Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > microscopy

microscopy Search results

?
?
total search122 articles
2013-06-17 Zeiss expands microscopy division, acquires Xradia
The investment in Xradia underlines Zeiss' strategy to grow with the most innovative and future-oriented technologies while also serving the growing demands in multi-modal microscopic imaging.
2012-06-21 Using microscopy to study highly doped marker layers in GaN on sapphire
Here's an investigation on gallium nitride films grown on sapphire substrate using Scanning Microwave Microscopy.
2002-03-26 Scanning probe/atomic force microscopy: Technology overview and update
This application note discusses AFM technology and its applications.
2013-01-29 Low voltage scanning electron microscopy films
Here are examples where Agilent 8500 FE-SEM provides high resolution images of sensitive organic and biological samples.
2013-01-30 Imaging graphene via scanning electron microscopy
Scanning electron microscopy is getting more popular for imaging graphene because it is a rapid, non-invasive and effective imaging technique complimentary to most other techniques.
2002-03-25 IC failure analysis and defect inspection with scanning probe microscopy
This application note discusses how AFMs are being applied to more areas in materials characterization and failure analysis applications.
2013-01-28 Femtosecond laser targets multi-photon microscopy
The Carmel CFL-05RFF0 offers 780nm, 500mW of power, 10nJ of pulse energy and less than 100fs pulse widths.
2001-09-12 DC mode magnetic force microscopy using a Burleigh AFM
This application note describes the modification of the Burleigh METRIS-2000 AFM (Atomic Force Microscope) so that magnetic materials could be examined for magnetization using a magnetically active tip.
2009-03-02 Carl Zeiss embarks on microscopy project
Carl Zeiss SMT is gearing up for one of the most ambitious electron microscopy development efforts to be undertaken in recent years.
2002-03-25 Applications of atomic force microscopy in optical disc technology
This application note explains how the atomic force microscopy is an invaluable analytical tool for evaluating the nanometer-level detail on stampers and molded optical discs.
2002-03-25 Applications of atomic force microscopy for contact lens manufacturing
This application note points out the areas where AFM can provide new capabilities for surface characterizations, as well as to speed product development efforts and improve product quality, performance and yields.
2008-05-16 Agilent designs laser combiner for microscopy apps
Agilent Technologies has introduced a multi-wavelength laser combiner for microscopy applications.
2001-03-01 Advances in acoustic microscopy
This article discusses some of the advancements in acoustic microscopy, which provide users new tools useful for difficult design analysis.
2013-08-08 XRM solution bolsters nanoscale 3D imaging by a factor of 10
Xradia 810 Ultra X-ray microscopy solution from Zeiss operates at 5.4keV, a lower X-ray energy that delivers better contrast and image quality for many materials.
2002-02-19 The development of a full field 3D-microscale flow measurement technique for application to near contact line flows
This application note contains details of the development of a new 3D-velocity field measurement technique which can be used to provide more insight into the dynamics of thin evaporating liquid films.
2005-08-03 Sub-angstrom microscope targets nanotechnology
FEI Co. unveiled the new device at the Microscopy & Microanalysis conference this week in Honolulu. FEI claims its commercial instrument resolves at the sub-angstrom scale for the first time.
2007-04-18 SSRM imaging tech improves LSI
Toshiba Corp. announced a breakthrough in imaging electron-carrier paths and impurities in semiconductors, which allows analysis at the 1nm level for the first time.
2006-02-16 Spectroscope twist sees single molecules
A recent innovation in observing the behavior of atoms on a material's surface could prove to be an important breakthrough.
2002-03-25 SEM and AFM: Complementary techniques for high resolution surface investigations
This application note provides a comparison of two imaging technologies: SEM and AFM. It also demonstrates how these techniques provide information to engineers which are complementary in nature.
2002-09-16 Scatterometry-based critical dimension and profile metrology
This technical article discuss how as geometries are pushed below 0.15m, critical dimensions and feature profile metrology has become key to overall control of lithography.
2010-09-21 Researchers inspect Li-ion batteries at nanoscale
New microscopy technique used to view Li-ion movement
2015-06-26 Nanowires afford LEDs better light, energy-savings
Denmark's Niels Bohr Institute researchers studied nanowires using X-ray microscopy and were able to pinpoint exactly how the nanowire should be designed to give the best properties.
2012-12-26 Nanotech research advance new quantum computers
A*STAR researchers reveal that scanning tunnelling microscopy of super benzene oligomers offer a plan for creating new types of quantum computers based on information localized inside molecular bonds.
2012-12-26 Measuring surface potential with KFM
Know a number of experimental parameters that have significant effect on the accuracy and resolution of surface potential measurements.
2011-05-19 Laser system allows high-resolution image generation
Mobius Photonics unveils 'Rainbow', a novel prototype laser source for super-resolution microscopy applications.
2004-07-06 KLA-Tencor offering delivers surface planarity process control
KLA-Tencor unveiled what it claims as the first true line monitoring solution for trench depth and surface planarity process control based on AFM.
2002-11-27 Innovative optical imaging method seen to lower IC test costs
A group of physicists led by Dr. Caesar A. Saloma of the National Institute of Physics at the University of the Philippines have developed an inexpensive optical imaging technique to detect IC defects.
2013-01-21 Imec, PVA Tepla demo 3D TSV void detection
The organisations successfully used advanced GHz SAM technology to detect TSV voids at wafer-level after TSV copper plating.
2012-12-28 Graphene oxide and its apps revealed by AFM
Here's a discussion on interfacial chemistry as both an intrinsic nature of graphene oxide materials and a key driving force for directing their applications.
2002-04-15 Focused ion beam machined silicon tips for measurement of steep-sloped features
This application note discusses how the measurement of features with sidewall angles approaching 900 is possible with Digital Instrument's high aspect ratio "FIB tips," produced by focused ion beam (FIB) machining techniques.
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

?
?
Back to Top