Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Advanced Search > optical inspection

optical inspection Search results

total search160 articles
2010-09-21 Zenith 3D AOI system offers measurement-based inspection
Koh Young Technologies has just introduced their revolutionary Zenith 3D AOI System. It measures the Z-axis profilometry of whole PCB assemblies, including components, leads, and solder joints, based on Moir technology.
2015-03-10 Viscom delivers system for coating inspection
The S3088 system for conformal coating inspection, Viscom says, is now available with high-precision plasma coating inspection. It works with UV LEDs and has 11.75?m/px or 23.5?m/px resolution
2002-09-06 Teradyne delivers optical test equipment to BISC
Teradyne's Assembly Test Division has received an order from Beijing International Switching System Corp. Ltd (BISC) for two Teradyne Optima 7300 post-reflow automated optical inspection systems.
2003-02-27 Prodrive selects Agilent manufacturing, inspection solution
Prodrive B.V. has purchased a complete manufacturing and inspection solution from Agilent Technologies Inc
2013-04-16 PCB inspection system adds automatic X-ray, quality uplink
The Viscom X8011 is now equipped with the company's unique quality uplink which provides simplified classification and effective process control, linking of inspection results
2010-12-01 Optical inspection system targets 2mµ wafer defects
Altatech Semiconductor S.A. launches high-throughput AltaSight EyeEdge inspection system
2003-08-19 Optical inspection system has additional load ports
Nikon's Semiconductor Inspection Technologies Group (SITECH) has introduced the Optistation 3200 semiconductor inspection system
2011-01-24 LED analysis, wafer inspection tools launched
KLA-Tencor debuts Klarity LED, ICOS WI-2220
2002-02-12 KLA-Tencor introduces automated wafer backside inspection system
KLA-Tencor Corp. has introduced the industry's first fully-automated wafer backside inspection system that enables non-destructive inspection of the backsides of 300mm wafers
2006-01-06 High-res optical inspection operates without a microscope
A system called the Super Scope, from O.C. White Co. delivers high-resolution realtime color images without a microscope. This system, based on the latest display technology, supersedes the company's earlier Super Scope 2000 product.
2015-04-22 Goepel electronics intros optical, X-ray systems
The PILOT Connect interface system has the capability to collect and manage the operating data of the connected systems, as well as merge all test data onto a repair and verification station.
2004-05-04 Cypress selects Camtek automated wafer inspection
Camtek Ltd has received an order for Falcon systems from Cypress Semiconductor, an American manufacturer of high-performance semiconductors for a broad range of markets including communications, computation, consumer, automotive, and industrial.
2007-11-13 AOI platform designed for post-reflow inspection
Developed to address today's complex and shrinking printed-circuit-board assemblies, the Agilent sj5000 targets post-reflow inspection
2002-01-31 Agilent releases solder-paste inspection system
Intended for solder-paste inspection of PCB assemblies, the SP50 automated optical inspection system produces accurate measurements of pad offset and skew, solder-paste area, height and volume.
2007-02-01 Agilent intros solder paste inspection system
Agilent has introduced a new solder paste inspection system that enables manufacturers of PCB assemblies to slash inspection time in half, without compromising capability
2008-06-23 Vistec inspection system touts 30% increase in utilization
Vistec Semiconductor Systems has added a new option called "Parallel Control Job" for its macro inspection product line LDS3300 that increases the system utilization by up to 30 percent
2005-01-03 Vision sensors aimed at inspection, process control
Vision Control introduced the S24 family of vision sensors that offers a simple to use teach-in operation.
2014-11-19 Ultratech outs in-line inspection system for patterned wafers
The Superfast 4G promises a high degree of flexibility enabling the use of a single type of wafer inspection tool to measure the front side of patterned wafers across the entire fab line at the lowest cost
2002-12-26 Startup taps digital holography for wafer inspection
A metrology startup is pitching the use of digital holography to peer into the narrow and deep spaces, such as contacts and trench capacitors, on semiconductor wafers.
2003-02-04 Sarnoff UV camera suit submicron IC inspection equipment
Sarnoff Corp.'s 14-bit back illuminated CCD UV camera module is suited for use in apps such as optical evaluation and subsystem development
2007-01-23 Nitto Denko to build new optical film plant in Shenzhen
To meet the growing demand for large-screen LCD TV applications, Japan's Nitto Denko Corp. will construct a new plant facility in south China, Shenzhen Nitto Optical Co. Ltd
2001-03-01 Library generators employ optical correction at cell level
This technology article discusses the enhancement of cell-based designs with the evolution of EDA.
2005-04-20 Leica's new system eases manual inspection of 300mm wafers
Leica Microsystems disclosed that its new Leica INS300 fits the demands of IC manufacturers for equipment with optimized price and performance ratio
2010-09-06 Inspection tool monitors edge profiles
The metrology and inspection tool can help fabs identify potentially yield-impacting irregularities in the shape of the wafer edge profile or in the edges of films deposited on the wafer
2015-11-25 Handheld analysers tout visual inspection capability
Anritsu introduced the Video Inspection Probe measurement mode for its cable and antenna analysers to streamline optical link verification for wireless networks.
2003-10-03 Fiber-Optic Component Inspection Using Integrated Vision and Motion Components
This application note outlines common fiber inspection and measurement techniques and describes the equipment needed to create an automated optical component inspection system.
2004-03-22 Feinfocus inspection system features automatic anti-collision
The Tiger x-ray system from Feinfocus features collision-free inspection, which is controlled by an automatic mechanism in the overall construction
2003-07-10 August acquires automated inspection provider
August Technology Corp., a supplier of automated inspection solutions for the microelectronic industries, has acquired Counterpoint Solutions Inc
2008-04-17 Applied takes on KLA-Tencor in mask inspection market
Applied Materials has entered the photomask inspection market with a new tool based on a breakthrough aerial imaging tech, in hopes of dethroning market leader KLA-Tencor
2004-09-07 Acterna adds new features to optical net tester
Acterna announced the latest additions to its MTS-8000 field optical tester line
Bloggers Say

Bloggers Say

See what engineers like you are posting on our pages.

Back to Top