 Measuring power consumption of i.MX 6Solo
Here's an application note that will enable the user to choose the appropriate power supply domains for the i.MX 6Solo chips.
2012-05-16 Measure high-power signals with network analyzer
Here's a review of the measurement fundamentals of characterizing devices with high-power signals
2007-04-27 Low-cost in-circuit test system targets CE, PC motherboards
Agilent has introduced a low-cost in-circuit test system for original design manufacturers that need "just enough test" for high-volume digital consumer and personal computer motherboards.
2000-11-01 LDO noise testing depends on filters
Telecommunications, networking, audio and instrumentation require low-noise power supplies. In particular, there is an interest in low-noise, low-dropout linear regulators (LDOs).
2003-07-07 KLA-Tencor removes airborne contamination effects
KLA-Tencor's SpectraFx 100 is an optical thin-film measurement system that eliminates the effects of AMC on film measurement
2008-01-16 Keithley updates ACS test software
Keithley Instruments' updated Automated Characterization Suite V3.2 software enhances the powerful automation capabilities of ACS integrated test systems
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