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2012-11-19 Tear Down: Apple's A6X under the microscope
Specialists at UBM TechInsights recently took Apple's A6X processor under the knife and microscope.
2005-08-03 Sub-angstrom microscope targets nanotechnology
FEI Co. unveiled the new device at the Microscopy & Microanalysis conference this week in Honolulu. FEI claims its commercial instrument resolves at the sub-angstrom scale for the first time.
2016-05-05 Scanning electron microscope offers resolution down to 1nm
The Apreo SEM from FEI is capable of resolution down to 1nm at 1kV without the need for beam deceleration, providing high performance on nearly any sample, even if it is tilted or topographic.
2015-02-09 Putting cloud-based supply chain under the microscope
Seemingly unadaptable to emerging technologies, supply chain is undergoing some major changes as cloud technologies make their way to make this business process less complex.
2006-12-05 New microscope enables atomic-scale wafer analysis
FEI will unveil a family of transmission electron microscopes (TEM) that it says will enable atomic-scale imaging and analysis of semiconductor wafers.
2002-04-12 Microscope probes atomic wave functions
A team of Dutch and French researchers has built a microscope that can see atomic wave functions.
2006-01-06 High-res optical inspection operates without a microscope
A system called the Super Scope, from O.C. White Co. delivers high-resolution realtime color images without a microscope. This system, based on the latest display technology, supersedes the company's earlier Super Scope 2000 product.
2005-03-01 Code compression under the microscope
ARM, MIPS, IBM and ARC all offer techniques to reduce memory footprint. Learn how code compression works in each architecture.
2002-03-25 Applications of force volume imaging with the NanoScope atomic force microscope
This application note discusses how force volume imaging can be used to investigate material, adhesive, electrical, magnetic and chemical properties of samples by recording an array of force curves over an entire area.
2012-11-16 Analyst puts Haswell under microscope
Microprocessor analyst David Kanter dissects Intel's Haswell and projects how the chips will perform once applied.
2006-07-06 X-ray analyzer eases advanced chip packaging
Xradia said the MicroXCT is suited for the engineering and failure analysis of next-generation semiconductor packages, including multistacked die and flip-chip architectures.
2010-09-27 What happens when you try to store data on a single iron atom?
Physicists at the IBM Almaden Research Center perfected a new pump-probe pulsed-STM technique that may pave the way to enabling single-atom bit-cells for memory ICs.
2012-08-01 Verios SEM boasts precise measurements at 22nm or below
System delivers powerful resolution and contrast for precise measurement of sensitive materials in semiconductor and materials science applications.
2005-07-28 Veeco, JNCASR launch nanoscience center in Bangalore
Veeco Instruments Inc., supplier of instrumentation to the nanoscience community, has established a nanotechnology center in Bangalore, India. The facility will be staffed with local scientists and engineers and equipped with Veeco's latest atomic force microscope (AFM), scanning tunneling microscope (STM) products and other advanced nanotechnology application modules.
2012-03-13 Using FE-SEM in MEMS analysis
Learn about the Agilent 8500 compact FE-SEM, a low voltage, field emission SEM which employs an electrostatic lens design.
2001-09-12 Using an oscilloscope to optimize AFM images
This application note discusses the use of an oscilloscope to provide a reliable method for obtaining optimal images with the Burleigh AFM (Atomic Force Microscope).
2001-09-12 Use of the AFM to study spin-polarized photo-emission sources
This application note describes the use of the Burleigh ARIS-3500 AFM (Atomic Force Microscope) to examine photoemission sources.
2001-10-01 Thermal characterization techniques for GaAs FETs
This technical article deals with the proper modeling techniques that can simultaneously handle high-mesh transitions and temperature-dependent and anisotropic thermal properties for GaAs FET applications.
2001-09-12 Surface study of oxidized niobium(110)
This application note outlines a surface study of oxidized niobium based on the results of Ultra-High Vacuum (UHV) Scanning Tunneling Microscopes (STMs).
2001-09-12 Surface characterization of semiconductor materials by AFM
This application note presents a comparison of roughness measurements by AFM (Atomic Force Microscope) and SEM (Scanning Electron Microscope) of silicon substrates bombarded and analyzed during SIMS (Secondary Ion Mass Spectrometry) experiments.
2001-09-12 Supplemental laboratory exercise for the ISTM: Calibration using the atomic lattice of graphite
This application note describes the use of the atomic lattice of graphite as a convenient standard for measuring and calibrating the STM (Scanning Tunneling Microscope) XY scanner.
2002-12-20 Stanford advanced nano facility to house FEI systems
Stanford University has established an advanced nanocharacterization facility in collaboration with FEI Co.
2010-08-05 SEM offers high beam current, low vacuum capability
The series of ultra-high resolution scanning electron microscopes are designed to provide nanometer-scale resolution and ultra-precise analysis on a wide range of samples.
2016-04-11 Probing ReRAMs: Forming scaling, quantised conductance
Learn about the new ReRAM challenges as an IMEC team have formed and characterised the electrical conductance and topology of some of the smallest ReRAM filaments ever reported.
2001-08-01 Preventing flip-chip solder joint failures
Learn about the degradation of solder joints in FCOBs as a result of thermal cycling. The article also seeks to answer how solder joint cracks are initiated and propagated.
2002-10-17 Polymers self-assemble to form 2.5nm diode
A diode measuring 2.5nm was recently demonstrated by a University of Chicago professor Luping Yu, who called it the world's smallest semiconductor device.
2002-03-25 Phase imaging: Beyond topography
This application note discusses how phase imaging promises to play an important role in the ongoing study of material properties at the nanometer scale.
2005-07-18 Organic molecule switches like a transistor
University researchers have successfully demonstrated a single-molecule switch and transistor.
2004-02-20 Optonics to deliver Infrared Laboratories IREM system
Optonics Inc. has inked a strategic marketing agreement with Infrared Laboratories Inc., a provider of design verification and diagnostic solutions.
2002-02-28 Olympus builds optical subsidiary in the Philippines
Optical product supplier Olympus Optical Co. Ltd has established a wholly-owned subsidiary named Olympus Optical Technology Philippines Inc.
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